US4619729A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Microwave method of making semiconductor members
Assignee: Energy Conversion Devices Inc
•
Filing: 1985-05-15
•
Granted: 1986-10-28
•
Expires: 2005-05-15
Abstract
Abstract A process and system for making semiconductor alloys and members with high reaction gas conversion efficiencies and at high deposition rates utilizes microwave energy to form a deposition plasma. The microwave energy forms depositing species and molecular ions of a semiconductor element and the potential of the plasma is controlled to alter the ion bombardment of the depositing species. The process and system include coupling microwave energy into a substantially enclosed reaction vessel containing a substrate and depositing semiconductor alloys onto the substrate from a reaction gas introduced into the vessel. The semiconductor alloys are particularly suited for relatively thick photoconductive members. The photoconductive member includes at least a bottom blocking layer and a photoconductive layer. The photoconductive member can be formed in a negative or positive charge type configuration. The members also can include a top blocking enhancement layer.
Inventors
- 👤 Annette G. Johncock
- 👤 Stephen J. Hudgens
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 16:50
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/32; H01J37/32009; H01J37/32192; C; C23; C23C; C23C16/00; C23C16/44; C23C16/50; C23C16/511; G; G03; G03G; G03G5/00; G03G5/02; G03G5/04; G03G5/08; G03G5/082; G03G5/08214; G03G5/08235; G03G5/08278; H10; H10F; H10F30/00; H10F30/10; H10F30/15; H10F71/00; H10F71/10; H10F71/103; H10F71/135; Y; Y02; Y02E; Y02E10/00; Y02E10/50; Y02P; Y02P70/00; Y02P70/50
Claims Analysis
Total Claims: 20
Claim 1
Independent Claim
149 words
An improved method of forming a semiconductor member, comprising: providing a substrate; providing a source of microwave energy; providing a substantially enclosed reaction vessel and placing said substrate into said vessel; introducing into said vessel at least one reaction gas, including at least one semiconductor element to be deposited; Providing an operating pressure about an order of magnitude below a conventional RF deposition pressure; coupling said microwave energy into said vessel to form a plasma in said vessel from said reaction gas, including forming depositing species, primarily free radicals, from the semiconductor element and forming molecular ions of the semiconductor element; and depositing a semiconductor alloy member onto said substrate from said depositing species while controlling the plasma potential to alter ion bombardment of the depositing species, controlling said plasma potential including applying an external electrical bias to said substrate, said bias external to and separate from said substrate.
Claim 2
Dependent Claim
149 words
An improved method of forming a semiconductor member, comprising: providing a substrate; providing a source of microwave energy; providing a substantially enclosed reaction vessel and placing said substrate into said vessel; introducing into said vessel at least one reaction gas, including at least one semiconductor element to be deposited; Providing an operating pressure about an order of magnitude below a conventional RF deposition pressure; coupling said microwave energy into said vessel to form a plasma in said vessel from said reaction gas, including forming depositing species, primarily free radicals, from the semiconductor element and forming molecular ions of the semiconductor element; and depositing a semiconductor alloy member onto said substrate from said depositing species while controlling the plasma potential to alter ion bombardment of the depositing species, controlling said plasma potential including applying an external electrical bias to said substrate, said bias external to and separate from said substrate.
Claim 3
Dependent Claim
36 words
The method as defined in claim 1 wherein said ions and said depositing species each have a flux and controlling said plasma potential includea controlling the ratio of the ion flux to the depositing species flux.
Claim 4
Dependent Claim
21 words
The method as defined in claim 2 wherein said ratio ia controlled to be in the range of 0.1 to 0.0001.
Claim 5
Dependent Claim
16 words
The method as defined in claim 3 wherein said ratio is controlled to be about 0.001.
Claim 6
Dependent Claim
12 words
The method as defined in claim 1 including forming a photoconductive member.
Claim 7
Dependent Claim
15 words
The method as defined in claim 1 wherein said reaction gas contains at least silicon.
Claim 8
Dependent Claim
15 words
The method as defined in claim 1 wherein said reaction gas contains at least hydrogen.
Claim 9
Dependent Claim
16 words
The method as defined in claim 7 wherein said reaction gas further contains at least fluorine.
Claim 10
Dependent Claim
15 words
The method as defined in claim 1 wherein said reaction gas contains at least fluorine.
