Method and apparatus for making a contact-free measurement of the actual position and of the profile of a coarse surface

Claim 2

Method for contact-free measurement of an actual position on a surface, the method comprising the steps of: (a) splitting a laser light having at least two different wavelengths into a reference beam directed along a reference beam path onto an even reference surface and a measuring beam directed along a measuring beam path onto the surface to be measured; (b) focussing the light reflected from said surfaces into an interferogram plane whereat a speckle pattern occurs containing bright speckles which are bright for all of said wavelengths; (c) selecting one of said bright speckles corresponding to a measuring point on the surface; (d) generating signals corresponding to respective ones of said wavelengths for the selected bright speckle; (e) measuring the difference in phase between said signals corresponding to said selected bright speckle; and, (f) converting said difference in phase into a signal proportional to the distance h of the measuring point from said reference surface.

Claim 3

The method of claim 1, wherein light having three wavelengths is utilized in said measuring step.

Claim 4

The method of claim 1, the measurement utilizing various wavelengths being conducted simultaneously.

Claim 5

The method of claim 1, the measurement utilizing various wavelengths being conducted sequentially.

Claim 6

The method of claim 1, comprising the further steps of displacing the frequency of the light in said reference beam path and of making the measurement with the heterodyne frequency occurring thereby.

Claim 7

The method of claim 1, comprising the further step of focusing said measureing beam onto said surface to be measured.

Claim 8

The method of claim 1, the further step of displacing said surface to be measured relative to said measuring beam.

Claim 9

Apparatus for making a contact-free measurement of the actual position and of the profile of a rough surface of an object, the apparatus comprising: at least one light source for generating a laser light having different wavelengths; first beam splitter means disposed between the object and said light source for splitting said laser light into a reference beam directed along a reference beam path and a measuring beam directed along a measuring beam path onto the surface of the object; planar reference surface means mounted in said reference beam path for reflecting said reference beam; a measuring diaphragm arranged in an interferogram plane wherein a laser speckle pattern occurs containing bright speckles which are bright for all of said wavelengths, said interferogram plane being conjugated to said reference surface means and said measuring diaphragm having a diameter less than the diameter of a bright laser speckle of said laser speckle pattern; second beam splitter means arranged behind said measuring diaphragm for splitting said measuring beam corresponding to said bright laser speckle into component beams corresponding to respective ones of said wavelengths; a plurality of detectors disposed so as to receive corresponding ones of said component beams for generating respective detector signals; and, an arrangement disposed downstream of said detectors for receiving said detector signals and for generating a measuring signal proportional to the difference in phase of said detector signals.

Claim 10

Apparatus for making a contact-free measurement of the actual position and of the profile of a rough surface of an object, the apparatus comprising: at least one light source for generating a laser light having different wavelengths; first beam splitter means disposed between the object and said light source for splitting said laser light into a reference beam directed along a reference beam path and a measuring beam directed along a measuring beam path onto the surface of the object; planar reference surface means mounted in said reference beam path for reflecting said reference beam; a measuring diaphragm arranged in an interferogram plane wherein a laser speckle pattern occurs containing bright speckles which are bright for all of said wavelengths, said interferogram plane being conjugated to said reference surface means and said measuring diaphragm having a diameter less than the diameter of a bright laser speckle of said laser speckle pattern; second beam splitter means arranged behind said measuring diaphragm for splitting said measuring beam corresponding to said bright laser speckle into component beams corresponding to respective ones of said wavelengths; a plurality of detectors disposed so as to receive corresponding ones of said component beams for generating respective detector signals; and, an arrangement disposed downstream of said detectors for receiving said detector signals and for generating a measuring signal proportional to the difference in phase of said detector signals.

Claim 11

The apparatus of claim 8, further comprising phase displacement means disposed in said reference beam path for displacing the frequency of said reference beam by an amount corresponding to a heterodyne frequency; and, said arrangement being configured for measuring said difference in phase in the presence of said heterodyne frequency.

Claim 12

The apparatus of claim 8, comprising a focussing lens mounted between said first beam splitter means and the surface of the object, said first beam splitter means, said planar reference surface means and said focussing lens all being displaceable with respect to the object.

