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US4521086A Expired / Lapsed US ⏱️ 0.0 years remaining

Objective for an IC mask testing device

Assignee: Olympus Corp
•
Filing: 1983-06-30
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Granted: 1985-06-04
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Expires: 2003-06-30
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Abstract

Abstract An objective for an IC mask testing device comprising a first, second, third, fourth, fifth and sixth lens components wherein the first lens component is a positive meniscus lens, the second lens component is a biconvex lens, the third lens component is a cemented doublet consisting of a biconvex lens and a biconcave lens, the fourth lens component is a cemented doublet consisting of a biconcave lens and a biconvex lens, the fifth lens component is a biconvex lens, and the sixth lens component is a negative meniscus lens, the objective for an IC mask testing device having favorably corrected chromatic aberration for the fluorescent wavelength as well as favorably corrected chromatic aberration in general, a long working distance and high magnification.

Inventors

  • 👤 Hiroyuki Kurita

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 20:28
CPC Classifications
G; G02; G02B; G02B13/00; G02B13/24; G02B21/00; G02B21/02

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 199 words
An objective for an IC mask testing device comprising a first, second, third, fourth, fifth and sixth lens components, said first lens component being a positive meniscus lens, said second lens component being a biconvex lens, said third lens component being a cemented doublet consisting of a biconvex lens and a biconcave lens, said fourth lens component being a cemented doublet consisting of a biconcave lens and a biconvex lens, said fifth lens component being a biconvex lens, said sixth lens component being a negative meniscus lens, said objective for an IC mask testing device being arranged to fulfill the conditions (1) through (5) shown below: (1) 1.2f<f.sub.p <1.8f (2) 1.5f<f.sub.1 (3) d.sub.1 <0.36f (4) 1.27f<r.sub.13 <1.40f (5) 1.0f<r.sub.14 <1.05f where, reference symbol f represents the focal length of the lens system as a whole, reference symbol f p represents the total focal length of the first through the fifth lens components, reference symbol f 1 represents the focal length of the first lens component, and reference symbol d 1 represents the thickness of the first lens component, and reference symbols r 13 and r 14 respectively represent radii of curvature of respective surfaces of the sixth lens component.
Claim 2
Dependent Claim 199 words
An objective for an IC mask testing device comprising a first, second, third, fourth, fifth and sixth lens components, said first lens component being a positive meniscus lens, said second lens component being a biconvex lens, said third lens component being a cemented doublet consisting of a biconvex lens and a biconcave lens, said fourth lens component being a cemented doublet consisting of a biconcave lens and a biconvex lens, said fifth lens component being a biconvex lens, said sixth lens component being a negative meniscus lens, said objective for an IC mask testing device being arranged to fulfill the conditions (1) through (5) shown below: (1) 1.2f<f.sub.p <1.8f (2) 1.5f<f.sub.1 (3) d.sub.1 <0.36f (4) 1.27f<r.sub.13 <1.40f (5) 1.0f<r.sub.14 <1.05f where, reference symbol f represents the focal length of the lens system as a whole, reference symbol f p represents the total focal length of the first through the fifth lens components, reference symbol f 1 represents the focal length of the first lens component, and reference symbol d 1 represents the thickness of the first lens component, and reference symbols r 13 and r 14 respectively represent radii of curvature of respective surfaces of the sixth lens component.
Claim 3
Dependent Claim 109 words
An objective for an IC mask testing device according to claim 1 further fulfilling the conditions (6) and (10) shown below: (6) ν.sub.2, ν.sub.3, ν.sub.6 >65 (10) ν.sub.4, ν.sub.5,<40 where, reference symbols ν 2 , ν 3 and ν 6 respectively represent Abbe's numbers of the second lens component, lens element on the object side in the third lens component, and lens elements on the image side in the fourth lens component, and reference symbols ν 4 and ν 5 respectively represent Abbe's numbers of the lens element on the image side in the third lens component and lens element on the object side in the fourth lens component.
Claim 4
Dependent Claim 95 words
An objective for an IC mask testing device according to claim 2 further fulfilling the conditions (7) through (9) shown below: (7) 0.6f<d.sub.13 <0.7f (8) 0.03f<d.sub.12 <0.13f (9) n.sub.4, n.sub.5 >1.65 where, reference symbol d 13 represents the thickness of the sixth lens component, reference symbol d 12 represents the airspace between the fifth and sixth lens components, and reference symbols n 4 and n 5 respectively represent refractive indices of the lens element on the image side in the third lens component and lens element on the object side in the fourth lens component.
