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US4600463A Expired / Lapsed US ⏱️ 0.0 years remaining

Treatment basin for semiconductor material

Assignee: Individual
•
Filing: 1985-01-04
•
Granted: 1986-07-15
•
Expires: 2005-01-04
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Abstract

Abstract The present invention relates a basin for applying a treatment such as development, etching or plating to one of surfaces of a semiconductor material. A treatment liquid is introduced through a passage formed in a lower part of the basin. Then, the treatment liquid is blown upwardly against the semiconductor material held spacedly above a top portion of the basin. The top portion of the basin centrally defines a hole permitting the passage of the treatment liquid therethrough and is formed into a table surface having an area wider than the one surface of the semiconductor material. At the outer circumferential edge of the semiconductor material, the treatment liquid is allowed to flow in a laminar state outwardly along the table surface. Thus, the treatment liquid is prevented from running astray onto the rear surface of the semiconductor material. Since the treatment liquid is caused to flow between the semiconductor material and the table surface, good contact is maintained between the semiconductor material and the treatment liquid and the semiconductor can be kept free from air and gas bubbles which would otherwise stick on the semiconductor surface.

Inventors

  • 👤 Seiichiro Aigo

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 10:13
CPC Classifications
C; C25; C25D; C25D5/00; C25D5/02; C25D5/026; C23; C23F; C23F1/00; C23F1/08; G; G03; G03F; G03F7/00; G03F7/26; G03F7/30; G03F7/3021

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 122 words
In a basin for applying a treatment such as development, etching or plating to one of the surfaces of a semiconductor material, which is supported spacedly above a top portion of the basin with one surface facing downwardly, by introducing a treatment liquid through a passage formed in a lower part of the basin and then blowing the treatment liquid upwardly against the one surface of the semiconductor material, the improvement comprising the basin having a top portion, the inner surface of which frustoconically tapers upwardly and inwardly to a centrally defined hole permitting passage of the treatment liquid therethrough and the outer surface of which defines a table surface wider than the area of the one surface of the semiconductor material.
Claim 2
Dependent Claim 122 words
In a basin for applying a treatment such as development, etching or plating to one of the surfaces of a semiconductor material, which is supported spacedly above a top portion of the basin with one surface facing downwardly, by introducing a treatment liquid through a passage formed in a lower part of the basin and then blowing the treatment liquid upwardly against the one surface of the semiconductor material, the improvement comprising the basin having a top portion, the inner surface of which frustoconically tapers upwardly and inwardly to a centrally defined hole permitting passage of the treatment liquid therethrough and the outer surface of which defines a table surface wider than the area of the one surface of the semiconductor material.
Claim 3
Dependent Claim 27 words
A basin as claimed in claim 1, wherein the table surface is an annular surface wider than the area of the one surface of the semiconductor material.
Claim 4
Dependent Claim 61 words
A basin as claimed in claim 1, wherein the basin is additionally equipped with a container surrounding the basin so as to catch the treatment liquid flown down from the table surface, and the container has an annular lid extending inwardly from the inner circumferential wall of the container, whereby to isolate vapor of the thus-caught treatment liquid from the air.
Claim 5
Dependent Claim 48 words
A basin as claimed in claim 1, wherein the passage is closed at the upper end thereof, and the wall, which defines the passage, defines at least one opening in the vicinity of the upper end thereof so that the treatment liquid is blown out through the opening.

References Cited (Backward Citations)

US2523018A Cited
US4021279A Cited
US4165252A Cited
US4350562A Cited
US4339297A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1989-07-14 1990-01-13 1990-07-15 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1993-07-14 1994-01-13 1994-07-15 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1997-07-14 1998-01-13 1998-07-15 $7700.00 Window Closed / Lapsed

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