Photoelectric element characteristic measuring apparatus

Claim 2

A photoelectric element characteristic measuring apparatus having: a first illuminating system comprising a first optical system for uniformly illuminating the whole area of a photoelectric element so as to cause generation of first information concerning photoelectric conversion on the element; and a second illuminating system comprising a second optical system for effecting an imaging illumination of a predetermined pattern on a part area of the element so as to cause generation of second information concerning photoelectric conversion on the element; said first optical system and said second optical system using a part thereof in common.

Claim 3

An element characteristic measuring apparatus according to claim 1, wherein a portion of said optical system of said one illuminating system can be replaced with a portion of said optical system of said other illuminating system.

Claim 4

An element characteristic measuring apparatus according to claim 1, wherein said first illuminating system has a double-eye lens and a single lens.

Claim 5

An element characteristic measuring apparatus according to claim 1, wherein at least one of said first and second illuminating systems is variable in wavelength with which it illuminates the element.

Claim 6

An element characteristic measuring apparatus according to claim 1, wherein at least one of said first and second illuminating systems is variable in the quantity of light with which it illuminates the element.

Claim 7

An element characteristic measuring apparatus according to claim 5, wherein said variable quantity of light is detected by a quantity-of-light detector.

Claim 8

An element characteristic measuring apparatus according to claim 1, wherein a light source and a light guiding fiber are used in common in said first and second illuminating systems.

Claim 9

A photoelectric element characteristic measuring apparatus having: a first illuminating system comprising a first optical system for uniformly illuminating the whole area of a photoelectric element so as to cause the generation of first information concerning photoelectric conversion on the element; a second illuminating system comprising a second optical system for effecting an imaging illumination of a predetermined pattern on a part area of the element so as to cause the generation of second information concerning photoelectric conversion on the element; a view field illuminating system for illuminating the whole area of the element during illumination by said second illuminating system; and an observation system for observing the element.

Claim 10

A photoelectric element characteristic measuring apparatus having: a first illuminating system comprising a first optical system for uniformly illuminating the whole area of a photoelectric element so as to cause the generation of first information concerning photoelectric conversion on the element; a second illuminating system comprising a second optical system for effecting an imaging illumination of a predetermined pattern on a part area of the element so as to cause the generation of second information concerning photoelectric conversion on the element; a view field illuminating system for illuminating the whole area of the element during illumination by said second illuminating system; and an observation system for observing the element.

Claim 11

An element characteristic measuring apparatus according to claim 8, wherein said observation system and a part of the optical system of said second illuminating system are integral with each other.

Claim 12

An element characteristic measuring apparatus according to claim 9, wherein said part of the optical system of said second illuminating system integral with said observation system is replaced with a part of said optical system of said first illuminating system, and said first and second illuminating systems are replaced with each other.

Claim 13

An element characteristic measuring apparatus according to claim 8, wherein said second illuminating system and said view field illuminating system differ in wavelength from each other.

Claim 14

An element characteristic measuring apparatus according to claim 8, wherein the illumination of the element by said view field illuminating system is stopped before the characteristic of the element is measured by said second illuminating system.

Claim 15

A photoelectric element characteristic measuring apparatus having: a first illuminating system comprising a first optical system for uniformly illuminating the whole area of a photoelectric element so as to cause generation of first information concerning photoelectric conversion on the element; a second illuminating system comprising a second optical system for effecting an imaging illumination of a predetermined pattern on a part area of the element so as to cause generation of second information concerning a photoelectric conversion on the element; at least one of said first and second illuminating systems having a filter turret provided with a plurality of filters for varying the wavelength or the quantity of light in the illumination of the element; and a driving system for driving said turret, having: a cam member formed with at least one cut-away portion in the outer peripheral portion thereof and rotatable in response to the rotation for setting different filters; a stopper member bearing against the outer peripheral portion of said cam member; and a biasing member for biasing said stopper member toward said cam member.

