Inspecting method and apparatus for photomask pattern

Claim 2

An inspection method for a photomask pattern applying a vector comparing method, comprising the steps of: (a) obtaining a pair of optical images, which are to be compared, from the photomask pattern; (b) converting the pair of optical images into two groups of electrical analog signals; (c) distributing the two groups of electrical analog signals into two groups of digital data, each of the two groups of digital data comprising a first number of matrix elements represented by datums having a value representing one of black, gray and white in accordance with high, middle, and low amplitudes, respectively, of a corresponding analog signal in one of the two groups of electrical analog signals; (d) separating two groups of separated data from the two groups of digital data, sequentially and respectively, each of the two groups of separated data having a second number of matrix elements, the second number being less than the first number of matrix elements in each of the two groups of digital data; (e) shifting the two groups of separated data respectively by a shift amount of at least one matrix element of each of the two groups of separated data in at least one of a latitudinal and longitudinal direction to provide at least two groups of shifted data; (f) synthesizing the two groups of separated data and the at least two groups of shifted data, respectively, to provide at least two groups of synthesized data; (g) generating vectors from arrangements of the at least two groups of synthesized data to provide at least two groups of vectors, each of the two groups of vectors comprising at least one of: a first vector from one of the datums representing black to an adjacent datum representing white, the first vector having a direction in one of latitudinal, longitudinal, and diagonal directions, a second vector, having one of the directions, from one of the datums representing black to an adjacent datum representing gray, and a third vector, having one of the directions, from one of the datums representing gray to an adjacent datum representing white, the first, second and third vectors having equal magnitude; (h) summing amounts of vectors in each of the directions for each groups of vectors; (i) comparing the amounts summed in step (h), respectively in each of the directions, for the at least two groups of vectors, to provide differences between the amounts; and (j) producing an output that indicates the photomask pattern has a defect when any one of the differences is non-zero.

Claim 3

An inspecting method according to claim 1, wherein the shift amount is provided by a step of (k) pre-inspecting the photomask patterns.

Claim 4

An inspecting method according to claim 1, wherein the values of the datums are calculated logically by following one of a black priority logic and a white priority logic in said synthesizing of step (f), as follows, where black, gray and white are represented by B, G, and W, respectively: ______________________________________ B priority logic W priority logic ______________________________________ B + B B B B + G B G B + W B W G + G G G G + W G W W + W W W, ______________________________________ the one of black and white priority logic also being provided by said pre-inspecting of the photomask pattern.

Claim 5

An inspecting apparatus using a vector comparing method, comprising: a pair of optical systems, each comprising a lens system coupled to an image sensor, said optical systems respectively obtaining optical images from respective parts of the photomask pattern and converting the optical images into two groups of electrical analog signals; an amplitude distributor, operatively connected to said image sensors, for distributing the two groups of electrical analog signals respectively into two groups of digital data; two first memories, operatively connected to said amplitude distributor, respectively, for storing the two groups of digital data; two data separators, operatively connected to said two first memories, respectively for separating two groups of separated data from the two groups of digital data; two second memories, operatively connected to said two data separators, respectively, for storing the two groups of separated data; two data shifters, operatively connected to said two second memories, respectively, for providing two groups of shifted data; two data synthesizers, operatively connected to said two second memories, respectively, for providing two groups of synthesized data by logical calculations; a logic selector, operatively connected to said two data synthesizers, for selecting one of black priority logic and white priority logic for the logical calculations in said two data synthesizers; two synthesized data memories, operatively connected to said two data synthesizers, respectively for storing the two groups of synthesized data; two vector generators, operatively connected to said two synthesized data memories, respectively, for generating two groups of vectors; two vector memories operatively connected to said two vector generators, respectively, for storing the two groups of vectors, each vector having a direction; and vector comparator means, operatively connected to said vector memories, for providing summations in each direction of the vectors stored in each of said two vector memories, for comparing the summations of each of said two vector memories, for providing differences between the summations of each of said two vector memories, and for producing output informing of a defect in the photomask pattern if a non-zero difference is obtained as at least one of the differences.

Claim 6

An inspecting apparatus using a vector comparing method, comprising: a pair of optical systems, each comprising a lens system coupled to an image sensor, said optical systems respectively obtaining optical images from respective parts of the photomask pattern and converting the optical images into two groups of electrical analog signals; an amplitude distributor, operatively connected to said image sensors, for distributing the two groups of electrical analog signals respectively into two groups of digital data; two first memories, operatively connected to said amplitude distributor, respectively, for storing the two groups of digital data; two data separators, operatively connected to said two first memories, respectively for separating two groups of separated data from the two groups of digital data; two second memories, operatively connected to said two data separators, respectively, for storing the two groups of separated data; two data shifters, operatively connected to said two second memories, respectively, for providing two groups of shifted data; two data synthesizers, operatively connected to said two second memories, respectively, for providing two groups of synthesized data by logical calculations; a logic selector, operatively connected to said two data synthesizers, for selecting one of black priority logic and white priority logic for the logical calculations in said two data synthesizers; two synthesized data memories, operatively connected to said two data synthesizers, respectively for storing the two groups of synthesized data; two vector generators, operatively connected to said two synthesized data memories, respectively, for generating two groups of vectors; two vector memories operatively connected to said two vector generators, respectively, for storing the two groups of vectors, each vector having a direction; and vector comparator means, operatively connected to said vector memories, for providing summations in each direction of the vectors stored in each of said two vector memories, for comparing the summations of each of said two vector memories, for providing differences between the summations of each of said two vector memories, and for producing output informing of a defect in the photomask pattern if a non-zero difference is obtained as at least one of the differences.

