US4663525A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for electron gun alignment in electron microscopes
Assignee: Nanometrics Inc
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Filing: 1985-07-08
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Granted: 1987-05-05
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Expires: 2005-07-08
Abstract
Abstract In an electron microscope employing a multi-element electrostatic lens and a position adjustable electron emission gun, the gun tip must be in precise alignment with the very small apertures in the lens elements for high resolution imaging. If the tip is precisely aligned, there will be no variations in displacement of an image if the lens element potentials are varied; if there is misalignment, the image displacement will vary with voltage variations. Thus, proper alignment of the gun tip is easily and rapidly achieved by varying the lens element potential with an oscillator while adjusting the position of the gun tip to a zero image variation.
Inventors
- 👤 Mitsuo Ohtsuki
- 👤 Lloyd W. Denney
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 06:27
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/04; H01J37/06; H01J37/073
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
117 words
In an electron microscope employing a position adjustable electron emission tip, a toroidal electrostatic lens downstream of said tip, detecting means for displaying an image of an object bombarded by the electrons emitted from said tip, and a voltage source coupled between said emission tip and said electrostatic lens, a method for adjusting the position of said emission tip in a plane normal to the optical axis of the microscope and into alignment with the electro-optical center of said electrostatic lens, said method comprising the steps of: varying the amplitude of the voltage source and adjusting the position of the electron emission tip to a position where the displayed image ceases to vary with said varying amplitude.
Claim 2
Dependent Claim
117 words
In an electron microscope employing a position adjustable electron emission tip, a toroidal electrostatic lens downstream of said tip, detecting means for displaying an image of an object bombarded by the electrons emitted from said tip, and a voltage source coupled between said emission tip and said electrostatic lens, a method for adjusting the position of said emission tip in a plane normal to the optical axis of the microscope and into alignment with the electro-optical center of said electrostatic lens, said method comprising the steps of: varying the amplitude of the voltage source and adjusting the position of the electron emission tip to a position where the displayed image ceases to vary with said varying amplitude.
Claim 3
Dependent Claim
56 words
The method claimed in claim 1 wherein said electrostatic lens comprises a toroidal extraction electrode coupled to a first voltage source and a toroidal acceleration electrode coupled to a second voltage source, the apertures through said extraction and acceleration electrodes forming an axis upon which said electron emission tip must be aligned for optimum image resolution.
Claim 4
Dependent Claim
36 words
The method claimed in claim 2 wherein said step of varying the amplitude is by use of a variable voltage oscillator for modulating said second voltage source at a frequency chosen between 0.01 and 1000 Hz.
Claim 5
Dependent Claim
41 words
The method claimed in claim 3 wherein the amplitude of said variable voltage is high for initial emission tip adjustments and is decreased in amplitude as said emission tip is adjusted into closed alignment with the axis of said electrostatic lens.
Claim 6
Dependent Claim
36 words
The method claimed in claim 2 wherein said step of varying the amplitude is by use of a variable voltage oscillator for modulating said first voltage source at a frequency chosen between 0.01 and 1000 Hz.
Claim 7
Dependent Claim
41 words
The method claimed in claim 5 wherein the amplitude of said variable voltage is high for initial emission tip adjustments and is decreased in amplitude as said emission tip is adjusted into closer alignment with the axis of said electrostatic lens.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1990-05-04 | 1990-11-03 | 1991-05-05 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-05-04 | 1994-11-03 | 1995-05-05 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-05-04 | 1998-11-03 | 1999-05-05 | $7700.00 | Window Closed / Lapsed |