US4612660A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Time resolved extended X-ray absorption fine structure spectrometer
Assignee: United States Department of the Navy
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Filing: 1985-05-17
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Granted: 1986-09-16
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Expires: 2005-05-17
Abstract
Abstract The present invention relates to an X-ray spectrometer for obtaining EXAFS data from a target material. The target material is exposed to incident pulsed synchrotron/X-ray radiation having a selected range of continuous spectrum and intensity suitable for obtaining EXAFS data from the material. The transmitted or fluorescence X-rays is detected and integrated over a period of time. The integrator is controlled by a gate synchronous with the pulsed radiation. The integration time of the integrator can be varied. A xenon flash is provided for exciting appropriate materials and is controlled by a gating device which is also synchronized with the radiation pulses.
Inventors
- 👤 Huey W. Huang
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 03:36
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/02; G01N23/06; G01N23/083; G01N23/085
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
102 words
An X-ray spectrometer for obtaining EXAFS data from a target material comprising: a means for detecting EXAFS data of a target material exposed to a pulsed synchrotron radiation having a selected spectrum and intensity suitable for obtaining EXAFS data from the material, and a means for processing said detection data, said means for processing comprising an integration means for measuring intensity of X-ray in such a way that maximizes the signal to noise ratio of the measurement, and a gating means for determining the time interval of integration and for synchronizing the starting time of integration with the pulses of synchrotron radiation.
Claim 2
Dependent Claim
102 words
An X-ray spectrometer for obtaining EXAFS data from a target material comprising: a means for detecting EXAFS data of a target material exposed to a pulsed synchrotron radiation having a selected spectrum and intensity suitable for obtaining EXAFS data from the material, and a means for processing said detection data, said means for processing comprising an integration means for measuring intensity of X-ray in such a way that maximizes the signal to noise ratio of the measurement, and a gating means for determining the time interval of integration and for synchronizing the starting time of integration with the pulses of synchrotron radiation.
Claim 3
Dependent Claim
22 words
The spectrometer of claim 1 wherein the integration time is continuously variable and controllable by the gating means over a predetermined range.
Claim 4
Dependent Claim
15 words
The spectrometer of claim 1 further comprising a flash means for exciting the target material.
Claim 5
Dependent Claim
25 words
The spectrometer of claim 3 wherein the flashing of the flash means is synchronized by a gating means to the pulses of the synchrotron radiation.
References Cited (Backward Citations)
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-09-15 | 1990-03-17 | 1990-09-16 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-09-15 | 1994-03-17 | 1994-09-16 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-09-15 | 1998-03-17 | 1998-09-16 | $7700.00 | Window Closed / Lapsed |