US4588946A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for measuring current at a p-n junction
Assignee: Nokia Bell Labs
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Filing: 1983-12-30
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Granted: 1986-05-13
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Expires: 2003-12-30
Abstract
Abstract A method of mapping the current distribution of a p-n junction is described. The method uses measurements of the electron beam induced current.
Inventors
- 👤 Paul S. Lin
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 17:19
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/265; G01R31/2653
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
61 words
A method of measuring the current distribution at a p-n junction within a semiconductor device comprising the steps of: scanning a beam of radiation across the p-n junction; measuring the current produced by the absorption of said beam of radiation, I; determining the electrostatic potential difference across the junction; and using the Shockley relation to determine the device current density, J.
Claim 2
Independent Claim
61 words
A method of measuring the current distribution at a p-n junction within a semiconductor device comprising the steps of: scanning a beam of radiation across the p-n junction; measuring the current produced by the absorption of said beam of radiation, I; determining the electrostatic potential difference across the junction; and using the Shockley relation to determine the device current density, J.
Claim 3
Dependent Claim
15 words
A method as recited in claim 1 in which said p-n junction is forward biased.
Claim 4
Dependent Claim
17 words
A method as recited in claim 1 in which said beam of radiation comprises an electron beam.
Claim 5
Dependent Claim
24 words
A method as recited in claim 3 in which said device comprises a laser diode and said method further comprises ascertaining the leakage current.
Claim 6
Dependent Claim
15 words
A method as recited in claim 4 in which said p-n junction is forward biased.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-05-12 | 1989-11-11 | 1990-05-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-05-12 | 1993-11-11 | 1994-05-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-05-12 | 1997-11-11 | 1998-05-13 | $7700.00 | Window Closed / Lapsed |