US4710930A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and apparatus for diagnosing a LSI chip
Assignee: Hitachi Ltd
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Filing: 1986-02-03
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Granted: 1987-12-01
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Expires: 2006-02-03
Abstract
Abstract Disclosed is a method of level sensitive testing of a logic array system and an LSI chip having testing means incorporated therein. The present invention is especially suitable for testing a RAM and the function of a logic unit which is a functional peripheral of the RAM. The LSI chip comprises means for selecting a specific address of the RAM, means for writing a signal at the specific address of the RAM and reading out the data from the specific address of the RAM, and means for selecting the operation of the chip between a usual operation mode and a scan-in/scan-out diagnostic mode for testing the RAM or functional peripheral of the RAM. Testing can be easily conducted by addition of a small number of logic elements. The larger the number of address signal lines and the number of data signal lines of the RAM, the more effective the testing method becomes.
Inventors
- 👤 Kazumi Hatayama
- 👤 Terumine Hayashi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 18:33
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3177; G01R31/3181; G01R31/3185; G01R31/318533; G01R31/318566; G01R31/318558; G11; G11C; G11C29/00; G11C29/04; G11C29/08; G11C29/12; G11C29/18; G11C29/30; G11C29/32
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
134 words
A method for diagnosing a LSI chip, having a random access memory with a plurality of addressable locations including at least one location for storing test data, functional logic circuits coupled to said random access memory, and a latch means coupled to each location of the random access memory which stores test data to be outputted for diagnosis including the diagnosis of said functional logic circuits, comprising, during diagnosis of a functional logic circuit by a scan-in/scan-out method, the steps: storing an output signal from a functional logic circuit in one of said at least one storage location for storing test data; reading out the stored output signal through the latch means; and diagnosing whether a fault exists in said functional logic circuit being tested according to the data readout from the latch means.
Claim 2
Independent Claim
134 words
A method for diagnosing a LSI chip, having a random access memory with a plurality of addressable locations including at least one location for storing test data, functional logic circuits coupled to said random access memory, and a latch means coupled to each location of the random access memory which stores test data to be outputted for diagnosis including the diagnosis of said functional logic circuits, comprising, during diagnosis of a functional logic circuit by a scan-in/scan-out method, the steps: storing an output signal from a functional logic circuit in one of said at least one storage location for storing test data; reading out the stored output signal through the latch means; and diagnosing whether a fault exists in said functional logic circuit being tested according to the data readout from the latch means.
Claim 3
Dependent Claim
48 words
A method for diagnosing a LSI chip in accordance with claim 1 wherein the latch means comprises at least one latch circuit and each of said at least one latch circuits is associated with a fixed number of locations in the random access memory for storing test data.
Claim 4
Independent Claim
159 words
A method for diagnosing a LSI chip, having a random access memory with a plurality of addressable locations including at least one location for storing test data, functional logic circuits coupled to said random access memory, and a latch means coupled to each location of the random access memory which stores test data to be outputted for diagnosis including the diagnosis of said functional logic circuits, comprising, during diagnosis of a functional logic circuit by a scan-in/scan-out method, the steps: storing test data in at least one of said locations for storing test data; reading out the test data stored in said at least one location through said latch means; applying the read out test data to a functional logic circuit to be tested; and diagnosing whether a fault exists in said functional logic circuit being tested according to the data readout from the storage location from the latch means and applied to the functional logic circuit being tested.
Claim 5
Independent Claim
159 words
A method for diagnosing a LSI chip, having a random access memory with a plurality of addressable locations including at least one location for storing test data, functional logic circuits coupled to said random access memory, and a latch means coupled to each location of the random access memory which stores test data to be outputted for diagnosis including the diagnosis of said functional logic circuits, comprising, during diagnosis of a functional logic circuit by a scan-in/scan-out method, the steps: storing test data in at least one of said locations for storing test data; reading out the test data stored in said at least one location through said latch means; applying the read out test data to a functional logic circuit to be tested; and diagnosing whether a fault exists in said functional logic circuit being tested according to the data readout from the storage location from the latch means and applied to the functional logic circuit being tested.
Claim 6
Dependent Claim
48 words
A method for diagnosing a LSI chip in accordance with claim 9 wherein the latch means comprises at least one latch circuit and each of said at least one latch circuits is associated with a fixed number of locations in the random access memory for storing test data.
Claim 7
Dependent Claim
107 words
An LSI chip having a random access memory, functional logic circuits coupled to the random access memory, and, means, coupled to said functional logic circuit, for diagnosing said functional logic circuits comprising: address selecting means, coupled to said random access memory, for selecting a specific address within said random access memory; means, coupled to said chip, for selecting between a usual mode of operation and a scan-in/scan-out diagnostic mode; and latch means, coupled to each location of said random access memory for storing test data used for diagnosing the operation of at least one function logic circuit when the mode of operation is the scan-in/scan-out diagnostic mode.
Claim 8
Dependent Claim
107 words
An LSI chip having a random access memory, functional logic circuits coupled to the random access memory, and, means, coupled to said functional logic circuit, for diagnosing said functional logic circuits comprising: address selecting means, coupled to said random access memory, for selecting a specific address within said random access memory; means, coupled to said chip, for selecting between a usual mode of operation and a scan-in/scan-out diagnostic mode; and latch means, coupled to each location of said random access memory for storing test data used for diagnosing the operation of at least one function logic circuit when the mode of operation is the scan-in/scan-out diagnostic mode.
Claim 9
Dependent Claim
44 words
An LSI chip in accordance with claim 5, wherein the latch means comprises at least one latch circuit and each of said at least one latch circuits is associated with a fixed number of locations in the random access memory for storing test data.
Claim 10
Dependent Claim
35 words
An LSI chip in accordance with claim 5 further comprising: an external terminal through which a signal for selecting one of the addresses within said random access memory is applied to said address selecting means.
Claim 11
Dependent Claim
50 words
An LSI chip in accordance with claim 5, further comprising writing means for writing, at an address within said random access memory, a diagnostic signal for diagnosing a functional logic circuit, and reading means for reading out said written diagnostic signal from said address for diagnosing said functional logic circuit.
Claim 12
Dependent Claim
56 words
An LSI chip in accordance with claim 5 further comprising: means, coupled to the chip, for selecting the operation of said chip between a first diagnostic mode diagnosing a peripheral functional logic circuit of said chip and a second diagnostic mode diagnosing said chip itself, for permitting selective execution of said peripheral and chip diagnostic modes.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1990-11-30 | 1991-06-01 | 1991-12-01 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-11-30 | 1995-06-01 | 1995-12-01 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-11-30 | 1999-06-01 | 1999-12-01 | $7700.00 | Window Closed / Lapsed |