US4538268A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Test-signal generating device for testing electronic equipment
Assignee: Thales SA
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Filing: 1983-03-16
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Granted: 1985-08-27
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Expires: 2003-03-16
Abstract
Abstract A generating device comprising means for storing test signals in the form of digital samples coupled to a digital-to-analog converter for converting the samples to analog signals at the output of the device. A read/write memory is interposed between the digital-to-analog converter and the storage means. A computer is coupled to the storage means and to the read/write memory. The computer comprises means for generating test signals in the form of digital samples, means whereby the samples stored within the storage means and the test signals produced by the generating means are transferred into the read/write memory as well as means for synchronizing the transfer of samples stored within the read/write memory to the digital-to-analog converter.
Inventors
- 👤 Luc Pham van Cang
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 05:33
CPC Classifications
H; H04; H04N; H04N17/00; H04N17/02
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
126 words
A test-signal generating device for testing electronic equipment and comprising means for storing test signals in the form of digital samples coupled to a digital-to-analog converter for converting the samples stored in digital form to analog signals at the output of the device, wherein said device comprises: a read/write memory interposed between the analog-to-digital converter and the storage means; a computer coupled to the storage means and to the read/write memory and comprising: means for generating test signals in the form of digital samples; means for transferring into the read/write memory the signals stored within the storage means and the test signals produced by the generating means; as well as means for synchronizing the transfer of samples stored within the read/write memory to the digital-to-analog converter.
Claim 2
Dependent Claim
126 words
A test-signal generating device for testing electronic equipment and comprising means for storing test signals in the form of digital samples coupled to a digital-to-analog converter for converting the samples stored in digital form to analog signals at the output of the device, wherein said device comprises: a read/write memory interposed between the analog-to-digital converter and the storage means; a computer coupled to the storage means and to the read/write memory and comprising: means for generating test signals in the form of digital samples; means for transferring into the read/write memory the signals stored within the storage means and the test signals produced by the generating means; as well as means for synchronizing the transfer of samples stored within the read/write memory to the digital-to-analog converter.
Claim 3
Dependent Claim
24 words
A device according to claim 1, wherein the means for generating test signals in the form of samples consist of a microprogrammed processing unit.
Claim 4
Dependent Claim
48 words
A device according to claim 2, wherein the microprogrammed processing unit, comprises: first means for storage of signal descriptors; second means for storage of sequences of programmed instructions; third means for storage of data for obtaining samples; and computation means coupled to said first, second and third means.
Claim 5
Dependent Claim
20 words
A device according to claim 3 further comprising a keyboard for addressing said first means for storage of signal descriptors.
Claim 6
Dependent Claim
83 words
A device according to claim 4, wherein the signal descriptor storage means comprise in the case of each descriptor an area which indicates the type of descriptor, an area for storing the address of the start of the instruction sequence for obtaining samples corresponding to said descriptor, address areas forming part of operational areas for storing parameters relating to the signal in the data storage means and an address area for the start of an area for storing samples in said storage means.
Claim 7
Dependent Claim
59 words
A device according to claim 5, wherein the operational area for storing the parameters comprises: an area for storing a parameter which gives the instant of starting of the first signal sample; an area for storing a parameter which gives the amplitude of the last sample; and an area for storing the instant of generation of the last sample.
Claim 8
Dependent Claim
40 words
A device according to claim 6, wherein the read/write memory is addressed by an address counter controlled by the computer for writing samples in the read/write memory and controlled by the synchronization means for reading samples in said read/write memory.
Claim 9
Dependent Claim
34 words
A device according to claim 7, wherein said device further comprises demultiplexing circuits for writing samples in the read/write memory and multiplexing circuits for transferring samples from the read/write memory to the digital-to-analog converter.
Claim 10
Dependent Claim
15 words
A device according to claim 8, wherein the demultiplexing circuits are controlled by the computer.
Claim 11
Dependent Claim
16 words
A device according to claim 9, wherein the multiplexing circuits are controlled by the synchronization means.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1988-08-26 | 1989-02-25 | 1989-08-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1992-08-26 | 1993-02-25 | 1993-08-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1996-08-26 | 1997-02-25 | 1997-08-27 | $7700.00 | Window Closed / Lapsed |