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US4662989A Expired / Lapsed US ⏱️ 0.0 years remaining

High efficiency metal lift-off process

Assignee: Samsung Electronics Co Ltd
•
Filing: 1985-10-04
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Granted: 1987-05-05
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Expires: 2005-10-04
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Abstract

Abstract An improved high efficiency metal lift-off process for removing a layer of metal at least partially covering a layer of photoresist. The method comprises forming microcracks located above the layer of photoresist in the layer of metal to be removed and providing solvent to the layer of photoresist through the microcracks.

Inventors

  • 👤 Daniel K. Casey
  • 👤 Eddie C. Lee

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-08 20:20
CPC Classifications
H; H10; H10W; H10W90/00; H10P; H10P76/00; H10P76/20; H10P76/202; H10W20/00; H10W20/01; H10W20/031; H10W20/056; H10W20/058; Y; Y10; Y10S; Y10S438/00; Y10S438/942; Y10S438/948; Y10S438/951

Claims Analysis

Total Claims: 14
Claim 1
Independent Claim 73 words
A high efficiency metal lift-off process for removing a layer of metal at least partially covering a layer of photoresist, the process comprising: applying an additional layer of material over the layer of metal to be removed so that the additional layer of material causes microcracks to develop through both the layer of metal to be removed and the additional layer of material; and providing solvent to the photoresist layer through the microcracks.
Claim 2
Dependent Claim 73 words
A high efficiency metal lift-off process for removing a layer of metal at least partially covering a layer of photoresist, the process comprising: applying an additional layer of material over the layer of metal to be removed so that the additional layer of material causes microcracks to develop through both the layer of metal to be removed and the additional layer of material; and providing solvent to the photoresist layer through the microcracks.
Claim 3
Dependent Claim 14 words
The process of claim 1 wherein the additional layer of material comprises a metal.
Claim 4
Dependent Claim 24 words
The process of claim 2 wherein the additional layer of material comprises a metal selected from the group consisting of Cr, TiW, and W.
Claim 5
Dependent Claim 14 words
The process of claim 1 wherein the additional layer of material comprises a dielectric.
Claim 6
Dependent Claim 97 words
A high efficiency metal lift-off process for removing a layer of metal at least partially covering a layer of photoresist, the layer of metal to be removed having a stress in a first predetermined direction, the method, comprising: depositing an additional layer of material over the layer of metal to be removed, the additional layer of material having a stress in a direction substantially opposite to the first predetermined direction, thus forming microcracks through both the metal layer to be removed and the additional layer of material; and providing solvent to the photoresist layer through the microcracks.
Claim 7
Dependent Claim 97 words
A high efficiency metal lift-off process for removing a layer of metal at least partially covering a layer of photoresist, the layer of metal to be removed having a stress in a first predetermined direction, the method, comprising: depositing an additional layer of material over the layer of metal to be removed, the additional layer of material having a stress in a direction substantially opposite to the first predetermined direction, thus forming microcracks through both the metal layer to be removed and the additional layer of material; and providing solvent to the photoresist layer through the microcracks.
Claim 8
Dependent Claim 37 words
The process of claim 5 wherein the level of stress in the additional layer of material is at least one order of magnitude greater than the level of stress in the layer of metal to be removed.
Claim 9
Dependent Claim 14 words
The process of claim 6 wherein the additional layer of material comprises a metal.
Claim 10
Dependent Claim 24 words
The process of claim 7 wherein the additional layer of material comprises a metal selected from the group consisting of Cr, TiW, and W.
Claim 11
Dependent Claim 14 words
The process of claim 6 wherein the additional layer of material comprises a dielectric.
Claim 12
Dependent Claim 14 words
The process of claim 5 wherein the additional layer of material comprises a metal.
Claim 13
Dependent Claim 24 words
The process of claim 10 wherein the additional layer of material comprises a metal selected from the group consisting of Cr, TiW, and W.
Claim 14
Dependent Claim 14 words
The process of claim 5 wherein the additional layer of material comprises a dielectric.

References Cited (Backward Citations)

US4064290A Cited
US3873361A Cited
US3948706A Cited
US4119483A Cited
US4004044A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1990-05-04 1990-11-03 1991-05-05 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1994-05-04 1994-11-03 1995-05-05 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1998-05-04 1998-11-03 1999-05-05 $7700.00 Window Closed / Lapsed

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