Claim 13

Apparatus for making a contact-free measurement of the actual position and of the profile of a rough surface of an object, the apparatus comprising: at least one light source for generating a laser light having different wavelengths; first beam splitter means disposed between the object and said light source for splitting said laser light into a reference beam directed along a reference beam path and a measuring beam directed along a measuring beam path onto the surface of the object; planar reference surface means mounted in said reference beam path for reflecting said reference beam; a measuring diaphragm arranged outside of an interferogram plane wherein a laser speckle pattern occurs containing bright speckles which are bright for all of said wavelengths, said interferogram plane being conjugated to said reference surface means and said measuring diaphragm having a diameter less than the diameter of a bright laser speckle of said laser speckle pattern; second beam splitter means arranged behind said measuring diaphragm for splitting said measuring beam corresponding to said bright laser speckle into component beams corresponding to respective ones of said wavelengths; a plurality of detectors disposed so as to receive corresponding ones of said component beams for generating respective detector signals; and, an arrangement disposed downstream of said detectors for receiving said detector signals and for generating a measuring signal proportional to the difference in phase of said detector signals.

Claim 14

Apparatus for making a contact-free measurement of the actual position and of the profile of a rough surface of an object, the apparatus comprising: at least one light source for generating a laser light having different wavelengths; first beam splitter means disposed between the object and said light source for splitting said laser light into a reference beam directed along a reference beam path and a measuring beam directed along a measuring beam path onto the surface of the object; planar reference surface means mounted in said reference beam path for reflecting said reference beam; a measuring diaphragm arranged outside of an interferogram plane wherein a laser speckle pattern occurs containing bright speckles which are bright for all of said wavelengths, said interferogram plane being conjugated to said reference surface means and said measuring diaphragm having a diameter less than the diameter of a bright laser speckle of said laser speckle pattern; second beam splitter means arranged behind said measuring diaphragm for splitting said measuring beam corresponding to said bright laser speckle into component beams corresponding to respective ones of said wavelengths; a plurality of detectors disposed so as to receive corresponding ones of said component beams for generating respective detector signals; and, an arrangement disposed downstream of said detectors for receiving said detector signals and for generating a measuring signal proportional to the difference in phase of said detector signals.

Claim 15

Method for contact-fee measurement of an actual position and of the profile of a rough surface, the method comprising the steps of: (a) splitting a laser light having at least two different wavelengths into a reference beam directed along a reference beam path onto an even reference surface and a measuring beam directed along a measuring beam path onto the surface to be measured; (b) focussing the light reflected from said surfaces into an interferogram plane whereat a speckle pattern occurs containing bright speckles which are bright for all of said wavelengths; (c) selecting one of said bright speckles corresponding to a measuring point on the surface; (d) generating signals corresponding to respective ones of said wavelengths for the selected bright speckle; (e) measuring the difference in phase between said signals corresponding to said selected bright speckle; (f) converting said difference in phase into a signal proportional to the distance h of the measuring point from said reference surface; and, (g) selecting other ones of said bright speckles corresponding to other respective measuring points on the surface and repeating said steps (d) to (f).

Claim 16

Method for contact-fee measurement of an actual position and of the profile of a rough surface, the method comprising the steps of: (a) splitting a laser light having at least two different wavelengths into a reference beam directed along a reference beam path onto an even reference surface and a measuring beam directed along a measuring beam path onto the surface to be measured; (b) focussing the light reflected from said surfaces into an interferogram plane whereat a speckle pattern occurs containing bright speckles which are bright for all of said wavelengths; (c) selecting one of said bright speckles corresponding to a measuring point on the surface; (d) generating signals corresponding to respective ones of said wavelengths for the selected bright speckle; (e) measuring the difference in phase between said signals corresponding to said selected bright speckle; (f) converting said difference in phase into a signal proportional to the distance h of the measuring point from said reference surface; and, (g) selecting other ones of said bright speckles corresponding to other respective measuring points on the surface and repeating said steps (d) to (f).