US4554047A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Downstream apparatus and technique
Assignee: Nokia Bell Labs
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Filing: 1984-10-12
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Granted: 1985-11-19
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Expires: 2004-10-12
Abstract
Abstract The use of a particular configuration in a downstream etching apparatus and technique allows the rapid and economical treatment of a plurality of semiconductor substrates. Additionally, through the use of this technique, global and localized loading effects are avoided. The downstream apparatus utilizes a discharge region that is relatively large compared to the volume occupied by the substrates. Additionally, the concentration of the etchant species in the effluent is maintained at a level that is of the same order as that produced in the discharge region.
Inventors
- 👤 Joel M. Cook
- 👤 Daniel L. Flamm
- 👤 Edward H. Mayer
- 👤 Bernard C. Seiler
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 17:30
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/32
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
107 words
A process for fabricating a device including the procedure of removing material from a plurality of substrates comprising the steps of producing reactive species in a plasma and directing said species to said substrate and subsequently into an effluent wherein said substrate is disjoint from and not surrounded by said plasma CHARACTERIZED IN THAT the volume of said plasma is at least 200 percent as large as the volume occupied by said substrates, and the concentration of said etchant species measured in said effluent in the absence of said substrates is at least 25 percent of the concentration of said species at the periphery of said plasma.
Claim 2
Dependent Claim
107 words
A process for fabricating a device including the procedure of removing material from a plurality of substrates comprising the steps of producing reactive species in a plasma and directing said species to said substrate and subsequently into an effluent wherein said substrate is disjoint from and not surrounded by said plasma CHARACTERIZED IN THAT the volume of said plasma is at least 200 percent as large as the volume occupied by said substrates, and the concentration of said etchant species measured in said effluent in the absence of said substrates is at least 25 percent of the concentration of said species at the periphery of said plasma.
Claim 3
Dependent Claim
12 words
The process of claim 1 wherein said plasma comprises an r.f. discharge.
Claim 4
Dependent Claim
10 words
The process of claim 1 wherein said substrate comprises silicon.
Claim 5
Dependent Claim
12 words
The process of claim 3 wherein said etchant species comprises fluorine atoms.
Claim 6
Dependent Claim
12 words
The process of claim 1 wherein said etchant species comprises oxygen atoms.
Claim 7
Dependent Claim
10 words
The process of claim 1 wherein said material comprises silicon.
Claim 8
Dependent Claim
11 words
The process of claim 1 wherein said material comprises a resist.
Claim 9
Dependent Claim
13 words
The process of claim 1 wherein said device comprises a hybrid integrated circuit.
Claim 10
Dependent Claim
22 words
The process of claim 1 wherein the average spacing between said multiplicity of substrates is in the range 5 to 15 mm.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1988-11-18 | 1989-05-20 | 1989-11-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1992-11-18 | 1993-05-20 | 1993-11-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1996-11-18 | 1997-05-20 | 1997-11-19 | $7700.00 | Window Closed / Lapsed |