Claim 7

An inspecting apparatus using a vector comparing method, comprising: two optical systems, each comprising a lens system coupled to an image sensor, said optical systems respectively obtaining optical images from respective parts of the photomask pattern and converting the optical images into two groups of electrical analog signals; an amplitude distributor, operatively connected to said image sensors, for distributing the two groups of electrical analog signals into two groups of digital data; two first memories, operatively connected to said amplitude distributor, respectively, for storing the two groups of digital data; two data separators, operatively connected to said two first memories, respectively, for separating two groups of separated data from the two groups of digital data; two second memories, operatively connected to said two data separators, respectively, for storing the two groups of separated data; two groups of data shifters, operatively connected to said two second memories, respectively, for simultaneously providing two groups of shifted data by using a plurality of shift amounts to form the two groups of shifted data from the two groups of separated data; two groups of pairs of data synthesizers, operatively connected to said two groups of data shifters and said two second memories, respectively, for simultaneously providing two groups of pairs of synthesized data, one of each of the pairs of synthesized data being synthesized by logical calculations using black priority logic and the other of each of the pairs of synthesized data being synthesized using white priority logic; a logic generator, operatively connected to said two groups of pairs of data synthesizers, for generating the black priority logic and the white priority logic for the logical calculations in said two groups of pairs of data synthesizers; two groups of pairs of synthesized data memories, operatively connected to said two groups of pairs of data synthesizers, respectively, for simultaneously storing the two groups of pairs of synthesized data; two groups of pairs of vector generators, operatively connected to said two groups of pairs of synthesized data memories, respectively, for simultaneously providing two groups of paired sets of vectors from the two groups of pairs of synthesized data, each vector having a direction; two groups of pairs of vector memories, operatively connected to said two groups of pairs of vector generators, respectively, for simultaneously storing the two groups of of paired sets of vectors; and vector comparator means, operatively connected to said two groups of pairs of vector memories, for simultaneously providing summations in each direction of the vectors stored in each of said two groups of pairs of vector memories, for comparing the summations to determine whether there is a difference between the summations of the sets of vectors of any pair in the paired sets of vectors, and for producing an output informing of a defect in the photomask pattern if any difference is obtained between the summations compared by said vector comparator means.

Claim 8

An inspecting apparatus using a vector comparing method, comprising: two optical systems, each comprising a lens system coupled to an image sensor, said optical systems respectively obtaining optical images from respective parts of the photomask pattern and converting the optical images into two groups of electrical analog signals; an amplitude distributor, operatively connected to said image sensors, for distributing the two groups of electrical analog signals into two groups of digital data; two first memories, operatively connected to said amplitude distributor, respectively, for storing the two groups of digital data; two data separators, operatively connected to said two first memories, respectively, for separating two groups of separated data from the two groups of digital data; two second memories, operatively connected to said two data separators, respectively, for storing the two groups of separated data; two groups of data shifters, operatively connected to said two second memories, respectively, for simultaneously providing two groups of shifted data by using a plurality of shift amounts to form the two groups of shifted data from the two groups of separated data; two groups of pairs of data synthesizers, operatively connected to said two groups of data shifters and said two second memories, respectively, for simultaneously providing two groups of pairs of synthesized data, one of each of the pairs of synthesized data being synthesized by logical calculations using black priority logic and the other of each of the pairs of synthesized data being synthesized using white priority logic; a logic generator, operatively connected to said two groups of pairs of data synthesizers, for generating the black priority logic and the white priority logic for the logical calculations in said two groups of pairs of data synthesizers; two groups of pairs of synthesized data memories, operatively connected to said two groups of pairs of data synthesizers, respectively, for simultaneously storing the two groups of pairs of synthesized data; two groups of pairs of vector generators, operatively connected to said two groups of pairs of synthesized data memories, respectively, for simultaneously providing two groups of paired sets of vectors from the two groups of pairs of synthesized data, each vector having a direction; two groups of pairs of vector memories, operatively connected to said two groups of pairs of vector generators, respectively, for simultaneously storing the two groups of of paired sets of vectors; and vector comparator means, operatively connected to said two groups of pairs of vector memories, for simultaneously providing summations in each direction of the vectors stored in each of said two groups of pairs of vector memories, for comparing the summations to determine whether there is a difference between the summations of the sets of vectors of any pair in the paired sets of vectors, and for producing an output informing of a defect in the photomask pattern if any difference is obtained between the summations compared by said vector comparator means.

