US4583038A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Electrical testing
Assignee: STC PLC
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Filing: 1983-03-01
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Granted: 1986-04-15
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Expires: 2003-03-01
Abstract
Abstract Insulation flaws in electrical components are detected by measurement of electrical leakage before and after immersion in a mobile ionizing solvent, e.g. a lower alkyl alcohol. A significant increase in leakage is indicative of a flaw, e.g. a crack in the insulation.
Inventors
- 👤 Robert C. Chittick
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 03:52
CPC Classifications
G; G01; G01N; G01N27/00; G01N27/02; G01N27/04; G01N27/20; G01R; G01R31/00; G01R31/12; G01R31/18; H; H01; H01G; H01G4/00; H01G4/30; H01G4/306
Claims Analysis
Total Claims: 18
Claim 1
Independent Claim
101 words
A non-destructive process for testing for a dielectric structural flaw in an electrical component by measurement of an electrical leakage associated with an electrical condition of the dielectric, the process including contacting the component with a volatile mobile ionising solvent which solvent penetrates any flaw in the component, removing the component from contact with the solvent leaving residual solvent trapped in the flaw, measuring the electrical leakage of the dielectric of the treated component, and comparing the measured leakage with a reference value corresponding to an untreated component to provide an indication of the presence or absence of a structural flaw.
Claim 2
Dependent Claim
101 words
A non-destructive process for testing for a dielectric structural flaw in an electrical component by measurement of an electrical leakage associated with an electrical condition of the dielectric, the process including contacting the component with a volatile mobile ionising solvent which solvent penetrates any flaw in the component, removing the component from contact with the solvent leaving residual solvent trapped in the flaw, measuring the electrical leakage of the dielectric of the treated component, and comparing the measured leakage with a reference value corresponding to an untreated component to provide an indication of the presence or absence of a structural flaw.
Claim 3
Dependent Claim
15 words
A process is claimed in claim 1, wherein the liquid is a lower aliphatic alcohol.
Claim 4
Dependent Claim
23 words
A process is claimed in claim 2, wherein the liquid is selected from the group comprising methanol, ethanol, isopropyl alcohol and mixtures thereof.
Claim 5
Dependent Claim
18 words
A process as claimed in claim 1, wherein the component is a ceramic package for an integrated circuit.
Claim 6
Dependent Claim
15 words
A process as claimed in claim 1, wherein the component is a ceramic circuit substrate.
Claim 7
Independent Claim
86 words
An apparatus for non-destructive measuring and testing for structural flaws in a dielectric associated with an electrical component, the apparatus including means for applying a mobile ionising solvent to the component so as to penetrate any discontinuity in the dielectric, means for measuring the resistivity of an electrical leakage path associated with an electrical condition of the solvent treated component, and a comparator whereby the measured resistivity is compared with a reference value to provide an indication of the presence or absence of a structural flaw.
Claim 8
Independent Claim
86 words
An apparatus for non-destructive measuring and testing for structural flaws in a dielectric associated with an electrical component, the apparatus including means for applying a mobile ionising solvent to the component so as to penetrate any discontinuity in the dielectric, means for measuring the resistivity of an electrical leakage path associated with an electrical condition of the solvent treated component, and a comparator whereby the measured resistivity is compared with a reference value to provide an indication of the presence or absence of a structural flaw.
Claim 9
Dependent Claim
65 words
A non-destructive process for testing for a dielectric structural flaw in a capacitor, the process including contacting the capacitor with a mobile ionising solvent, removing the capacitor from contact with the solvent leaving residual solvent trapped in the flaw, measuring an electrical leakage of the capacitor, and comparing the leakage with a reference value to provide an indication of the integrity of the capacitor dielectric.
Claim 10
Dependent Claim
65 words
A non-destructive process for testing for a dielectric structural flaw in a capacitor, the process including contacting the capacitor with a mobile ionising solvent, removing the capacitor from contact with the solvent leaving residual solvent trapped in the flaw, measuring an electrical leakage of the capacitor, and comparing the leakage with a reference value to provide an indication of the integrity of the capacitor dielectric.
Claim 11
Dependent Claim
15 words
A process as claimed in claim 7, wherein the capacitor is a multilayer ceramic capacitor.
Claim 12
Dependent Claim
15 words
A process as claimed in claim 7, wherein the capacitor is a multilayer mica capacitor.
Claim 13
Dependent Claim
12 words
A process as claimed in claim 8, wherein the solvent is methanol.
Claim 14
Dependent Claim
23 words
A process as claimed in claim 8, wherein the solvent is selected from the group comprising isopropyl alcohol, athyl alcohol and mixtures thereof.
Claim 15
Dependent Claim
13 words
A process as claimed in claim 10, wherein said solvent contains an ionogen.
Claim 16
Dependent Claim
12 words
A process as claimed in claim 12, wherein the ionogen is triethylamine.
Claim 17
Dependent Claim
83 words
A non-destructive process for testing for dielectric and insulation flaws in a capacitor comprising a monolithic body to which encapsulation is applied, the process including contacting the capacitor both before and after encapsulation with a mobile ionising solvent, removing the capacitor from contact with the solvent leaving residual solvent trapped in the flaw, measuring an electrical leakage of the capacitor, and comparing this leakage with a reference value to provide an indication of the integrity of the capacitor dielectric and of the encapsulation.
Claim 18
Dependent Claim
83 words
A non-destructive process for testing for dielectric and insulation flaws in a capacitor comprising a monolithic body to which encapsulation is applied, the process including contacting the capacitor both before and after encapsulation with a mobile ionising solvent, removing the capacitor from contact with the solvent leaving residual solvent trapped in the flaw, measuring an electrical leakage of the capacitor, and comparing this leakage with a reference value to provide an indication of the integrity of the capacitor dielectric and of the encapsulation.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-04-14 | 1989-10-14 | 1990-04-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-04-14 | 1993-10-14 | 1994-04-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-04-14 | 1997-10-14 | 1998-04-15 | $7700.00 | Window Closed / Lapsed |