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US4611930A Expired / Lapsed US ⏱️ 0.0 years remaining

Pyrometer measurements in the presence of intense ambient radiation

Assignee: ExxonMobil Technology and Engineering Co
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Filing: 1985-07-01
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Granted: 1986-09-16
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Expires: 2005-07-01
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Abstract

Abstract The invention teaches a method for measuring the temperature of remote hot samples in the presence of ambient radiation. A portion of the surface of the sample is treated to obtain a spectral emissivity different from the untreated surface. The spectral radiances of the treated and untreated surface portions are measured and the temperature calculated from these values and the known emissivities.

Inventors

  • 👤 Alexander Stein

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 02:50
CPC Classifications
G; G01; G01J; G01J5/00; G01J5/02; G01J5/06; G01J2005/0074; G01J5/0044

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 212 words
A method for measuring the temperature of a remote sample in the presence of ambient radiation by observing its radiant emittance at about a given wavelength comprising: (a) treating a portion of a surface of said sample with a refractory material selected to have a total emissivity about equal to that of an untreated surface of said sample while exhibiting a different spectral emissivity than said untreated surface at said wavelength, said wavelength being within the range of 1 μm to 3 μm; (b) measuring the spectral radiance from said treated surface portion of said sample with a radiometer at about said given wavelength within the range 1 μm to 3 μm; (c) measuring the spectral radiance from an untreated surface portion of said sample adjacent to said treated surface portion with a radiometer at about said given wavelength within the range 1 μm to 3 μm such that the surface temperature of said treated portion is about equal to said surface temperature of said adjacent untreated portion of said sample; (d) obtaining the spectral emissivities of said untreated and said treated portions of said sample; and (e) computing said temperature of said sample from the said radiances and emissivities of said treated and untreated surface portions using the Planck radiation formula.
Claim 2
Independent Claim 212 words
A method for measuring the temperature of a remote sample in the presence of ambient radiation by observing its radiant emittance at about a given wavelength comprising: (a) treating a portion of a surface of said sample with a refractory material selected to have a total emissivity about equal to that of an untreated surface of said sample while exhibiting a different spectral emissivity than said untreated surface at said wavelength, said wavelength being within the range of 1 μm to 3 μm; (b) measuring the spectral radiance from said treated surface portion of said sample with a radiometer at about said given wavelength within the range 1 μm to 3 μm; (c) measuring the spectral radiance from an untreated surface portion of said sample adjacent to said treated surface portion with a radiometer at about said given wavelength within the range 1 μm to 3 μm such that the surface temperature of said treated portion is about equal to said surface temperature of said adjacent untreated portion of said sample; (d) obtaining the spectral emissivities of said untreated and said treated portions of said sample; and (e) computing said temperature of said sample from the said radiances and emissivities of said treated and untreated surface portions using the Planck radiation formula.
Claim 3
Dependent Claim 21 words
The method of claim 1 wherein said refractory material consists of a mixture of TaC and Al 2 O 3 .
Claim 4
Dependent Claim 19 words
The method of claim 1 wherein said refractory material consists of a mixture of TaC and SiO 2 .
Claim 5
Dependent Claim 21 words
The method of claim 1 wherein said refractory material consists of a mixture of NbB and Al 2 O 3 .
Claim 6
Dependent Claim 19 words
The method of claim 1 wherein said refractory material consists of a mixture of NbB and SiO 2 .

References Cited (Backward Citations)

US3986384A Cited
US4144758A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1989-09-15 1990-03-17 1990-09-16 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1993-09-15 1994-03-17 1994-09-16 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1997-09-15 1998-03-17 1998-09-16 $7700.00 Window Closed / Lapsed

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