US4588889A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Sweeping process for mass spectrometer having superimposed fields
Assignee: Jeol Ltd
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Filing: 1985-02-04
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Granted: 1986-05-13
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Expires: 2005-02-04
Abstract
Abstract A process of obtaining spectra of daughter ions which are produced by collision of sample ions with neutral molecules for dissociating the sample ions in a collision chamber disposed in an ion path to thereby provide a structural analysis of organic compounds. To carry out this process, a mass spectrometer is used which has mass spectrometric units located before and after the collision chamber. The spectrometric unit located behind the chamber has superimposed magnetic field B and electric field E perpendicular to the magnetic field. Daughter ions having a mass m x produced from parent ions having a mass m 0 inside the chamber are detected and measured by sweeping the voltage Vd x for producing the electric field or the intensity B x of the magnetic field singly or sweeping both in an interrelated manner so as to satisfy the relation ##EQU1## where V 00 is the voltage for producing the electric field used to detect the parent ions having infinitely large masses, B 0 is the intensity of the magnetic field when the parent ions are detected, and M 00 is the mass of the parent ions detected when the intensity of the electric field is zero.
Inventors
- 👤 Motohiro Naito
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 22:03
CPC Classifications
H; H01; H01J; H01J49/00; H01J49/26; H01J49/28; H01J49/32; H01J49/02; H01J49/022
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
101 words
A process for a mass spectrometer having superimposed magnetic field B and electric field E perpendicular to the magnetic field for detecting the mass m x of fragment species arising from parent ions having mass m 0 comprising sweeping the deflection conditions in such a way that voltage Vd x for producing the electric field and the intensity B x of the magnetic field at all times satisfy the relation ##EQU28## where V 00 , B 0 and M 00 are constants and f(m x /m 0 ) is a simple algebraic function of variables m x and m 0 .
Claim 2
Dependent Claim
101 words
A process for a mass spectrometer having superimposed magnetic field B and electric field E perpendicular to the magnetic field for detecting the mass m x of fragment species arising from parent ions having mass m 0 comprising sweeping the deflection conditions in such a way that voltage Vd x for producing the electric field and the intensity B x of the magnetic field at all times satisfy the relation ##EQU28## where V 00 , B 0 and M 00 are constants and f(m x /m 0 ) is a simple algebraic function of variables m x and m 0 .
Claim 3
Dependent Claim
128 words
A sweeping process for a mass spectrometer having superimposed magnetic field B and electric field E perpendicular to the magnetic field for detecting daughter ions having a mass m x arising from parent ions having a mass m 0 comprising sweeping the deflection condition in such a way that the voltage Vd x for producing the electric field and the intensity B x of the magnetic field at all times satisfy the relation ##EQU29## where V 00 is the voltage for producing the electric field used to detect ions having infinitely large masses, B 0 is the intensity of the magnetic field when the parent ions are detected, and M 00 is the mass of the parent ions detected when the intensity of the electric field is zero.
Claim 4
Dependent Claim
128 words
A sweeping process for a mass spectrometer having superimposed magnetic field B and electric field E perpendicular to the magnetic field for detecting daughter ions having a mass m x arising from parent ions having a mass m 0 comprising sweeping the deflection condition in such a way that the voltage Vd x for producing the electric field and the intensity B x of the magnetic field at all times satisfy the relation ##EQU29## where V 00 is the voltage for producing the electric field used to detect ions having infinitely large masses, B 0 is the intensity of the magnetic field when the parent ions are detected, and M 00 is the mass of the parent ions detected when the intensity of the electric field is zero.
Claim 5
Dependent Claim
133 words
A sweeping process for a mass spectrometer having superimposed magnetic field B and electric field E perpendicular to the magnetic field for determining the mass m y of all the parent ions producing daughter ions having a mass m 1 comprising sweeping the deflection conditions in such a way that the voltage Vd y for producing the electric field and the intensity B y of the magnetic field at all times satisfy the relation ##EQU30## where V 00 is the voltage for producing an electric field used to detect ions having infinitely large masses, M 00 is the mass of the parent ions detected when the intensity of the electric field is zero, and B 0 is the intensity of the magnetic field when the parent ions are detected under such a condition.
Claim 6
Dependent Claim
133 words
A sweeping process for a mass spectrometer having superimposed magnetic field B and electric field E perpendicular to the magnetic field for determining the mass m y of all the parent ions producing daughter ions having a mass m 1 comprising sweeping the deflection conditions in such a way that the voltage Vd y for producing the electric field and the intensity B y of the magnetic field at all times satisfy the relation ##EQU30## where V 00 is the voltage for producing an electric field used to detect ions having infinitely large masses, M 00 is the mass of the parent ions detected when the intensity of the electric field is zero, and B 0 is the intensity of the magnetic field when the parent ions are detected under such a condition.
Claim 7
Dependent Claim
137 words
A sweeping process for a mass spectrometer having superimposed magnetic field B and electric field E perpendicular to the magnetic field for determining the mass m 0 n of all the parent ions producing neutral particles having a mass m n by cleavage comprising sweep in the deflection condition in such a way that the voltage Vd n for producing the electric field and the intensity B n of the magnetic field at all times satisfy the relation ##EQU31## where V 00 is the voltage for producing the electric field used to detect ions having infinitely large masses, M 00 is the mass of the parent ions detected when the intensity of the electric field is zero, and B 0 is the intensity of the magnetic field when the parent ions are detected under such a condition.
Claim 8
Dependent Claim
137 words
A sweeping process for a mass spectrometer having superimposed magnetic field B and electric field E perpendicular to the magnetic field for determining the mass m 0 n of all the parent ions producing neutral particles having a mass m n by cleavage comprising sweep in the deflection condition in such a way that the voltage Vd n for producing the electric field and the intensity B n of the magnetic field at all times satisfy the relation ##EQU31## where V 00 is the voltage for producing the electric field used to detect ions having infinitely large masses, M 00 is the mass of the parent ions detected when the intensity of the electric field is zero, and B 0 is the intensity of the magnetic field when the parent ions are detected under such a condition.
References Cited (Backward Citations)
US3984682A
Cited
US4521687A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-05-12 | 1989-11-11 | 1990-05-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-05-12 | 1993-11-11 | 1994-05-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-05-12 | 1997-11-11 | 1998-05-13 | $7700.00 | Window Closed / Lapsed |