US4634041A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Process for bonding current carrying elements to a substrate in an electronic system, and structures thereof
Assignee: International Business Machines Corp
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Filing: 1984-06-29
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Granted: 1987-01-06
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Expires: 2004-06-29
Abstract
Abstract A process for bonding an I/O pin to a substrate wherein a mass of brazing material of an alloy that includes Ag and a metal selected from the group consisting of In and Sn and mixtures thereof, that exhibit a mushy zone over a predetermined range, is placed between a pin pad and the bonding surface of an I/O pin, where the diameter of the pin pad exceeds the diameter of the bonding surface of the pin by at least 0.01 inches, heating the resultant assembly to a brazing temperature within the predetermined range to form a mushy state of the brazing material while applying pressure to the pin, and cooling the assembly.
Inventors
- 👤 Chandrika Prasad
- 👤 Andrew F. Szewczyk
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 11:29
CPC Classifications
B; B23; B23K; B23K35/00; B23K35/22; B23K35/24; B23K35/30; B23K35/3006; H; H01; H01R; H01R43/00; H01R43/02
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
173 words
A process for bonding an I/O pin to a substrate of dielectric material comprising, providing a solder wettable pin pad of a predetermined diameter of said substrate, providing an I/O pin with a bonding surface having a diameter that is smaller than the diameter of said pin pad by at least 0.01 inch providing a brazing material of an alloy that at least includes Ag and a metal selected from the group consisting of In and Sn and mixtures thereof that exhibits a mushy zone over a predetermined temperature range, placing said bonding surface of said pin in centered relation to said pin pad with a mass of said brazing material disposed between said bonding surface and said pin pad, heating the resultant assembly to a brazing temperature within said predetermined temperature range while applying pressure to said pin to force the pin head into contact with said brazing material, and cooling the assembly, the edge of the resultant fillet of brazing material being displaced inwardly from the edge of said pin pad.
Claim 2
Dependent Claim
173 words
A process for bonding an I/O pin to a substrate of dielectric material comprising, providing a solder wettable pin pad of a predetermined diameter of said substrate, providing an I/O pin with a bonding surface having a diameter that is smaller than the diameter of said pin pad by at least 0.01 inch providing a brazing material of an alloy that at least includes Ag and a metal selected from the group consisting of In and Sn and mixtures thereof that exhibits a mushy zone over a predetermined temperature range, placing said bonding surface of said pin in centered relation to said pin pad with a mass of said brazing material disposed between said bonding surface and said pin pad, heating the resultant assembly to a brazing temperature within said predetermined temperature range while applying pressure to said pin to force the pin head into contact with said brazing material, and cooling the assembly, the edge of the resultant fillet of brazing material being displaced inwardly from the edge of said pin pad.
Claim 3
Dependent Claim
28 words
The process of claim 1 wherein said brazing material is formed into a preform with a diameter approximately the same as the diameter of said pin bonding surface.
Claim 4
Dependent Claim
31 words
The process of claim 1 wherein said brazing material is provided in the form of a paste that is applied to either the pin or the pin pads prior to assembly.
Claim 5
Dependent Claim
23 words
The process of claim 1 wherein the diameter of said bonding surface of said pin is of the same diameter as the pin.
Claim 6
Dependent Claim
79 words
The process of claim 1 wherein said braze material is an alloy that includes Ag in an amount in the range of 60% to 70% Cu in an amount in the range of 20% to 30%, and In and/or Sn in an amount in the range of 5% to 20%, which alloy exists as a mixture of a solid phase and a liquid phase at temperatures in excess of 600° C. over a range of at least 40° C.
Claim 7
Dependent Claim
23 words
The process of claim 5 wherein said braze material is an alloy having a composition of 63% Ag, 27% Cu, and 10% In.
Claim 8
Dependent Claim
23 words
The process of claim 5 wherein said braze material is an alloy having a composition of 61.5% Ag, 23.5% Cu, and 15% In.
Claim 9
Dependent Claim
18 words
The process of claim 1 wherein said substrate is a multilayer ceramic substrate with an internal metallurgy system.
Claim 10
Dependent Claim
27 words
The process of claim 8 wherein said pin pad consists of a layer of a refractory metal bonded to the substrate and an overlying layer of Ni.
Claim 11
Dependent Claim
17 words
The process of claim 8 wherein said I/O pin is formed of Ni, Fe-Ni-Co or Fe-Ni alloys.
Claim 12
Dependent Claim
17 words
The process of claim 1 wherein said pin and pad is subsequently coated with a Pb-Sn solder.
Claim 13
Dependent Claim
23 words
The process of claim 11 wherein the coating of Pb-Sn solder is applied to the pin and pad by dipping or wave soldering.
References Cited (Backward Citations)
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1990-01-05 | 1990-07-07 | 1991-01-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-01-05 | 1994-07-07 | 1995-01-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-01-05 | 1998-07-07 | 1999-01-06 | $7700.00 | Window Closed / Lapsed |