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US4745809A
Expired / Lapsed
US
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Composite analyzer tester
Assignee: Grumman Corp
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Filing: 1986-08-12
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Granted: 1988-05-24
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Expires: 2006-08-12
Abstract
Abstract A single composite analyzer tester instrument capable of nondestructively analyzing and testing several different properties of graphite-resin materials, such as the thickness, sonic velocity, relative sonic amplitude and relative electrical conductivity thereof. The instrument incorporates therein a magnetic induction circuit for measuring the thickness of the test material, which includes a magnetic induction probe with a magnetic induction coil which is placed adjacent to the outer surface of the material. The instrument also includes an ultrasonic pulse-echo circuit for performing two separate but related tests, a measurement of the ultrasonic velocity of the test material, and also a measurement of the relative change in amplitude of an ultrasonic pulse as it traverses the test material from an outer surface thereof to an inner surface, where it is echoed back to the outer surface for detection. This circuit includes an acoustic probe which is placed adjacent to the outer surface of the test material, at the same location where the first probe was placed. Finally, the instrument incorporates therein an eddy current circuit for measuring the relative electrical conductivity of the test material. This circuit includes an eddy current probe with an eddy current coil which is placed adjacent to the outer surface of the test material at the same location as the two previous probes. The magnetic induction circuit, the utlrasonic pulse-echo circuit, and the eddy current circuit are all implemented in a single microprocessor-based unit utilizing extensive digital signal processing. Moreover, the magnetic induction probe, the acoustic probe, and the eddy current probe are each attached to, and detachable from, the console of the unit by electrical plug connections.
Inventors
- 👤 Richard M. Collins
- 👤 Richard F. Chance
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 14:38
CPC Classifications
G; G01; G01N; G01N27/00; G01N27/02; G01N27/023; G01B; G01B7/00; G01B7/02; G01B7/06; G01B7/10; G01B7/105; G01N2291/00; G01N2291/02; G01N2291/028; G01N2291/02863
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
332 words
A composite analyzer tester for nondestructively testing and analyzing the physical properties and gaging the thickness of a test material, comprising: a. a magnetic induction circuit for measuring the thickness of the material, which includes a magnetic induction probe having a magnetic induction coil which is placed adjacent to the outer surface of the material and is energized at a relatively low frequency below one megahertz, and wherein the resultant impedance of the in the magnetic induction circuit is a measurement of the thickness of the test material; b. an ultrasonic pulse-echo circuit for measuring the ultrasonic velocity of the test material in which said measurement of the thickness of the test material is utilized, and for also measuring the relative change in amplitude of an ultrasonic pulse transversing the test material from an outer surface thereof to an inner surface, whereat it is echoed back to the outer surface for detection, including an acoustic probe which is placed adjacent to the outer surface of the test material, for generating an ultrasonic pulse introduced into the test material and for detecting the echoed ultrasonic pulse to measure the transversal time of the echoed ultrasonic pulse, which after determining said measurement of thickness, allows the measurement of the ultrasonic velocity of the test material to be deterimed; and c. an eddy current circuit for measuring the relative electrical conductivity of the test material, including an eddy current probe with an eddy current coil which is placed adjacent to the outer surface of the test material and is energized at a relatively high frequency above one megahertz to generate an alternating magnetic field which induces an alternating electric field in the test material having eddy currents and an alternating magnetic field associated therewith, with the associated magnetic field affecting the alternating magnetic field of the eddy current coil, such that the resultant impedence of the eddy current coil in the eddy current circuit provides a measurement of the electrical conductivity of the test material.
