US4607380A
Expired / Lapsed
US
⏱️ 0.0 years remaining
High intensity microfocus X-ray source for industrial computerized tomography and digital fluoroscopy
Assignee: General Electric Co
•
Filing: 1984-06-25
•
Granted: 1986-08-19
•
Expires: 2004-06-25
Abstract
Abstract A high intensity microfocus x-ray source for the inspection of superalloy objects and the like operates at a voltage of the order of 400-500 kV with an electron beam focal spot size of the order of 2-10 mils and at power levels of tens to hundreds of kilowatts and affords a brightness improvement of at least three thousand over conventional x-ray sources.
Inventors
- 👤 David W. Oliver
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 18:30
CPC Classifications
H; H01; H01J; H01J35/00; H01J35/02; H01J35/04; H01J35/08; H01J35/10; H01J35/14; H01J35/147
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
102 words
A method of x-ray inspecting an object to detect a microflaw therein by using an x-ray tube having an electron beam source, a rotating anode, and means for focusing the electron beam onto the anode to produce x-rays, the method comprising operating the electron beam source and the anode at a potential difference of the order of 400-500 kV, focusing the electron beam onto the anode with a spot size of the order of or less than the size of the microflaw so as to emit x-rays, passing the x-rays emitted through the object, and detecting the x-rays passed through the object.
Claim 2
Independent Claim
102 words
A method of x-ray inspecting an object to detect a microflaw therein by using an x-ray tube having an electron beam source, a rotating anode, and means for focusing the electron beam onto the anode to produce x-rays, the method comprising operating the electron beam source and the anode at a potential difference of the order of 400-500 kV, focusing the electron beam onto the anode with a spot size of the order of or less than the size of the microflaw so as to emit x-rays, passing the x-rays emitted through the object, and detecting the x-rays passed through the object.
Claim 3
Dependent Claim
32 words
The method of claim 1, wherein the microflaw is of the order of thousandths to tens of thousandths of an inch and the spot size is of the order of 2-10 mils.
Claim 4
Dependent Claim
18 words
The method of claim 2 further comprising applying a coolant to the rotating anode to remove heat therefrom.
Claim 5
Dependent Claim
23 words
The method of claim 1, wherein the tube is operated at a power level of the order of tens to hundreds of kilowatts.
Claim 6
Dependent Claim
12 words
The method of claim 1, wherein said object is a superalloy part.
Claim 7
Dependent Claim
13 words
The method of claim 5, wherein said superalloy part is a turbine blade.
Claim 8
Dependent Claim
83 words
A high intensity x-ray source for inspecting an object to detect a microflaw therein comprising a source for producing an electron beam, a rotating anode, means for focusing the electron beam onto the rotating anode with a spot size of the order of or less than the size of the microflaw, means for operating the anode and the electron beam source at potential difference of the order of 400-500 kV, and means for applying a coolant to the anode to remove heat therefrom.
Claim 9
Dependent Claim
83 words
A high intensity x-ray source for inspecting an object to detect a microflaw therein comprising a source for producing an electron beam, a rotating anode, means for focusing the electron beam onto the rotating anode with a spot size of the order of or less than the size of the microflaw, means for operating the anode and the electron beam source at potential difference of the order of 400-500 kV, and means for applying a coolant to the anode to remove heat therefrom.
Claim 10
Dependent Claim
48 words
The x-ray source of claim 7, wherein the electron beam source, the anode, and the focusing means are disposed within an enclosure which is adapted to be pumped to provide a vacuum therein and which is constructed to afford access to the electron beam source and the anode.
Claim 11
Dependent Claim
17 words
The x-ray source of claim 7, wherein said spot size is of the order of 2-10 mils.
Claim 12
Dependent Claim
13 words
The x-ray source of claim 7, wherein said coolant comprises a dielectric liquid.
Claim 13
Dependent Claim
24 words
The x-ray source of claim 7, wherein said anode is of tungsten and is rotated at a rate of the order of 16,000 cm/sec.
Claim 14
Dependent Claim
33 words
The x-ray source of claim 7, wherein the electron beam source produces a beam current such that the power incident on the anode is in the range of tens to hundreds of kilowatts.
Claim 15
Dependent Claim
21 words
The x-ray source of claim 7, wherein the beam current is such as to maximize the intensity of the x-ray source.
Claim 16
Dependent Claim
26 words
The x-ray source of claim 7, wherein the electron beam source comprises a Pierce-type electron gun having a beam compression ratio of the order of 100.
Claim 17
Dependent Claim
28 words
The x-ray source of claim 14, wherein the electron beam source has a thermionic cathode of a material selected from the group consisting of oxides, carbides and metals.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-08-18 | 1990-02-17 | 1990-08-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-08-18 | 1994-02-17 | 1994-08-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-08-18 | 1998-02-17 | 1998-08-19 | $7700.00 | Window Closed / Lapsed |