US4649365A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Platinum resistor for the measurement of temperatures
Assignee: Sharp Corp
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Filing: 1986-02-04
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Granted: 1987-03-10
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Expires: 2006-02-04
Abstract
Abstract A platinum resistor for the measurement of temperatures having a silicon substrate, an aluminum oxide film formed on said silicon substrate, and a platinum film formed on said aluminum oxide film.
Inventors
- 👤 Hisatoshi Furubayashi
- 👤 Hiroki Tabuchi
- 👤 Masaya Hijikigawa
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 12:15
CPC Classifications
H; H01; H01C; H01C7/00; H01C7/02; H01C7/021; G; G01; G01K; G01K7/00; G01K7/16; G01K7/18; G01K7/183
Claims Analysis
Total Claims: 3
Claim 1
Independent Claim
31 words
A platinum resistor for the measurement of temperatures comprising a silicon substrate, an aluminum oxide film formed on said silicon substrate, and a platinum film formed on said aluminum oxide film.
Claim 2
Dependent Claim
31 words
A platinum resistor for the measurement of temperatures comprising a silicon substrate, an aluminum oxide film formed on said silicon substrate, and a platinum film formed on said aluminum oxide film.
Claim 3
Dependent Claim
38 words
A platinum resistor for the measurement of temperatures according to claim 1, wherein said aluminum oxide film is formed on said silicon substrate by a vacuum evaporation method, sputtering, ion-plating, chemical vapor deposition, or an anodic oxidation method.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1990-03-09 | 1990-09-08 | 1991-03-10 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-03-09 | 1994-09-08 | 1995-03-10 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-03-09 | 1998-09-08 | 1999-03-10 | $7700.00 | Window Closed / Lapsed |