Claim 11
Dependent Claim
77 words
The method as defined in claim 5 including forming a xerographic photoreceptor member, wherein depositing said member includes depositing a first blocking layer onto said substrate by adding at least one dopant to said reaction gas and then depositing a second photoconductive layer onto said layer without a substantial amount of dopant therein, at least said photoconductive layer being deposited while controlling said plasma potential, and including depositing a third blocking layer onto said second photoconductive layer.
Claim 12
Dependent Claim
22 words
The method as defined in claim 10 including depositing a blocking enhancement layer onto said second layer before said third blocking layer.
Claim 13
Dependent Claim
23 words
The method as defined in claim 11 including depositing about a depletion width of said blocking enhancement layer as a substantially intrinsic alloy.
Claim 14
Dependent Claim
19 words
The method as defined in claim 1 wherein said substrate forms part of a waveguide for said microwave energy.
Claim 15
Dependent Claim
234 words
An improved method of forming a semiconductor member, comprising: providing a substrate; providing a source of microwave energy; providing a substantially enclosed reaction vessel and placing said substrate into said vessel; introducing into said vessel at least one reaction gas, including at least one semiconductor element to be deposited; providing an operating pressure about an order of magnitude below a conventional RF deposition pressure; coupling said microwave energy into said vessel to form a plasma in said vessel from said reaction gas, including forming depositing species, primarily free radicals, from the semiconductor element and forming molecular ions of the semiconductor element; depositing a semiconductor alloy member onto said substrate from said depositing species while controlling the plasma potential to alter ion bombardment of the depositing species, controlling said plasma potential including applying an external electrical bias to said substrate, said bias external to and separate from said substrate; and including forming a xerographic photoreceptor member, wherein depositing said member includes depositing a first blocking layer onto said substrate by adding at least one dopant to said reaction gas and then depositing a second photoconductive layer onto said layer without a substantial amount of dopant therein, at least said photoconductive layer being deposited while controlling said plasma potential, including depositing a third blocking layer onto said second photoconductive layer and including depositing a blocking enhancement layer onto said second layer before said third blocking layer.
Claim 16
Dependent Claim
234 words
An improved method of forming a semiconductor member, comprising: providing a substrate; providing a source of microwave energy; providing a substantially enclosed reaction vessel and placing said substrate into said vessel; introducing into said vessel at least one reaction gas, including at least one semiconductor element to be deposited; providing an operating pressure about an order of magnitude below a conventional RF deposition pressure; coupling said microwave energy into said vessel to form a plasma in said vessel from said reaction gas, including forming depositing species, primarily free radicals, from the semiconductor element and forming molecular ions of the semiconductor element; depositing a semiconductor alloy member onto said substrate from said depositing species while controlling the plasma potential to alter ion bombardment of the depositing species, controlling said plasma potential including applying an external electrical bias to said substrate, said bias external to and separate from said substrate; and including forming a xerographic photoreceptor member, wherein depositing said member includes depositing a first blocking layer onto said substrate by adding at least one dopant to said reaction gas and then depositing a second photoconductive layer onto said layer without a substantial amount of dopant therein, at least said photoconductive layer being deposited while controlling said plasma potential, including depositing a third blocking layer onto said second photoconductive layer and including depositing a blocking enhancement layer onto said second layer before said third blocking layer.
Claim 17
Dependent Claim
36 words
The method as defined in claim 14 wherein said ions and said depositing species each have a flux and controlling said plasma potential includes controlling the ratio of the ion flux to the depositing species flux.
Claim 18
Dependent Claim
21 words
The method as defined in claim 15 wherein said ratio is controlled to be in the range of 0.1 to 0.0001.
Claim 19
Dependent Claim
16 words
The method as defined in claim 16 wherein said ratio is controlled to be about 0.001.
Claim 20
Dependent Claim
23 words
The method as defined in claim 14 including depositing about a depletion width of said blocking enhancement layer as a substantially intrinsic alloy.
References Cited (Backward Citations)
US4464415A
Cited
US4359514A
Cited
US4394425A
Cited
US4394426A
Cited
US4443488A
Cited
US4483911A
Cited
US4439463A
Cited
US4481229A
Cited
US4517223A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-10-27 | 1990-04-28 | 1990-10-28 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-10-27 | 1994-04-28 | 1994-10-28 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-10-27 | 1998-04-28 | 1998-10-28 | $7700.00 | Window Closed / Lapsed |