Pulsed linear integrated circuit tester

Claim 1

An integrated circuit tester comprising: a test cabinet means having a bottom, side and top walls for forming an electromagnetic shielded enclosure, said top wall includes an aperture; a first horizontal electromagnetic shielded plate mounted in said enclosure displaced from said bottom wall; a plurality of A.C. probes each mounted below said first plate and connected to a respective first A.C. probe terminal extending onto the top surface of said first plate; a plurality of A.C. input lines each connected below said first plate to a respective first A.C. input terminal extending onto the top surface of said first plate; a plurality of first D.C. input and output lines connected below said first plate to a D.C. receptacle having D.C. socket means accessible from the top side of said first plate; a second horizontal electromagnetic shielded plate, removably mounted in said closure to the top of said first plate; a printed circuit board mounted to the top surface of said second plate; a device under test receptacle mounted on and electrically connected to said printed circuit board and positioned within said aperture in said top wall of said cabinet; a plurality of second A.C. probe terminals on the bottom of said second plate electrically connected to said printed circuit board and contacting said first A.C. probe terminals on the top of said first plate; a plurality of second A.C. input terminals on the bottom of said electrically second plate connected to said printed circuit board and contacting said first A.C. input terminals on the top of said first plate; and a plurality of second D.C. input and output lines interconnecting a D.C. plug means and said printed circuit board, said D.C. plug means being received in said D.C. socket means of said first plate.