Apparatus for calculating pattern dissimilarity between patterns

Claim 1

An apparatus for determining a dissimilarity between a first pattern and a second pattern by adopting a distance between a line segment connecting two adjacent vectors of said first pattern and one vector of said second pattern, each of said first and second patterns being given in form of a time sequence of vectors, said apparatus comprising: first memory means for storing said first pattern, including said two adjacent vectors; second memory means for storing said second pattern; and calculating means, responsive to said first and second patterns stored in said first and second memory means, respectively, for calculating said distance, said calculating means comprising; first means for calculating a first distance D between said two adjacent vectors in a first time sequence of vectors, said first time sequence corresponding to said first pattern; second means for calculating second distances X and Y, respectively, between one of said two adjacent vectors in said first pattern and said one vector in a second time sequence of vectors, and between the other of said two adjacent vectors in said first pattern and said one vector in a second time sequence of vetors, said second time sequence correponding to said second pattern; third means for calculating said distance between said line segment connecting two adjacent vectors of said first pattern and said one vector of said second pattern by calculating Z(=XY-1/4(X+Y-D) 2 )/D) in response to said first distance and said second distances to thereby determine a dissimilarity between said first and second patterns; and means for selecting one of said distances X, Y and Z, wherein said selecting means selects said distance X when D=0, said distance Z when D≠0 and -D≦X-Y≦D, said distance X when D≠0 and X-Y<-D, and said distance Y when D≠0 and X-Y>D.

Claim 2

An apparatus for determining a dissimilarity between a first pattern and a second pattern by adopting a distance between a line segment connecting two adjacent vectors of said first pattern and one vector of said second pattern, each of said first and second patterns being given in form of a time sequence of vectors, said apparatus comprising: first memory means for storing said first pattern, including said two adjacent vectors; second memory means for storing said second pattern; and calculating means, responsive to said first and second patterns stored in said first and second memory means, respectively, for calculating said distance, said calculating means comprising; first means for calculating a first distance D between said two adjacent vectors in a first time sequence of vectors, said first time sequence corresponding to said first pattern; second means for calculating second distances X and Y, respectively, between one of said two adjacent vectors in said first pattern and said one vector in a second time sequence of vectors, and between the other of said two adjacent vectors in said first pattern and said one vector in a second time sequence of vetors, said second time sequence correponding to said second pattern; third means for calculating said distance between said line segment connecting two adjacent vectors of said first pattern and said one vector of said second pattern by calculating Z(=XY-1/4(X+Y-D) 2 )/D) in response to said first distance and said second distances to thereby determine a dissimilarity between said first and second patterns; and means for selecting one of said distances X, Y and Z, wherein said selecting means selects said distance X when D=0, said distance Z when D≠0 and -D≦X-Y≦D, said distance X when D≠0 and X-Y<-D, and said distance Y when D≠0 and X-Y>D.

Claim 3

An apparatus for determining a dissimilarity measure between a first pattern A and a second pattern B by adopting a distance between a line segment connecting two adjacent vectors of said first pattern A and one vector of said second pattern B, said first pattern A being given in the form of a first time sequence of vectors {a 1 , a 2 , - - - , a i , - - - , a I } and said second pattern B being given in the form of a second time sequence of vectors {b 1 , b 2 , - - - , b j , - - - b j } said apparatus comprising: first memory means for storing said first pattern, including said two adjacent vectors; second memory means for storing said second pattern; and calculating means, responsive to said first and second patterns stored in said first and second memory means, respectively, for calculating said distance, said calculating means comprising; first means for calculating a distance D(=d(a i+1 , a i )) between two adjacent vectors a i+1 and a i of said first time sequence in a vector space; second means for calculating a distance X(=d(a i+1 , b j )) between said vector a i+1 of said first time sequence and one vector b j of said second time sequence in the vector space, and for calculating a distance Y(=d(a i , b j )) between said vector a i of said first time sequence and said one vector b j of said second time sequence; third means for calculating said distance between said line segment connecting said two adjacent vectors of said first pattern A and said one vector of said second pattern B by calculating Z(=(XY-1/4(X+Y-D) 2 /D) in response to said distances D, X and Y to thereby determine a dissimilarity between said first and second patterns; and means for selecting one of said distances X, Y and Z, wherein said selecting means selects said distance X when D=0, said distance Z when D≠0 and -D≦X-Y≦D, said distance X when D≠0 and X-Y<-D, and said distance Y when D≠0 and X-Y>D.

Claim 4

An apparatus for determining a dissimilarity measure between a first pattern A and a second pattern B by adopting a distance between a line segment connecting two adjacent vectors of said first pattern A and one vector of said second pattern B, said first pattern A being given in the form of a first time sequence of vectors {a 1 , a 2 , - - - , a i , - - - , a I } and said second pattern B being given in the form of a second time sequence of vectors {b 1 , b 2 , - - - , b j , - - - b j } said apparatus comprising: first memory means for storing said first pattern, including said two adjacent vectors; second memory means for storing said second pattern; and calculating means, responsive to said first and second patterns stored in said first and second memory means, respectively, for calculating said distance, said calculating means comprising; first means for calculating a distance D(=d(a i+1 , a i )) between two adjacent vectors a i+1 and a i of said first time sequence in a vector space; second means for calculating a distance X(=d(a i+1 , b j )) between said vector a i+1 of said first time sequence and one vector b j of said second time sequence in the vector space, and for calculating a distance Y(=d(a i , b j )) between said vector a i of said first time sequence and said one vector b j of said second time sequence; third means for calculating said distance between said line segment connecting said two adjacent vectors of said first pattern A and said one vector of said second pattern B by calculating Z(=(XY-1/4(X+Y-D) 2 /D) in response to said distances D, X and Y to thereby determine a dissimilarity between said first and second patterns; and means for selecting one of said distances X, Y and Z, wherein said selecting means selects said distance X when D=0, said distance Z when D≠0 and -D≦X-Y≦D, said distance X when D≠0 and X-Y<-D, and said distance Y when D≠0 and X-Y>D.