US4659428A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of manufacturing a semiconductor device and semiconductor device manufactured by means of the method
Assignee: US Philips Corp
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Filing: 1986-03-17
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Granted: 1987-04-21
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Expires: 2006-03-17
Abstract
Abstract An improved method of manufacturing a semiconductor device having a narrow groove or slot is provided. There are formed on a substrate a heavily n-doped first silicon layer, an oxidation-preventing layer such as silicon nitride, and a weakly doped or undoped second silicon layer. By means of a single masking step, a part of the second silicon layer is removed, and the remaining part is partially oxidized. The exposed portion of the oxidation-preventing layer is removed without a further masking step by using the oxidized remaining parts of the second silicon layer. Subsequently, the oxide on the second silicon layer is removed. By thermal oxidation, a thin oxide layer is formed on the second silicon layer and an about ten times thicker oxide layer is formed on the first silicon layer. After the exposed oxidation-preventing layer has been etched away, the oxide on the second silicon layer is etched away entirely, and the oxide on the first silicon layer is etched away only superficially. After this, a groove is etched at the removed portions of the exposed oxidation-preventing layer while simultaneously removing the remaining parts of the second silicon layer.
Inventors
- 👤 Henricus G. R. Maas
- 👤 Johannes A. Appels
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 18:29
CPC Classifications
H; H10; H10D; H10D44/00; H10D44/01; H10D44/041; H10P; H10P50/00; H10P50/69; H10P50/691; H10P76/00; H10P76/40; H10P95/00; Y; Y10; Y10S; Y10S438/00; Y10S438/911; Y10S438/981
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
286 words
A method of manufacturing a semiconductor device comprising the steps of forming an oxidation-preventing layer on a first layer of silicon, forming a second layer of silicon on said oxidation-preventing layer, removing at least one portion of said second silicon layer from said oxidation-preventing layer, oxidizing all exposed surfaces of the remaining parts of said second silicon layer, removing exposed portions of said oxidation-preventing layer on said first silicon layer, removing the oxidized surface parts of said second silicon layer by etching, thermally oxidizing exposed portions of said first silicon layer and said remaining exposed parts of said second silicon layer to form a thick oxide layer on said first silicon layer and a thinner oxide layer on said remaining parts of said second silicon layer such that the thinner oxide layer does not entirely cover the remaining exposed portion of said oxidation-preventing layer, removing the exposed portion of said oxidation-preventing layer by etching, entirely removing said thinner oxide layer on said remaining parts of said second silicon layer by mask-free etching, wherein the upper portion of said thick oxide layer is removed while the lower portion of said thick oxide layer remains on said first silicon layer, etching at least one groove into said first silicon layer at said removed portion of said oxidation-preventing layer, said groove separating a first part of said first silicon layer from a second part of said first silicon layer, said first part of said first silicon layer being strongly n-type conducting, and said first part having a higher doping concentration than at least said remaining part of said second silicon layer, and during said etching of at least one groove, removing said remaining parts of said second silicon layer.
Claim 2
Independent Claim
286 words
A method of manufacturing a semiconductor device comprising the steps of forming an oxidation-preventing layer on a first layer of silicon, forming a second layer of silicon on said oxidation-preventing layer, removing at least one portion of said second silicon layer from said oxidation-preventing layer, oxidizing all exposed surfaces of the remaining parts of said second silicon layer, removing exposed portions of said oxidation-preventing layer on said first silicon layer, removing the oxidized surface parts of said second silicon layer by etching, thermally oxidizing exposed portions of said first silicon layer and said remaining exposed parts of said second silicon layer to form a thick oxide layer on said first silicon layer and a thinner oxide layer on said remaining parts of said second silicon layer such that the thinner oxide layer does not entirely cover the remaining exposed portion of said oxidation-preventing layer, removing the exposed portion of said oxidation-preventing layer by etching, entirely removing said thinner oxide layer on said remaining parts of said second silicon layer by mask-free etching, wherein the upper portion of said thick oxide layer is removed while the lower portion of said thick oxide layer remains on said first silicon layer, etching at least one groove into said first silicon layer at said removed portion of said oxidation-preventing layer, said groove separating a first part of said first silicon layer from a second part of said first silicon layer, said first part of said first silicon layer being strongly n-type conducting, and said first part having a higher doping concentration than at least said remaining part of said second silicon layer, and during said etching of at least one groove, removing said remaining parts of said second silicon layer.
Claim 3
Dependent Claim
50 words
A method according to claim 1, wherein said thinner oxide layer on said remaining part of said second silicon layer is removed in a first plasma after removing said exposed portion of said oxidation-preventing layer, and wherein said groove is etched by a second plasma in a continuous etching process.
Claim 4
Dependent Claim
26 words
A method according to claim 2, wherein said first plasma is a carbon tetrachloride (CCl 4 ) plasma, and said second plasma is a chlorine plasma.
Claim 5
Dependent Claim
45 words
A method according to claim 1 or claim 2 or claim 3, wherein said step of thermally oxidizing said first silicon layer and said remaining part of said second silicon layer is carried out in steam at a temperature between 700° C. and 800° C.
Claim 6
Dependent Claim
78 words
A method according to claim 1 or claim 2 or claim 3 wherein said first silicon layer is undoped upon said step of forming said oxidation-preventing layer, and wherein after the first step of oxidizing said remaining part of said second silicon layer, said first silicon layer free of said second silicon layer is given a high n-doping to form said first part, said oxide on said remaining part of said second silicon layer masking against said doping.
Claim 7
Dependent Claim
102 words
A method according to claim 5, wherein said first silicon layer is provided on a p-type base zone of a bipolar transistor formed in an n-type collector region through an oxide window, wherein said first part of said first silicon layer has an edge located inside said oxide window, wherein upon diffusion from said first part an n-type emitter zone is formed in said base zone, wherein said groove is covered by a thermal oxide layer, and wherein remaining parts of said oxidation-preventing layer are then removed, said second part of said first silicon layer then being given a high p-type doping.
Claim 8
Dependent Claim
26 words
A method according to claim 1 or claim 2 or claim 3, wherein said groove is etched through the entire thickness of said first silicon layer.
Claim 9
Dependent Claim
27 words
A method according to claim 1 or claim 2 or claim 3, wherein said groove is covered by an oxide layer obtained by a second thermal oxidation.
Claim 10
Dependent Claim
53 words
A method according to claim 1 or claim 2 or claim 3, wherein said first silicon layer is provided on a semiconductor substrate covered by an oxide layer, and wherein said step of etching said grooves subdivides said first silicon layer into a number of insulated gate electrodes of a field effect device.
Claim 11
Dependent Claim
35 words
A method according to claim 1 or claim 2 or claim 3, wherein said first part of said first silicon layer is highly doped with n-type dopant to at least 2×10 20 atoms/cm 3 .
Claim 12
Dependent Claim
24 words
A method according to claim 1 or claim 2 or claim 3, wherein said groove has a thickness of the order of 0.6 microns.
Claim 13
Dependent Claim
19 words
A method according to claim 1 or claim 2 or claim 3, wherein said groove has substantially vertical walls.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1990-04-20 | 1990-10-20 | 1991-04-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-04-20 | 1994-10-20 | 1995-04-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-04-20 | 1998-10-20 | 1999-04-21 | $7700.00 | Window Closed / Lapsed |