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US4668573A Expired / Lapsed US ⏱️ 0.0 years remaining

Thin film for recording data

Assignee: Hitachi Ltd
•
Filing: 1986-01-16
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Granted: 1987-05-26
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Expires: 2006-01-16
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Abstract

Abstract A thin film for recording data which is formed on a substrate directly or via a protection layer, and which develops change in the arrangement of atoms upon irradiation with a recording beam, wherein an average composition in the direction of film thickness is represented by the general formula, AXBYCZD alpha E beta wherein X, Y, Z, alpha and beta are values that lie over the ranges of 0</=X<30, 0</=Y</=40, 0</=Z</=70, 15</=Y+Z</=70, 10</= alpha </=65, 20</= beta </=70, E denotes at least one element between Se and S, D denotes at least one element among As, Sb, Si and Ge, C denotes at least one element among Bi, Sn and Pb, B denotes at least one element among Cu, Ag, Au, Sc, Y, Ti, Zr, V, Nb, Cr, Mo, Mn, Fe, Ru, Co, Rh, Ni and Pd, and A denotes an element or elements other than those elements denoted by E, D, C and B.

Inventors

  • 👤 Motoyasu Terao
  • 👤 Tetsuya Nishida
  • 👤 Yasuhiro Ohta
  • 👤 Shinkichi Horigome
  • 👤 Yasushi Miyauchi

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 23:40
CPC Classifications
G; G11; G11B; G11B7/00; G11B7/24; G11B7/241; G11B7/242; G11B7/243; G11B2007/24302; G11B2007/24306; G11B2007/24308; G11B2007/24312; G11B2007/24314; G11B2007/24316; G11B2007/24318; G11B2007/24324; G11B7/252; G11B7/253; G11B7/2533; G11B7/2534; G11B7/256; G11B7/257; Y; Y10; Y10S; Y10S428/00; Y10S428/913; Y10T; Y10T428/00; Y10T428/26; Y10T428/263; Y10T428/264; Y10T428/265; Y10T428/31504; Y10T428/31507; Y10T428/31511; Y10T428/31515; Y10T428/31522; Y10T428/31529; Y10T428/31551; Y10T428/31645; Y10T428/31649; Y10T428/31678; Y10T428/31681; Y10T428/31692; Y10T428/31699; Y10T428/31721; Y10T428/31725; Y10T428/31855; Y10T428/31931; Y10T428/31935; Y10T428/31938

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 207 words
In a thin film up to 300 nm thickness for recording information which is formed on a substrate directly or via a protection layer which consists of at least one of an inorganic material or an organic material, wherein the thin film for recording information develops change in the arrangement of atoms on irradiation with a recording beam, the improvement wherein the thin film for recording information has an average composition which, in the direction of film thickness, is represented by the formula, A.sub.X B.sub.Y C.sub.Z D.sub.α E.sub.β wherein X, Y, Z, α and β are values that lie in the ranges of 0≦X<30, 0≦Y≦40, 0≦Z≦70, 15≦Y+Z≦70, 10≦α≦65, 20≦β≦70, E denotes Se, D denotes at least one element selected from the group consisting of As, Sb, Si and Ge, C denotes at least one element selected from the group consisting of Bi, Sn and Pb, B denotes at least one element selected from the group consisting of Cu, Ag, Au, Sc, Y, Ti, Zr, V, Nb, Cr, Mo, Mn, Fe, Ru, Co, Rh, Ni and Pd, and A denotes at least one element other than those elements denoted by E, D, C and B; wherein the thin film for recording information can be repeatedly recorded and erased.
Claim 2
Dependent Claim 207 words
In a thin film up to 300 nm thickness for recording information which is formed on a substrate directly or via a protection layer which consists of at least one of an inorganic material or an organic material, wherein the thin film for recording information develops change in the arrangement of atoms on irradiation with a recording beam, the improvement wherein the thin film for recording information has an average composition which, in the direction of film thickness, is represented by the formula, A.sub.X B.sub.Y C.sub.Z D.sub.α E.sub.β wherein X, Y, Z, α and β are values that lie in the ranges of 0≦X<30, 0≦Y≦40, 0≦Z≦70, 15≦Y+Z≦70, 10≦α≦65, 20≦β≦70, E denotes Se, D denotes at least one element selected from the group consisting of As, Sb, Si and Ge, C denotes at least one element selected from the group consisting of Bi, Sn and Pb, B denotes at least one element selected from the group consisting of Cu, Ag, Au, Sc, Y, Ti, Zr, V, Nb, Cr, Mo, Mn, Fe, Ru, Co, Rh, Ni and Pd, and A denotes at least one element other than those elements denoted by E, D, C and B; wherein the thin film for recording information can be repeatedly recorded and erased.
Claim 3
Dependent Claim 18 words
A thin film for recording information according to claim 1, wherein an element denoted by D is antimony.
Claim 4
Dependent Claim 18 words
A thin film for recording information according to claim 1, wherein an element denoted by D is germanium.
Claim 5
Dependent Claim 18 words
A thin film for recording information according to claim 1, wherein X lies over a range of 0≦X<5.
Claim 6
Dependent Claim 24 words
A thin film for recording information according to claim 1, wherein the thickness of said thin film ranges from 60 nm to 150 nm.
Claim 7
Dependent Claim 26 words
A thin film for recording information according to claim 1, wherein D denotes at least one element selected from the group consisting of Sb and Ge.
Claim 8
Dependent Claim 31 words
A thin film for recording information according to claim 1, wherein said thin film develops a change between the non-crystalline state and the crystalline state upon irradiation with a light beam.
Claim 9
Dependent Claim 19 words
A thin film for recording information according to claim 7, wherein said light beam is a laser light beam.
Claim 10
Dependent Claim 51 words
A thin film for recording information according to claim 1, wherein A denotes at least one element selected from the group consisting of Ta, Ga, In, Tl, Zn, Cd, Hg, B, C, N, P, O, Te, Hf, W, Pt, Ir, lanthanides, actinides, alkali metals, alkaline earth metals, halogens and inert gases.
Claim 11
Dependent Claim 31 words
A thin film for recording information according to claim 1, wherein A denotes at least one element selected from the group consisting of Ta, Ga, In, Tl, Zn, Cd and Hg.

References Cited (Backward Citations)

US2885309A Cited
US4069487A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1990-05-25 1990-11-24 1991-05-26 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1994-05-25 1994-11-24 1995-05-26 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1998-05-25 1998-11-24 1999-05-26 $7700.00 Window Closed / Lapsed

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