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US4525811A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor memory and method of producing the same

Assignee: Toshiba Corp
•
Filing: 1982-01-29
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Granted: 1985-06-25
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Expires: 2002-01-29
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Abstract

Abstract A static RAM using a flip-flop circuit as a memory cell is disclosed. The gate oxide film of the MOS transistor for selecting the memory cell is thicker than the gate oxide film of the MOS transistor included in the peripheral circuit of the memory matrix.

Inventors

  • 👤 Fujio Masuoka

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 22:30
CPC Classifications
G; G11; G11C; G11C11/00; G11C11/21; G11C11/34; G11C11/40; G11C11/41; G11C11/412; H; H10; H10B; H10B10/00; H10B10/12; H10B10/15; H10D; H10D64/00; H10D64/20; H10D64/27; H10D64/311; H10D64/411; H10D64/511; H10D64/514; Y; Y10; Y10S; Y10S257/00; Y10S257/903; Y10S438/00; Y10S438/981

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 65 words
An integrated static RAM, comprising a flip-flop circuit constituting a memory cell, a MOS transistor for selecting the memory cell, and a peripheral circuit formed in a substrate in which is formed a memory matrix, wherein the gate oxide film of the MOS transistor for selecting the memory cell is thicker than the gate oxide film of the MOS transistor included in the peripheral circuit.
Claim 2
Dependent Claim 65 words
An integrated static RAM, comprising a flip-flop circuit constituting a memory cell, a MOS transistor for selecting the memory cell, and a peripheral circuit formed in a substrate in which is formed a memory matrix, wherein the gate oxide film of the MOS transistor for selecting the memory cell is thicker than the gate oxide film of the MOS transistor included in the peripheral circuit.
Claim 3
Dependent Claim 37 words
The integrated static RAM according to claim 1, wherein the flip-flop circuit is formed of cross-coupled first and second inverters each consisting of a load resistor and a driving transistor connected in series to the load resistor.
Claim 4
Dependent Claim 21 words
The integrated static RAM according to claim 1, wherein the flip-flop circuit is formed of cross-coupled first and second C-MOS inverters.
Claim 5
Dependent Claim 37 words
The integrated static RAM according to claim 1, wherein polysilicon gates formed in a single step are included in the MOS transistor for selecting the memory cell and the MOS transistor included in the peripheral circuit, respectively.
Claim 6
Dependent Claim 43 words
The integrated static RAM according to claim 1, wherein the MOS transistor for selecting the memory cell comprises a first polysilicon gate, and the MOS transistor included in the peripheral circuit comprises a second polysilicon gate formed separately from the first polysilicon gate.

References Cited (Backward Citations)

No citation records indexed.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1988-06-24 1988-12-24 1989-06-25 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1992-06-24 1992-12-24 1993-06-25 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1996-06-24 1996-12-24 1997-06-25 $7700.00 Window Closed / Lapsed

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