US4581673A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Apparatus and method for protection and recovery from latch-up of integrated circuits
Assignee: General Dynamics Mission Systems Inc
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Filing: 1984-02-02
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Granted: 1986-04-08
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Expires: 2004-02-02
Abstract
Abstract A method and apparatus for preventing latch-up caused by spurious signals reaching the input and output ports of an IC. The apparatus consists of a current regulating diode that limits the current entering the IC to a level below the latch-up holding level preventing the IC from being latched up. The method and apparatus further allows the recovery of an IC that has been latched-up through external transient ionizing radiation by limiting the current through the IC below the latch-up holding current level.
Inventors
- 👤 Tet C. Pang
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 16:56
CPC Classifications
H; H03; H03K; H03K19/00; H03K19/003; H03K19/00346; H03K19/0033
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
150 words
Latch-up prevention and recovery apparatus having a power supply node and a circuit node, said apparatus comprising: a voltage source being coupled to said power supply node; an IC device having a power lead coupled to said circuit node of said apparatus; latch-up prevention and recovery means for limiting the current flow through said IC device from said voltage source resulting from spurious signals or transient radiation, said latch-up prevention and recovery means having a first lead and a second lead, said first lead being coupled to said power supply node; and burn-out prevention means for preventing said IC from being burned-out from spurious signals or transient radiation, said burn-out prevention means having a first lead and a second lead, said first lead being coupled to said second lead of said latch-up prevention and recovery means and said second lead being coupled to said power lead of said IC device.
Claim 2
Dependent Claim
150 words
Latch-up prevention and recovery apparatus having a power supply node and a circuit node, said apparatus comprising: a voltage source being coupled to said power supply node; an IC device having a power lead coupled to said circuit node of said apparatus; latch-up prevention and recovery means for limiting the current flow through said IC device from said voltage source resulting from spurious signals or transient radiation, said latch-up prevention and recovery means having a first lead and a second lead, said first lead being coupled to said power supply node; and burn-out prevention means for preventing said IC from being burned-out from spurious signals or transient radiation, said burn-out prevention means having a first lead and a second lead, said first lead being coupled to said second lead of said latch-up prevention and recovery means and said second lead being coupled to said power lead of said IC device.
Claim 3
Dependent Claim
13 words
The apparatus of claim 1 wherein said burn-out prevention means includes a resistor.
Claim 4
Dependent Claim
48 words
The apparatus of claim 2 wherein said latch-up prevention and recovery means includes a current regulator diode having a first lead and a second lead, said first lead being coupled to said first lead of said resistor and said second lead being coupled to said power supply node.
Claim 5
Independent Claim
147 words
A method of recovering from latch-up of an IC device when said IC device is exposed to transient ionizing radiation, said method comprising the steps of: connecting a diode and resistor in series with a power supply node to said IC device; exposing said IC device to said transient radiation causing ionization in said IC device and said diode; creating an increased number of carriers in said IC device and said diode; increasing a current level passing through said IC device and said diode above a latch-up holding level causing said IC device to latch-up; limiting an amount of voltage developed across said IC during ionization; recombining said increased number of carriers in said diode; decreasing said current level through said diode and said IC device below said latch-up holding level; and limiting an amount of current flow through said IC to below a latch-up holding level.
Claim 6
Independent Claim
147 words
A method of recovering from latch-up of an IC device when said IC device is exposed to transient ionizing radiation, said method comprising the steps of: connecting a diode and resistor in series with a power supply node to said IC device; exposing said IC device to said transient radiation causing ionization in said IC device and said diode; creating an increased number of carriers in said IC device and said diode; increasing a current level passing through said IC device and said diode above a latch-up holding level causing said IC device to latch-up; limiting an amount of voltage developed across said IC during ionization; recombining said increased number of carriers in said diode; decreasing said current level through said diode and said IC device below said latch-up holding level; and limiting an amount of current flow through said IC to below a latch-up holding level.
Claim 7
Dependent Claim
20 words
The method of claim 4 further comprising using a current regulator diode as the diode in series with the resistor.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-04-07 | 1989-10-07 | 1990-04-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-04-07 | 1993-10-07 | 1994-04-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-04-07 | 1997-10-07 | 1998-04-08 | $7700.00 | Window Closed / Lapsed |