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US4593304A Expired / Lapsed US ⏱️ 0.0 years remaining

Heterostructure interdigital high speed photoconductive detector

Assignee: The AT&T MVPD Group LLC
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Filing: 1984-02-27
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Granted: 1986-06-03
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Expires: 2004-02-27
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Abstract

Abstract A high speed photoconductive detector is disclosed which comprises two interdigital electrically conducting electrodes formed on a photoconductive layer. The device speed and sensitivity are improved by using a double-heterostructure configuration comprising an active layer formed on an isolation layer in turn formed on a supporting substrate. A passivation layer is formed on the active layer. This configuration confines the generated carriers to the active layer. Consequently, current will be induced under optical illumination due to photo-carrier generation. This interdigitated geometry allows for a large device cross-section and small carrier transit distance.

Inventors

  • 👤 Charles W. Slayman
  • 👤 Luis Figueroa

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 05:03
CPC Classifications
H; H10; H10F; H10F77/00; H10F77/20; H10F30/00; H10F30/10; H10F77/30; H10F77/306

Claims Analysis

Total Claims: 14
Claim 1
Independent Claim 120 words
A high speed conductive detector responsive to incident optical radiation comprising: (a) a substrate of semiconductor material; (b) an isolation layer of semiconductor material formed on at least a portion of said substrate; (c) an active layer of semiconductor material having a bandgap less than that of said semiconductor material comprising said isolation layer and supported on said isolation layer; and (d) a pair of interdigited electrically conducting electrodes formed on a portion of the surface of said active layer so as to be in non-blocking contact therewith, at least one of said electrodes forming a Schottky-barrier contact with said active layer, the thickness of said active layer being approximately equal to or less than the spacing between said electrodes.
Claim 2
Dependent Claim 120 words
A high speed conductive detector responsive to incident optical radiation comprising: (a) a substrate of semiconductor material; (b) an isolation layer of semiconductor material formed on at least a portion of said substrate; (c) an active layer of semiconductor material having a bandgap less than that of said semiconductor material comprising said isolation layer and supported on said isolation layer; and (d) a pair of interdigited electrically conducting electrodes formed on a portion of the surface of said active layer so as to be in non-blocking contact therewith, at least one of said electrodes forming a Schottky-barrier contact with said active layer, the thickness of said active layer being approximately equal to or less than the spacing between said electrodes.
Claim 3
Dependent Claim 16 words
The detector of claim 1 further comprising means for applying a bias to said conducting electrodes.
Claim 4
Dependent Claim 12 words
The detector of claim 1 in which said substrate comprises semi-insulating material.
Claim 5
Dependent Claim 22 words
The detector of claim 1 in which said semiconductor material is selected from the group consisting of III-V and II-VI semiconductor material.
Claim 6
Dependent Claim 82 words
The detector of claim 4 comprising: (a) a substrate of III-V semi-insulating material; (b) an isolation layer of III-V material formed on at least a portion of said substrate; (c) an active layer of III-V material supported on said isolation layer; (d) a pair of interdigitated electrically conducting electrodes formed on a portion of the surface of said active layer; and (e) a passivation layer of III-V material formed on at least portions of said active layer exposed by said interdigitated electrodes.
Claim 7
Dependent Claim 105 words
The detector of claim 5 comprising: (a) a semi-insulating substrate of chromium-doped GaAs; (b) an isolation layer of undoped Al x Ga l-x As, where x ranges from about 0.37 to 0.85, ranging in thickness from about 1 to 10 μm; (c) an active layer of undoped GaAs, ranging in thickness from about 1.5 to 6 μm; (d) a pair of interdigitated electrically conducting electrodes formed on a portion of the surface of said active layer; and (e) a passivation layer of undoped Al y Ga l-y As, where y ranges from about 0.37 to 0.85, ranging in thickness from about 0.2 to 0.5 μm.
Claim 8
Dependent Claim 92 words
The detector of claim 5 comprising: (a) a semi-insulating substrate of iron-doped InP; (b) an isolation layer of undoped InP ranging in thickness from about 1 to 10 μm; (c) an active layer of undoped (In,Ga)As having a composition which is lattice-matched to the lattice of said isolation layer and ranging in thickness from about 1.5 to 6 μm; (d) a pair of interdigitated electrically conducting electrodes formed on a portion of said active layer; and (e) a passivation layer of undoped InP ranging in thickness from about 0.2 to 0.5 μm.
Claim 9
Dependent Claim 82 words
The detector of claim 4 comprising: (a) a substrate of II-VI semi-insulating material; (b) an isolation layer of II-VI material formed on at least a portion of said substrate; (c) an active layer of II-VI material supported on said isolation layer; (d) a pair of interdigitated electrically conducting electrodes formed on a portion of the surface of said active layer; and (e) a passivating layer of II-VI material formed on at least portions of said active layer exposed by said interdigitated electrodes.
Claim 10
Dependent Claim 63 words
The detector of claim 8 comprising: (a) a semi-insulating substrate of PbTe; (b) an isolation layer of undoped PbTe; (c) an active layer of undoped (Pb,Sn)Te having a composition which is lattice-matched to the lattice of said isolation layer; (d) a pair of interdigitated electrically conducting electrodes formed on a portion of said active layers; and (e) a passivation layer of undoped PbTe.
Claim 11
Dependent Claim 22 words
The detector of claim 1 in which the spacing between each finger of said interdigitated electrodes is less than about 5 μm.
Claim 12
Dependent Claim 15 words
The detector of claim 1 further comprising a microstrip transmission line connected to each electrode.
Claim 13
Dependent Claim 14 words
The detector of claim 1 in which said electrically conducting electrodes comprise a metal.
Claim 14
Dependent Claim 19 words
The detector of claim 12 in which said metal is selected from the group consisting of aluminum and gold.

References Cited (Backward Citations)

US3675026A Cited
US3700980A Cited
US3993506A Cited
US4021836A Cited
JPS5412261A Cited
US4213138A Cited
US4257055A Cited
US4346394A Cited
US4376285A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1989-06-02 1989-12-02 1990-06-03 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1993-06-02 1993-12-02 1994-06-03 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1997-06-02 1997-12-02 1998-06-03 $7700.00 Window Closed / Lapsed

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