Claim 16

A photoelectric element characteristic measuring apparatus having: a first illuminating system comprising a first optical system for uniformly illuminating the whole area of a photoelectric element so as to cause generation of first information concerning photoelectric conversion on the element; a second illuminating system comprising a second optical system for effecting an imaging illumination of a predetermined pattern on a part area of the element so as to cause generation of second information concerning a photoelectric conversion on the element; at least one of said first and second illuminating systems having a filter turret provided with a plurality of filters for varying the wavelength or the quantity of light in the illumination of the element; and a driving system for driving said turret, having: a cam member formed with at least one cut-away portion in the outer peripheral portion thereof and rotatable in response to the rotation for setting different filters; a stopper member bearing against the outer peripheral portion of said cam member; and a biasing member for biasing said stopper member toward said cam member.

Claim 17

An element characteristic measuring apparatus according to claim 13, wherein said cam member makes one full rotation each time said turret rotates by a predetermined angle to replace the filter of said turret with the adjacent filter.

Claim 18

An element characteristic measuring apparatus according to claim 13, wherein there is provided a potentiometer whose shaft is rotatable concomitantly with rotation of said turret and a selected filter of said turret is discriminated by reading the resistance value of said potentiometer.

Claim 19

An element characteristic measuring apparatus according to claim 15, wherein said potentiometer makes one full rotation when said turret makes one full rotation.

Claim 20

A photoelectric element characteristic measuring apparatus having: a first illuminating system comprising a first optical system for uniformly illuminating the whole area of a photoelectric element so as to cause generation of first information concerning photoelectric conversion on the element; a second illuminating system comprising a second optical system for effecting an imaging illumination of a predetermined pattern on a part area of the element so as to cause generation of second information concerning photoelectric conversion on the element; and a thermostatic tank for setting the element in a predetermined temperature environment.

Claim 21

A photoelectric element characteristic measuring apparatus having: a first illuminating system comprising a first optical system for uniformly illuminating the whole area of a photoelectric element so as to cause generation of first information concerning photoelectric conversion on the element; a second illuminating system comprising a second optical system for effecting an imaging illumination of a predetermined pattern on a part area of the element so as to cause generation of second information concerning photoelectric conversion on the element; and a thermostatic tank for setting the element in a predetermined temperature environment.

Claim 22

A photoelectric element characteristic measuring apparatus having: a first illuminating system comprising a first optical system for uniformly illuminating the whole area of a photoelectric element so as to cause generation of first information concerning photoelectric conversion on the element; a second illuminating system comprising a second optical system for effecting an imaging illumination of a predetermined pattern on a part area of the element so as to cause generation of second information concerning photoelectric conversion on the element; a view field illuminating system for illuminating the whole area of the element during illumination by said second illuminating system; an observation system for observing the element; and a thermostatic tank for setting the element in a predetermined temperature environment.

Claim 23

A photoelectric element characteristic measuring apparatus having: a first illuminating system comprising a first optical system for uniformly illuminating the whole area of a photoelectric element so as to cause generation of first information concerning photoelectric conversion on the element; a second illuminating system comprising a second optical system for effecting an imaging illumination of a predetermined pattern on a part area of the element so as to cause generation of second information concerning photoelectric conversion on the element; a view field illuminating system for illuminating the whole area of the element during illumination by said second illuminating system; an observation system for observing the element; and a thermostatic tank for setting the element in a predetermined temperature environment.

Claim 24

A photoelectric element characteristic measuring apparatus having: a first illuminating system comprising a first optical system for uniformly illuminating the whole area of the element so as to cause generation of first information concerning photoelectric conversion on the element; and a second illuminating system comprising a second optical system for effecting an imaging illumination of a predetermined pattern on a part area of the element so a to cause generation of second information concerning photoelectric conversion on said element, at least one of said first and second illuminating systems having a filter turret provided with a plurality of filters for varying the wavelength or the quantity of light for the illumination of the element.

Claim 25

A photoelectric element characteristic measuring apparatus having: a first illuminating system comprising a first optical system for uniformly illuminating the whole area of the element so as to cause generation of first information concerning photoelectric conversion on the element; and a second illuminating system comprising a second optical system for effecting an imaging illumination of a predetermined pattern on a part area of the element so a to cause generation of second information concerning photoelectric conversion on said element, at least one of said first and second illuminating systems having a filter turret provided with a plurality of filters for varying the wavelength or the quantity of light for the illumination of the element.