US4545035A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Dynamic RAM with nonvolatile shadow memory
Assignee: STMicroelectronics lnc USA
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Filing: 1982-07-20
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Granted: 1985-10-01
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Expires: 2002-07-20
Abstract
Abstract A compact memory cell combines a volatile dynamic storage section with a shadow nonvolatile section in two vertically stacked element arrays.
Inventors
- 👤 Daniel C. Guterman
- 👤 Ching-Lin Jiang
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 21:31
CPC Classifications
H; H10; H10B; H10B12/00; G; G11; G11C; G11C14/00
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
318 words
A nonvolatile random access memory cell comprising: a data input transistor controlled by address control means for reading out and writing in binary data; a volatile storage element, having at least one node for storing binary data; a nonvolatile storage element having at least one floating gate disposed above a tunnel oxide capacitor and coupled to said at least one node of said volatile storage element; means for transferring binary data from at least one of said at least one node to said nonvolatile storage element; and means for recalling binary data from said nonvolatile storage element to said volatile storage element, characterized in that: said volatile storage element is a storage capacitor connected between a single volatile storage node at a terminal of said input transistor and ground; said nonvolatile storage element includes a vertically stacked array of a floating gate disposed above said tunnel oxide capacitor and a floating gate transistor, a control gate, having at least one edge, disposed above said floating gate and capacitively coupled thereto with a first coupling capacitance, and a high voltage electrode for carrying high voltage in excess of 15 volts disposed above said control gate and extending in close proximity to said at least one edge, said voltage electrode being capacitively coupled to said control gate with a second coupling capacitance and capacitively coupled to said floating gate with an erase capacitance; said means for transferring binary data includes a steering transistor connected between ground and said control gate and having a steering transistor gate connected to said volatile storage node; and said means for recalling binary data comprises a recall transistor, having a first terminal connected to said volatile storage node, a second terminal connected to a first terminal of said floating gate transistor and a recall gate connected to a recall terminal, which recall terminal is also connected to a second terminal of said floating gate transistor.
Claim 2
Dependent Claim
318 words
A nonvolatile random access memory cell comprising: a data input transistor controlled by address control means for reading out and writing in binary data; a volatile storage element, having at least one node for storing binary data; a nonvolatile storage element having at least one floating gate disposed above a tunnel oxide capacitor and coupled to said at least one node of said volatile storage element; means for transferring binary data from at least one of said at least one node to said nonvolatile storage element; and means for recalling binary data from said nonvolatile storage element to said volatile storage element, characterized in that: said volatile storage element is a storage capacitor connected between a single volatile storage node at a terminal of said input transistor and ground; said nonvolatile storage element includes a vertically stacked array of a floating gate disposed above said tunnel oxide capacitor and a floating gate transistor, a control gate, having at least one edge, disposed above said floating gate and capacitively coupled thereto with a first coupling capacitance, and a high voltage electrode for carrying high voltage in excess of 15 volts disposed above said control gate and extending in close proximity to said at least one edge, said voltage electrode being capacitively coupled to said control gate with a second coupling capacitance and capacitively coupled to said floating gate with an erase capacitance; said means for transferring binary data includes a steering transistor connected between ground and said control gate and having a steering transistor gate connected to said volatile storage node; and said means for recalling binary data comprises a recall transistor, having a first terminal connected to said volatile storage node, a second terminal connected to a first terminal of said floating gate transistor and a recall gate connected to a recall terminal, which recall terminal is also connected to a second terminal of said floating gate transistor.
Claim 3
Dependent Claim
42 words
A memory cell according to claim 1, further characterized in that: said storage capacitor is formed from a lower layer of poly-silicon that serves as said steering transistor gate and an upper layer of poly-silicon disposed above said lower layer of poly-silicon.
Claim 4
Dependent Claim
35 words
A memory cell according to either of claims 1 or 2, further characterized in that: said high voltage electrode is capacitively coupled to a single diffusion conductor connecting said control gate and said steering transistor.
References Cited (Backward Citations)
US4331968A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1988-09-30 | 1989-04-01 | 1989-10-01 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1992-09-30 | 1993-04-01 | 1993-10-01 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1996-09-30 | 1997-04-01 | 1997-10-01 | $7700.00 | Window Closed / Lapsed |