US4560275A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Portable instant display and analysis reflectance spectrometer
Assignee: California Institute of Technology
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Filing: 1982-09-29
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Granted: 1985-12-24
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Expires: 2002-09-29
Abstract
Abstract A portable analysis spectrometer (10) for field mineral identification is coupled to a microprocessor (11) and memory (12) through a bus (13) and A/D converter (14) to display (16) a spectrum of reflected radiation in a band selected by an adjustable band spectrometer (20) and filter (23). A detector array (21) provides output signals at spaced frequencies within the selected spectrometer band which are simultaneously converted to digital form for display. The spectrum displayed is compared with a collection of spectra for known minerals. That collection is stored in memory and selectively displayed with the measured spectrum, or stored in a separate portfolio. In either case, visual comparison is made. Alternatively, the microprocessor may use an algorithm to make the comparisons in search for the best match of the measured spectrum with one of the stored spectra to identify the mineral in the target area.
Inventors
- 👤 Alexander F. H. Goetz
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 15:57
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/17; G01N21/25; G01N21/31; G01N21/314; G01J; G01J3/00; G01J3/02; G01J3/0205; G01J3/0232; G01J3/0272; G01J3/0286; G01J3/0294; G01J3/04; G01J3/28; G01J3/30; G01J3/36; G01J3/12; G01J2003/1213; G01J2003/1217; G01J2003/1226; G01J2003/123; G01J2003/283; G01J2003/2833; G01J3/42; G01J2003/425; G01J3/2803
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
163 words
A method for providing field identification of particular reflecting materials in mineral formations by identification of a high resolution reflectance spectrum in a selected wavelength section using a spectrometer and an array of detectors for measuring reflectance in narrow contiguous intervals in order to provide a continuous spectrum measurement over the selected section, each selected section being chosen for a particular spectral characteristic of a material of interest, comprising the steps of storing characteristics spectra over selected wavelength sections for each of a group of particular reflecting materials, selecting a wavelength section of reflectance to be analyzed in the field by measurement of light at different wavelengths within said section using said spectrometer and array of detectors thereby to obtain a reflectance spectrum, and comparing said reflectance spectrum with individual ones of said stored characteristic spectra to determine which best matches said reflectance spectrum, thus identifying a particular material in said mineral formation giving rise to the reflectance spectrum in a selected section.
Claim 2
Independent Claim
163 words
A method for providing field identification of particular reflecting materials in mineral formations by identification of a high resolution reflectance spectrum in a selected wavelength section using a spectrometer and an array of detectors for measuring reflectance in narrow contiguous intervals in order to provide a continuous spectrum measurement over the selected section, each selected section being chosen for a particular spectral characteristic of a material of interest, comprising the steps of storing characteristics spectra over selected wavelength sections for each of a group of particular reflecting materials, selecting a wavelength section of reflectance to be analyzed in the field by measurement of light at different wavelengths within said section using said spectrometer and array of detectors thereby to obtain a reflectance spectrum, and comparing said reflectance spectrum with individual ones of said stored characteristic spectra to determine which best matches said reflectance spectrum, thus identifying a particular material in said mineral formation giving rise to the reflectance spectrum in a selected section.
Claim 3
Dependent Claim
35 words
A method as defined in claim 1 wherein the intensity of reflected light at each of different wavelengths within said selected section measured by said array of detectors is determined simultaneously from said reflectance spectrum.
Claim 4
Dependent Claim
76 words
A method as defined in claim 2 using a programmed data processing system comprising a microprocessor, a memory and means for displaying data stored in said memory under control of said microprocessor, said data processor including a control panel to allow an operator to direct operation of said data processing system, wherein said reflectance spectrum is stored in said memory for display by said means for display under control of said operator via said control panel.
Claim 5
Dependent Claim
27 words
A method as defined in claim 3 wherein said stored spectra are stored in said memory and displayed individually with said stored reflectance spectrum for visual comparison.
Claim 6
Dependent Claim
82 words
A method as defined in claim 2 using a programmed data processing system comprising a microprocessor, a memory and control panel to allow an operator to direct operation of said data processing system, wherein said reflectance spectrum and said stored spectra are stored in said memory for comparison of said reflectance spectrum with each of said stored spectra for identification of best match under control of said operator through said control panel, thereby to identify a particular material in said mineral formation.
Claim 7
Dependent Claim
161 words
Apparatus for providing field identification of particular reflecting materials in minerals formations by identification of reflectance spectrum in a selected wavelength section using a spectrometer meter and an array of detectors, each section being chosen for a particular spectral characteristic of a material of interest selected from a group for which reflectance spectra are stored for comparison, comprising means for selecting from predetermined wavelength sections a series of contiguous narrow wavelength intervals of reflectance to be analyzed by measurement of light at said series of contiguous narrow wavelength intervals within said section using said spectrometer and array of detectors, means for simultaneously measuring reflectance detected by each detector of said array thereby to obtain a high resolution reflectance spectrum, and means for comparing said reflectance spectrum with individual ones of said stored spectra to determine which best matches said reflectance spectrum, thus identifying a particular material in said mineral formation giving rise to the reflectance measured at a selected section reflectance.
Claim 8
Dependent Claim
161 words
Apparatus for providing field identification of particular reflecting materials in minerals formations by identification of reflectance spectrum in a selected wavelength section using a spectrometer meter and an array of detectors, each section being chosen for a particular spectral characteristic of a material of interest selected from a group for which reflectance spectra are stored for comparison, comprising means for selecting from predetermined wavelength sections a series of contiguous narrow wavelength intervals of reflectance to be analyzed by measurement of light at said series of contiguous narrow wavelength intervals within said section using said spectrometer and array of detectors, means for simultaneously measuring reflectance detected by each detector of said array thereby to obtain a high resolution reflectance spectrum, and means for comparing said reflectance spectrum with individual ones of said stored spectra to determine which best matches said reflectance spectrum, thus identifying a particular material in said mineral formation giving rise to the reflectance measured at a selected section reflectance.
Claim 9
Dependent Claim
21 words
Apparatus as defined in claim 6 including means for storing said reflectance spectrum, and means for displaying said stored reflectance spectrum.
Claim 10
Dependent Claim
23 words
Apparatus as defined in claim 7 wherein said stored reflectance spectra are stored in a portfolio for visual comparison with a displayed spectrum.
Claim 11
Dependent Claim
49 words
Apparatus as defined in claim 7 including a programmed data processing system comprising a microprocessor, and said means for storing said reflectance spectrum also stores said stored reflectance spectrum, wherein said stored spectra are taken from said memory for display individually with said stored reflectance spectrum for visual comparison.
Claim 12
Dependent Claim
74 words
Apparatus as defined in claim 9 further including a control panel to allow an operator to direct operation of said data processing system, whereby said reflectance spectrum and said stored spectra are read from said memory for visual comparison of said reflectance spectrum with each of said stored spectra individually for identification of best match under control of said operator through said control panel, thereby to identify a particular material in said mineral formation.
Claim 13
Dependent Claim
20 words
Apparatus as defined in claim 6, 7, 8 or 9 wherein said spectrometer is adjustable for said wavelength band selected.
Claim 14
Dependent Claim
29 words
Apparatus as defined in claim 11, including an adjustable filter in front of said spectrometer, said filter being adjusted for a section which includes said said predetermined wavelength sections.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1988-12-23 | 1989-06-24 | 1989-12-24 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1992-12-23 | 1993-06-24 | 1993-12-24 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1996-12-23 | 1997-06-24 | 1997-12-24 | $7700.00 | Window Closed / Lapsed |