Claim 5
Dependent Claim 243 words
An objective for an IC mask testing device according to claim 3, in which said objective for an IC mask testing device has the following numerical data: ______________________________________ r.sub.1 = -0.907 d.sub.1 = 0.347 n.sub.1 = 1.72916 ν.sub.1 = 54.68 r.sub.2 = -0.692 d.sub.2 = 0.017 r.sub.3 = 1.287 d.sub.3 = 0.268 n.sub.2 = 1.49700 ν.sub.2 = 81.61 r.sub.4 = -1.517 d.sub.4 = 0.017 r.sub.5 = 0.789 d.sub.5 = 0.330 n.sub.3 = 1.49700 ν.sub.3 = 81.61 r.sub.6 = -7.468 d.sub.6 = 0.267 n.sub.4 = 1.65128 ν.sub.4 = 38.25 r.sub.7 = 0.573 d.sub.7 = 0.309 r.sub.8 = -0.419 d.sub.8 = 0.124 n.sub.5 = 1.72047 ν.sub.5 = 34.72 r.sub.9 = 1.892 d.sub.9 = 0.361 n.sub.6 = 1.51728 ν.sub.6 = 69.56 r.sub.10 = -0.758 d.sub.10 = 0.019 r.sub.11 = 7.471 d.sub.11 = 0.253 n.sub.7 = 1.65830 ν.sub.7 = 57.33 r.sub.12 = -1.314 d.sub.12 = 0.050 r.sub.13 = 1.354 d.sub.13 = 0.699 n.sub.8 = 1.78650 ν.sub.8 = 50.00 r.sub.14 = 1.032 f = 1, NA = 0.4, magnification 140X fp = 1.31, f.sub.1 = 2.38, WD = 0.478 ______________________________________ where, reference symbols r 1 through r 14 respectively represent radii of curvature of respective lens surfaces, reference symbols d 1 through d 13 respectively represent thicknesses of respective lenses and airspaces between respective lenses, reference symbols n 1 through n 8 respectively represent refractive indices of respective lenses for d-line, and reference symbols ν 1 through ν 8 respectively represent Abbe's numbers of respective lenses for d-line.
Claim 6
Dependent Claim 243 words
An objective for an IC mask testing device according to claim 3, in which said objective for an IC mask testing device has the following numerical data: ______________________________________ r.sub.1 = 0.903 d.sub.1 = 0.343 n.sub.1 = 1.72916 ν.sub.1 = 54.68 r.sub.2 = -0.651 d.sub.2 = 0.017 r.sub.3 = 1.652 d.sub.3 = 0.266 n.sub.2 = 1.49700 ν.sub.2 = 81.61 r.sub.4 = -1.333 d.sub.4 = 0.017 r.sub.5 = 0.641 d.sub.5 = 0.327 n.sub.3 = 1.49700 ν.sub.3 = 81.61 r.sub.6 = -3.387 d.sub.6 = 0.265 n.sub.4 = 1.65412 ν.sub.4 = 39.70 r.sub.7 = 0.514 d.sub.7 = 0.306 r.sub.8 = -0.426 d.sub.8 = 0.265 n.sub.5 = 1.72047 ν.sub.5 = 34.72 r.sub.9 = 1.579 d.sub.9 = 0.327 n.sub.6 = 1.51821 ν.sub.6 = 65.04 r.sub.10 = -0.803 d.sub.10 = 0.018 r.sub.11 = 4.165 d.sub.11 = 0.266 n.sub.7 = 1.65830 ν.sub.7 = 57.33 r.sub.12 = -1.636 d.sub.12 = 0.049 r.sub.13 = 1.286 d.sub.13 = 0.615 n.sub.8 = 1.78650 ν.sub.8 = 50.00 r.sub.14 = 1.023 f = 1, NA = 0.4, magnification 140X fp = 1.22, f.sub.1 = 1.855, WD = 0.425 ______________________________________ where, reference symbols r 1 through r 14 respectively represent radii of curvature of respective lens surfaces, reference symbols d 1 through d 13 respectively represent thicknesses of respective lenses and airspaces between respective lenses, reference symbols n 1 through n 8 respectively represent refractive indices of respective lenses for d-line, and reference symbols ν 1 through ν 8 respectively represent Abbe's numbers of respective lenses for d-line.
Claim 7
Dependent Claim 243 words
An objective for an IC mask testing device according to claim 3, in which said objective for an IC mask testing device has the following numerical data: ______________________________________ r.sub.1 = -0.901 d.sub.1 = 0.317 n.sub.1 = 1.72916 ν.sub.1 = 54.68 r.sub.2 = -0.645 d.sub.2 = 0.017 r.sub.3 = 1.396 d.sub.3 = 0.266 n.sub.2 = 1.49700 ν.sub.2 = 81.61 r.sub.4 = -1.569 d.sub.4 = 0.017 r.sub.5 = 0.749 d.sub.5 = 0.328 n.sub.3 = 1.49700 ν.sub.3 = 81.61 r.sub.6 = -5.979 d.sub.6 = 0.266 n.sub.4 = 1.66998 ν.sub.4 = 39.32 r.sub.7 = 0.534 d.sub.7 = 0.307 r.sub.8 = -0.408 d.sub.8 = 0.123 n.sub.5 = 1.72047 ν.sub.5 = 34.72 r.sub.9 = 6.597 d.sub.9 = 0.359 n.sub.6 = 1.49700 ν.sub.6 = 81.61 r.sub.10 = -0.647 d.sub.10 = 0.018 r.sub.11 = 4.339 d.sub.11 = 0.252 n.sub.7 = 1.65830 ν.sub.7 = 57.33 r.sub.12 = -1.697 d.sub.12 = 0.127 r.sub.13 = 1.341 d.sub.13 = 0.617 n.sub.8 = 1.78650 ν.sub.8 = 50.00 r.sub.14 = 1.016 f = 1, NA = 0.4, magnification 140X fp = 1.26, f.sub.1 = 2.03, WD = 0.412 ______________________________________ where, reference symbols r 1 through r 14 respectively represent radii of curvature of respective lens surfaces, reference symbols d 1 through d 13 respectively represent thicknesses of respective lenses and airspaces between respective lenses, reference symbols n 1 through n 8 respectively represent refractive indices of respective lenses for d-line, and reference symbols ν 1 through ν 8 respectively represent Abbe's numbers of respective lenses for d-line.

References Cited (Backward Citations)

US4232941A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1988-06-03 1988-12-03 1989-06-04 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1992-06-03 1992-12-03 1993-06-04 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1996-06-03 1996-12-03 1997-06-04 $7700.00 Window Closed / Lapsed

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