US4628342A
Expired / Lapsed
US
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Optical test pattern for correcting convergence defects of a color camera
Assignee: Thales SA
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Filing: 1983-05-10
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Granted: 1986-12-09
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Expires: 2003-05-10
Abstract
Abstract An optical test pattern for correcting convergence defects of a color camera comprises LN pattern elements (1 ln ) each disposed within one of the LN rectangles which result from a camera-screen lattice arrangement formed by L groups each consisting of M lines and by N columns, each pattern element being constituted by a vertical component and a diagonal component.
Inventors
- 👤 Gerard Desmons
- 👤 Gilles Marchand
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 03:44
CPC Classifications
H; H04; H04N; H04N23/00; H04N23/10; H04N23/13; H04N23/15
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
68 words
An optical test pattern for correcting convergence defects of a color camera, said test pattern comprising an integer number LN of identical pattern elements (1 1n ) each disposed within one of LN rectangles resulting from a camera-screen lattice arrangement formed by L groups each consisting of M lines and N columns, each said pattern element being constituted by one vertical pattern component and one diagonal pattern component.
Claim 2
Dependent Claim
68 words
An optical test pattern for correcting convergence defects of a color camera, said test pattern comprising an integer number LN of identical pattern elements (1 1n ) each disposed within one of LN rectangles resulting from a camera-screen lattice arrangement formed by L groups each consisting of M lines and N columns, each said pattern element being constituted by one vertical pattern component and one diagonal pattern component.
Claim 3
Dependent Claim
23 words
A test pattern according to claim 1, wherein each vertical pattern component is a rectangle whose sides extend in horizontal and vertical directions.
Claim 4
Dependent Claim
33 words
A test pattern according to claim 1 wherein each diagonal pattern component is a parallelogram having two sides extending in the horizontal direction whilst the other two sides extend in an oblique direction.
Claim 5
Dependent Claim
32 words
A test pattern according to claim 1, wherein the vertical component and the diagonal component of each pattern element (1 1n ) are disposed one above the other in the vertical direction.
Claim 6
Dependent Claim
31 words
A test pattern according to claim 1, wherein the vertical component and the diagonal component of each pattern element (1 1n ) are disposed in adjacent relation in the horizontal direction.
Claim 7
Dependent Claim
32 words
A test pattern according to claim 2, wherein the vertical component and the diagonal component of each pattern element (1 1n ) are disposed one above the other in the vertical direction.
Claim 8
Dependent Claim
32 words
A test pattern according to claim 3, wherein the vertical component and the diagonal component of each pattern element (1 1n ) are disposed one above the other in the vertical direction.
Claim 9
Dependent Claim
31 words
A test pattern according to claim 2, wherein the vertical component and the diagonal component of each pattern element (1 1n ) are disposed in adjacent relation in the horizontal direction.
Claim 10
Dependent Claim
31 words
A test pattern according to claim 3, wherein the vertical component and the diagonal component of each pattern element (1 1n ) are disposed in adjacent relation in the horizontal direction.
Claim 11
Dependent Claim
37 words
A test pattern according to claim 1 wherein said vertical pattern component is a rectangle which has linear dimensions wherein the vertical height of the rectangle defines a larger distance than the horizontal width of the rectangle.
Claim 12
Dependent Claim
59 words
Apparatus as in claim 1 wherein said apparatus is used to determine convergence defect, using a method comprising the steps of: measuring a convergence defect in a horizontal plane in said vertical pattern component; measuring a diagonal convergence defect in said diagonal pattern component; and determining a vertical convergence pattern defect from said horizontal and said diagonal convergence defects.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-12-08 | 1990-06-09 | 1990-12-09 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-12-08 | 1994-06-09 | 1994-12-09 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-12-08 | 1998-06-09 | 1998-12-09 | $7700.00 | Window Closed / Lapsed |