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US4633176A Expired / Lapsed US ⏱️ 0.0 years remaining

Test fixture including deflectable probes

Assignee: AG Communication Systems Corp
•
Filing: 1984-06-20
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Granted: 1986-12-30
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Expires: 2004-06-20
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Abstract

Abstract A test fixture including deflectable test probes employing flexible members attaching a probe head to a probe shaft, the probe head engaging a locating aperture to deflect the probe head to a printed wiring board test point not in alignment with the test probe axis. The test probe head may be of conical shape and include a plurality of ribs spaced along an outer surface thereof to reduce friction. The probe head may include a tip which is rounded to reduce test point damage or optionally pointed to achieve fine test point contacting resolution.

Inventors

  • 👤 William A. Reimer

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 12:15
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07364; G01R1/07371

Claims Analysis

Total Claims: 15
Claim 1
Independent Claim 284 words
A fixture for use in a printed wiring board test system, comprising: a printed wiring board including a first side surface; a plurality of test points formed on said printed wiring board first surface; a frame for holding said printed wiring board, said board positioned within said frame; a test probe mounting plate movably attached to said frame, said mounting plate parallel to said printed wiring board, proximate to said printed wiring board side surface, and movable in a direction toward said printed wiring board; a plurality of test probes attached to said mounting plate and extending perpendicularly therefrom in a direction toward said printed wiring board, said probes each attached in a predetermined location along a test probe axis perpendicular to said printed wiring board, each probe including a rigid probe mount attached to said mounting plate said mount including a central bore including an axis parallel to said test probe axis, a probe shaft, said shaft slidably positioned within said mount central bore, including a first end near said printed wiring board, a probe test head attached to said shaft first end, a flexible member positioned intermediate each said probe shaft and said test head, said member resiliently positioning said head in alignment with said test probe axis, a probe locating template of planar construction positioned intermediate said printed wiring board and said probe mount, a plurality of apertures formed in said template, each aperture associated with a corresponding test probe and having a central axis displaced from said test probe axis, whereby said mounting plate is moved in a direction toward said printed wiring board and said probe test heads are deflected and engage a corresponding one of said test points.
Claim 2
Dependent Claim 284 words
A fixture for use in a printed wiring board test system, comprising: a printed wiring board including a first side surface; a plurality of test points formed on said printed wiring board first surface; a frame for holding said printed wiring board, said board positioned within said frame; a test probe mounting plate movably attached to said frame, said mounting plate parallel to said printed wiring board, proximate to said printed wiring board side surface, and movable in a direction toward said printed wiring board; a plurality of test probes attached to said mounting plate and extending perpendicularly therefrom in a direction toward said printed wiring board, said probes each attached in a predetermined location along a test probe axis perpendicular to said printed wiring board, each probe including a rigid probe mount attached to said mounting plate said mount including a central bore including an axis parallel to said test probe axis, a probe shaft, said shaft slidably positioned within said mount central bore, including a first end near said printed wiring board, a probe test head attached to said shaft first end, a flexible member positioned intermediate each said probe shaft and said test head, said member resiliently positioning said head in alignment with said test probe axis, a probe locating template of planar construction positioned intermediate said printed wiring board and said probe mount, a plurality of apertures formed in said template, each aperture associated with a corresponding test probe and having a central axis displaced from said test probe axis, whereby said mounting plate is moved in a direction toward said printed wiring board and said probe test heads are deflected and engage a corresponding one of said test points.
Claim 3
Dependent Claim 15 words
A fixture as claimed in claim 1, wherein: said test head is of conical shape.
Claim 4
Dependent Claim 32 words
A fixture as claimed in claim 2, wherein: said test head includes a plurality of ridges spaced equidistantly about said conical surface and which engage said aperture to deflect said test head.
Claim 5
Dependent Claim 14 words
A fixture as claimed in claim 1, wherein: said aperture is of circular cross-section.
Claim 6
Dependent Claim 20 words
A fixture as claimed in claim 4, wherein: said aperture encompasses said test point and said corresponding test probe axis.
Claim 7
Dependent Claim 16 words
A fixture as claimed in claim 1, wherein: said test head is of rectangular pyramidal shape.
Claim 8
Dependent Claim 54 words
A fixture as claimed in claim 1, wherein: said test points are each located on a corresponding row and column of a matrix and said test probes are attached to said mounting plate in a grid, said test probe axis of each probe positioned equidistant from a different group of four adjacent test points.
Claim 9
Dependent Claim 20 words
A fixture as claimed in claim 1, wherein: said aperture central axis is parallel to said corresponding test point axis.
Claim 10
Dependent Claim 22 words
A fixture as claimed in claim 1, wherein: said apertures are all displaced from said test probe axis a fixed predetermined distance.
Claim 11
Dependent Claim 22 words
A fixture as claimed in claim 1, wherein: said apertures are each displaced from said test probe axis a variable predetermined distance.
Claim 12
Dependent Claim 20 words
A fixture as claimed in claim 3, wherein: said plurality of ridges is greater than 3 and less than 5.
Claim 13
Dependent Claim 31 words
A fixture as claimed in claim 1, wherein: said probe head includes a plurality of ribs each including an outer edge, each of said outer edges rounded to reduce rib wear.
Claim 14
Dependent Claim 23 words
A fixture as claimed in claim 1, wherein: said test probe head includes a tip, said tip rounded to prevent test point damage.
Claim 15
Dependent Claim 24 words
A fixture as claimed in claim 1, wherein: said probe head includes a tip, said tip pointed to achieve fine test point contacting resolution.

References Cited (Backward Citations)

US2972728A Cited
US3676776A Cited
US4164704A Cited
US4535536A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1989-12-29 1990-06-30 1990-12-30 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1993-12-29 1994-06-30 1994-12-30 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1997-12-29 1998-06-30 1998-12-30 $7700.00 Window Closed / Lapsed

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