Die-bonding electroconductive paste

Claim 2

A die bonding electroconductive paste containing at least one element having the same valence as the valence of a semiconductor element to be die-bonded or a compound of said element and a reducing substance selected from the group consisting of metal hydrides, metal carbides, grignard reagents, fatty acids of 12 to 22 carbon atoms, zinc and aluminum lower alkyls of 1-3 carbon atoms, metal salts of naphthenic, acetic and propionic acids, and hydrazine, said paste permitting ohmic contact to be effected between said paste and said semiconductor at a temperature of not less than 100° C.

Claim 3

An electroconductive paste according to claim 1, wherein said electroconductive paste comprises 5 to 90% by weight of said element possessing the same valence as the valence of said semiconductor element or a compound of said element (Calulated as the element), 0.5 to 50% by weight of said reducing substance, 0 to 80% by weight of a finely powdered electroconductive substance, 3 to 45% by weight of a binder, and 0 to 30% by weight of a solvent.

Claim 4

An electroconductive paste according to claim 2, wherein said semiconductor element is selected from the group consisting of the elements of Group IV, the elements of Groups III and V, and the elements of Groups IIA or IIB and VI.

Claim 5

An electroconductive paste according to claim 2, wherein said fine electroconductive powder is at least one metal selected from the group consisting of gold, silver, copper, nickel, rhodium, palladium and silver-palladium.

Claim 6

An electroconductive paste according to claim 2, wherein said fine electroconductive powder possesses an average particle diameter of 1 to 20 μm.

Claim 7

An electroconductive paste according to claim 2, wherein said binder is an epoxy resin.

Claim 8

An electroconductive paste according to claim 6, wherein said solvent is a glycol ether.

Claim 9

An electroconductive paste according to claim 2, wherein said element possessing the same valence as the valence of the semiconductor element or the compound of said element possesses an average particle diameter of 0.5 to 50 μm.

Claim 10

An electroconductive paste according to claim 3, wherein said semiconductor element is an element of Group IV and said element having the same valence as the valence of said semiconductor element is at least one tetravalent element selected from the group consisting of silicon, germanium, carbon, titanium, zirconium, tin, hafnium and lead.

Claim 11

An electroconductive paste according to claim 9, wherein said semiconductor element is silicon or germanium and said element having the same valence as the valence of said semiconductor element is at least one tetravalent element selected from the group consisting of silicon, carbon, titanium and zirconium.

Claim 12

An electroconductive paste according to claim 3, wherein said semiconductor element is an element of Groups III and V and said element having the same valence as the valence of said semiconductor element is a mixture of at least one trivalent element selected from the group consisting of boron, aluminum, scandium, gallium, yttrium, indium, lanthanides and actinides with at least one pentavalent element selected from the group consisting of nitrogen, phosphoric, vanadium, arsenic, niobium, antimony, tantalum and bismuth.

Claim 13

An electroconductive paste according to claim 11, wherein said semiconductor element is selected from the group consisting of potassium-phosphorus, gallium-arsenic, gallium-arsenic-phosphorus, gallium-aluminum-arsenic and gallium-aluminum-arsenic-phosphorus and said element having the same valence as the valence of said semiconductor element is mixture of at least one trivalent element selected from the group consisting of gallium, aluminum, indium and yttrium with at least one pentavalent element selected from the group consisting of arsenic, phosphorus, vanadium, tantalum and niobium.

Claim 14

An electroconductive paste according to claim 3, wherein said semiconductor element is an element of Groups IIA or II and VI and said element having the same valence as the valence of said semiconductor element is a mixture of at least one divalent element selected form the group consisting of beryllium, magnesium, zinc, cadmium and mercury with at least one hexavalent element selected from the group consisting of chromium, molybdenum, tungsten, oxygen, sulfur, selenium and tellurium.

Claim 15

An electroconductive paste according to claim 13, wherein said semiconductor element is one element selected from the group consisting of zinc-sulfur, zic-selenium, zinc-tellurium, mercury-cadmium-tellurium and said element having the same valence as the valence of said semiconductor element is a mixture of at least one divalent element selected from the group consisting of zinc and cadmium with at least one element selected from the group consisting of selenium and tellurium.

Claim 16

An electroconductive paste according to claim 1, wherein said electroconductive paste comprises 20 to 60% by weight of said element having the same valence as the valence of said semiconductor element or said compound of said element, 1 to 10% by weight of said reducing substance, 25 to 60% by weight of said fine electroconductive powder, 10 to 30% by weight of said binder and 3 to 20% by weight of said solvent.