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US4528504A Expired / Lapsed US ⏱️ 0.0 years remaining

Pulsed linear integrated circuit tester

Assignee: Intersil Corp
•
Filing: 1982-05-27
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Granted: 1985-07-09
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Expires: 2002-05-27
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Abstract

Abstract The tester includes a test cabinet which forms an electromagnetic shield enclosure with an aperture in the top wall through which a device under test extends and a thermal hood intersecting the top wall to form a thermal and electromagnetic shield enclosure about the device under test. A device under test receptacle is mounted to a removable electromagnetic shield load board with coaxial connectors which snap into coaxial connectors on a electromagnetic shield mother board which is permanently mounted in the electromagnetic shielded enclosure. The connection of the terminals at the bottom of the mother board are by matched impedance, equal length coaxial cables to the A.C. interface and a ribbon cord to the D.C. interface. The environmental enclosure, the housing are grounded to frame ground and the load board and the mother board are all grounded to instrument ground which is then attached to frame ground via single ground point.

Inventors

  • 👤 Max C. Thornton, Jr.
  • 👤 Paul Kuntz
  • 👤 Russell L. Meyer
  • 👤 Kenneth M. Rosier

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 14:18
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/18; G01R31/00; G01R31/28; G01R31/2851

Claims Analysis

Total Claims: 14
Claim 1
Independent Claim 126 words
An integrated circuit tester comprising: a test cabinet means having a bottom, side and top walls, for forming an electromagnetic shielded enclosure, said top wall includes an aperture; test board means mounted in said cabinet means for interconnecting electrical signals between a device under test and a control unit; a device receptacle means extending up from said test board means and positioned in said aperture in said top wall; hood means exterior said test cabinet for enclosing a device under test in said device receptacle means when said hood means is lowered to engage said top wall and forming an electromagnetic shielded and thermal enclosure about said device under test; and thermal means in said hood means for controlling the temperature of said device under test.
Claim 2
Dependent Claim 126 words
An integrated circuit tester comprising: a test cabinet means having a bottom, side and top walls, for forming an electromagnetic shielded enclosure, said top wall includes an aperture; test board means mounted in said cabinet means for interconnecting electrical signals between a device under test and a control unit; a device receptacle means extending up from said test board means and positioned in said aperture in said top wall; hood means exterior said test cabinet for enclosing a device under test in said device receptacle means when said hood means is lowered to engage said top wall and forming an electromagnetic shielded and thermal enclosure about said device under test; and thermal means in said hood means for controlling the temperature of said device under test.
Claim 3
Dependent Claim 36 words
An integrated circuit tester according to claim 1, wherein said thermal means includes a cap secured to said hood means and movable therewith to enclose said device under test when lowered to engage said top wall.
Claim 4
Dependent Claim 27 words
An integrated circuit tester according to claim 2, wherein said cap includes a port for receiving a fluid which determines the temperature of said device under test.
Claim 5
Dependent Claim 30 words
An integrated circuit tester according to claim 3, wherein said cap includes a vent to the interior of said hood means and said hood means includes a vent to atmosphere.
Claim 6
Dependent Claim 38 words
An integrated circuit tester according to claim 1, wherein said top wall includes a collar encompassing said aperture and forming an electromagnetic and thermal barrier and said hood means engages the top edge of said collar when lowered.
Claim 7
Dependent Claim 25 words
An integrated circuit tester according to claim 5, wherein the portion of said top wall of said cabinet encompassed by said collar includes thermal insulation.
Claim 8
Dependent Claim 31 words
An integrated circuit tester according to claim 1, wherein said hood means includes walls having a layer of thermal insulation and a layer of conductive metal which is an electromagnetic shield.
Claim 9
Dependent Claim 22 words
An integrated circuit tester according to claim 7, wherein said conductive metal of said hood means and said cabinet means are grounded.
Claim 10
Dependent Claim 24 words
An integrated circuit tester according to claim 7, wherein said conductive metal of said hood means is copper and said cabinet means is aluminum.
Claim 11
Dependent Claim 32 words
An integrated circuit tester according to claim 1 including rail means extending up from said top wall of said cabinet means, said hood means slides up and down on said rail means.
Claim 12
Dependent Claim 29 words
An integrated circuit tester according to claim 10, wherein said hood means is electrically connected to said cabinet means through said rail means, and said cabinet means is grounded.
Claim 13
Dependent Claim 33 words
An integrated circuit tester according to claim 1, including a gas port in said cabinet means for filing said cabinet means with a gas to create a dry atmosphere in said cabinet means.
Claim 14
Dependent Claim 27 words
An integrated circuit tester according to claim 12, including a vent in said cabinet means to prevent a pressure build-up of said gas in said cabinet means.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1988-07-08 1989-01-07 1989-07-09 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1992-07-08 1993-01-07 1993-07-09 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1996-07-08 1997-01-07 1997-07-09 $7700.00 Window Closed / Lapsed

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