Claim 2
Dependent Claim
332 words
A composite analyzer tester for nondestructively testing and analyzing the physical properties and gaging the thickness of a test material, comprising: a. a magnetic induction circuit for measuring the thickness of the material, which includes a magnetic induction probe having a magnetic induction coil which is placed adjacent to the outer surface of the material and is energized at a relatively low frequency below one megahertz, and wherein the resultant impedance of the in the magnetic induction circuit is a measurement of the thickness of the test material; b. an ultrasonic pulse-echo circuit for measuring the ultrasonic velocity of the test material in which said measurement of the thickness of the test material is utilized, and for also measuring the relative change in amplitude of an ultrasonic pulse transversing the test material from an outer surface thereof to an inner surface, whereat it is echoed back to the outer surface for detection, including an acoustic probe which is placed adjacent to the outer surface of the test material, for generating an ultrasonic pulse introduced into the test material and for detecting the echoed ultrasonic pulse to measure the transversal time of the echoed ultrasonic pulse, which after determining said measurement of thickness, allows the measurement of the ultrasonic velocity of the test material to be deterimed; and c. an eddy current circuit for measuring the relative electrical conductivity of the test material, including an eddy current probe with an eddy current coil which is placed adjacent to the outer surface of the test material and is energized at a relatively high frequency above one megahertz to generate an alternating magnetic field which induces an alternating electric field in the test material having eddy currents and an alternating magnetic field associated therewith, with the associated magnetic field affecting the alternating magnetic field of the eddy current coil, such that the resultant impedence of the eddy current coil in the eddy current circuit provides a measurement of the electrical conductivity of the test material.
Claim 3
Dependent Claim
69 words
A composite analyzer tester for nondestructively testing and analyzing the physical properties and gaging the thickness of a test material, as claimed in claim 1, wherein said magnetic induction circuit, said ultrasonic pulse-echo circuit, and said eddy current circuit are implemented in a microprocessor based unit utilizing digital signal processing, and said magnetic induction probe are each attached to and detachable from said unit by electrical plug connections thereto.
Claim 4
Dependent Claim
79 words
A composite analyzer tester for nondestructively testing and analyzing the physical properties and gaging the thickness of a test material, as claimed in claim 1, wherein, in using the magnetic induction circuit, an element of uniform magnetic permeability is placed in contact with an inner surface of the test material opposite the placement of the magnetic induction probe on the outer surface thereof to complete a magnetic circuit with the magnetic induction coil, with the test material located therebetween.
Claim 5
Dependent Claim
41 words
A composite analyzer tester for nondestructively testing and analyzing the physical properties and gaging the thickness of a test material, as claimed in claim 3, said magnetic induction circuit energizing said magnetic induction coil at a frequency of approximately fifty kilohertz.
Claim 6
Dependent Claim
51 words
A composite analyzer tester for nondestructively testing analyzing the physical properties and gaging the thickness of a test material, as claimed in claim 1, said acoustic probe including a piezoelectric transducer which is pulsed to produce an ultrasonic pulse, and which is then monitored for detection of the echoed ultrasonic pulse.
Claim 7
Dependent Claim
40 words
A composite analyzer tester for nondestructively testing and analyzing the physical properties and gaging the thickness of a test material, as claimed in claim 5, said ultrasonic pulse circuit energizing said piezoelectric transducer at a frequency of approximately five megahertz.
Claim 8
Dependent Claim
41 words
A composite analyzer tester for nondestructively testing and analyzing the physical properties and gaging the thickness of a test material, as claimed in claim 1, said eddy current circuit energizing said eddy current coil at a frequency of approximately five megahertz.
Claim 9
Dependent Claim
61 words
A composite analyzer tester for nondestructively testing an analyzing the physical properties and gaging the thickness of a test material, as claimed in claim 1, wherein said magnetic induction circuit is first utilized to measure the thickness of the test material, and said ultrasonic pulse-echo circuit uses the measured thickness in its measurement of the ultrasonic velocity of the test material.
Claim 10
Dependent Claim
33 words
A composite analyzer tester for nondestructively testing and analyzing the physical properties and gaging the thickness of a test material, as claimed in claim 1, the test material comprising a graphite-resin composite material.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1991-05-24 | 1991-11-23 | 1992-05-24 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-05-24 | 1995-11-23 | 1996-05-24 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-05-24 | 1999-11-23 | 2000-05-24 | $7700.00 | Window Closed / Lapsed |