Claim 9

An inspection method for a photomask pattern applying a vector comparing method, comprising the steps of: (a) obtaining from the photomask pattern a pair of optical images, having picture elements, which are to be compared; (b) shifting periodically and respectively the optical images by a shifting amount corresponding to an amount of the picture elements in the optical images, the amount of the picture elements being provided by pre-inspection of the photomask pattern; (c) repeating steps (a) and (b) periodically to provide a new pair of optical images and a pair of shifted optical images; (d) synthesizing each image in the pair of optical images with a corresponding one of the pair of shifted optical images to produce a pair of synthesized images; and (e) comparing the pair of synthesized images to detect differences between the pair of optical images.

Claim 10

An inspection method for a photomask pattern applying a vector comparing method, comprising the steps of: (a) obtaining from the photomask pattern a pair of optical images, having picture elements, which are to be compared; (b) shifting periodically and respectively the optical images by a shifting amount corresponding to an amount of the picture elements in the optical images, the amount of the picture elements being provided by pre-inspection of the photomask pattern; (c) repeating steps (a) and (b) periodically to provide a new pair of optical images and a pair of shifted optical images; (d) synthesizing each image in the pair of optical images with a corresponding one of the pair of shifted optical images to produce a pair of synthesized images; and (e) comparing the pair of synthesized images to detect differences between the pair of optical images.

Claim 11

A photomask pattern inspection apparatus, comprising: image means for obtaining initial images of corresponding portions of unit patterns in a photomask; shift means, operatively connected to said image means, for shifting each of the initial images by a shift amount to obtain shifted images; synthesizing means, operatively connected to said image means and said shift means, for synthesizing the initial images and shifted images of the corresponding portions, respectively, to form synthesized images; and vector comparison means, operatively connected to said synthesizing means, for generating vectors, having directions, indicating changes in intensity within each of the synthesized images, for comparing the vectors in each of the synthesized images, respectively for each of the directions, and for indicating when at least one difference is detected by the comparing.

Claim 12

A photomask pattern inspection apparatus, comprising: image means for obtaining initial images of corresponding portions of unit patterns in a photomask; shift means, operatively connected to said image means, for shifting each of the initial images by a shift amount to obtain shifted images; synthesizing means, operatively connected to said image means and said shift means, for synthesizing the initial images and shifted images of the corresponding portions, respectively, to form synthesized images; and vector comparison means, operatively connected to said synthesizing means, for generating vectors, having directions, indicating changes in intensity within each of the synthesized images, for comparing the vectors in each of the synthesized images, respectively for each of the directions, and for indicating when at least one difference is detected by the comparing.

Claim 15

A method according to claim 8, wherein the initial images, shifted images and synthesized images all are comprised of matrix elements having values representing one of at least black, gray and white, and wherein step (b) comprises the step of assigning the values to the matrix elements in the synthesized images in dependence upon the values of corresponding matrix elements in the initial images and the shifted images in accordance with one of black priority logic and white priority logic.

Claim 16

A method according to claim 9, wherein said assigning in step (b) in accordance with black priority logic comprises the steps of: (bi) assigning each of the matrix elements in the synthesized images the value representing black if the value of any of the corresponding matrix elements, corresponding thereto, represents black; (bii) assigning each of the matrix elements the value representing gray if the value of any of the corresponding matrix elements, corresponding thereto, represents gray and the value of none of the corresponding matrix elements, corresponding thereto, represents black; and (biii) assigning one of the matrix elements of the synthesized image the value representing white if the value of all of the corresponding matrix elements, corresponding thereto, represents white.

Claim 17

A method according to claim 9, wherein said assigning in step (b) in accordance with white priority logic comprises the steps of: (bi) assigning each of the matrix elements in the synthesized images the value representing white if the value of any of the corresponding matrix elements, corresponding thereto, represents white; (bii) assigning each of the matrix elements the value representing gray if the value of any of the corresponding matrix elements, corresponding thereto, represents gray and the value of none of the corresponding matrix elements, corresponding thereto, represents white; and (biii) assigning each of the matrix elements of the synthesized image the value representing white if the value of both of the corresponding matrix elements, corresponding thereto, represents white.

Claim 18

A method according to claim 8, wherein the directions of the vectors are at least one of up, down, left, right and the four diagonal directions between up and right, right and down, down and left, and left and up.

Claim 19

A method according to claim 12, wherein step (d) comprises the steps of: (di) summing the vectors in each of the directions in each of the synthesized images to provide a number of vectors in each direction; and (di) comparing the number of vectors in each direction for each of the synthesized images.