Universal spectrometer system having modular sampling chamber

Claim 2

A spectrometer system comprising: an interferometer sub-assembly from which a first collimated beam is output; a detector sub-assembly toward which a second collimated beam is input; the first and second collimated beams being parallel to one another; means for enclosing the interferometer sub-assembly and the detector sub-assembly, said means providing first and second apertures for the first and second collimated beams, respectively; a unitary accessory enclosure adapted to be readily attached to, and readily detached from, the enclosing means, said enclosure having apertures aligned with said first and second apertures; a first mirror which is supported inside the accessory enclosure, and which is arranged to reflect the entire first aperture radiation beam at a ninety degree angle; a second mirror which is supported inside the accessory enclosure, and which is arranged to reflect the entire second aperture radiation beam at a ninety degree angle; and means for purging both the sub-assembly enclosing means and the accessory enclosure so as to replace the normal atmosphere with an optically non-interfering gas.

Claim 3

The spectrometer system of claim 1 wherein the sample containing module comprises: a rear-wall-forming plate having integral portions which extend beyond the end walls of the module; and means for holding the extending portions of the plate against the enclosing means.

Claim 4

The spectrometer system of claim 1 in which the first and second mirrors are confocal paraboloids.

Claim 5

The spectrometer system of claim 1 in which the first and second mirrors are flat reflectors which provide co-linear collimated beams between them.

Claim 6

The spectrometer system of claim 4 which also includes: a pair of confocal paraboloids located between the first and second flat reflectors, and having their common focal point laterally spaced from the co-linear collimated beams.

Claim 7

In a spectrometer system having an interferometer sub-assembly, a detector sub-assembly, and means for enclosing the interferometer sub-assembly and the detector sub-assembly, said enclosing means having first and second apertures: means for causing an interferometer-modulated collimated analytical beam from the interferometer sub-assembly to exit the enclosing means through the first aperture; means for passing to the detector sub-assembly a collimated radiation beam which enters the enclosing means through the second aperture; a readily-detachable sample-containing module attached to the enclosing means, and having two apertures aligned with the first and second apertures, respectively; means in the module for receiving the collimated radiation which exits from the first aperture, for illuminating the sample, and for directing post-sample collimated radiation through the second aperture; a hollow guiding member extending from the exterior of the sample-containing module into the interior thereof beyond the point where sample illumination occurs; and sample-carrying means insertable in the hollow guiding member in such a way as to block ingress of atmosphere to the interior of the module; each sample being removable from the interior of the module without permitting ingress of atmosphere to the interior of the module.

Claim 8

In a spectrometer system having an interferometer sub-assembly, a detector sub-assembly, and means for enclosing the interferometer sub-assembly and the detector sub-assembly, said enclosing means having first and second apertures: means for causing an interferometer-modulated collimated analytical beam from the interferometer sub-assembly to exit the enclosing means through the first aperture; means for passing to the detector sub-assembly a collimated radiation beam which enters the enclosing means through the second aperture; a readily-detachable sample-containing module attached to the enclosing means, and having two apertures aligned with the first and second apertures, respectively; means in the module for receiving the collimated radiation which exits from the first aperture, for illuminating the sample, and for directing post-sample collimated radiation through the second aperture; a hollow guiding member extending from the exterior of the sample-containing module into the interior thereof beyond the point where sample illumination occurs; and sample-carrying means insertable in the hollow guiding member in such a way as to block ingress of atmosphere to the interior of the module; each sample being removable from the interior of the module without permitting ingress of atmosphere to the interior of the module.

Claim 9

The spectrometer system of claim 6 wherein each sample is caused to move into the hollow guiding member at one wall of the module, is illuminated inside the module, and is then caused to eject from the module at the opposite wall thereof.

Claim 10

The spectrometer system of claim 6 wherein the sample-carrying means is a plunger-like member having a sample receptacle intermediate its ends, thereby permitting each sample, after illumination, to be removed through the same module wall aperture through which it entered without permitting ingress of atmosphere to the interior of the module.

Claim 11

The spectrometer system of claim 7 wherein the entering wall of the module through which each sample enters is the top wall, and the exiting wall of the sample module through which each sample exits is the bottom wall.

Claim 12

The spectrometer system of claim 8 wherein the wall of the module through which each sample is inserted and removed is the front wall, i.e., the wall opposite the enclosing means to which the module is secured.