US4487661A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and device for determining the physical characteristics of a semiconductor material
Assignee: Photowatt International SA
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Filing: 1983-09-08
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Granted: 1984-12-11
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Expires: 2003-09-08
Abstract
Abstract In a method for determining the physical characteristics of a silicon wafer, one side of the wafer (4) is removably fixed to the base (2) of a container (1) so as to close off a hole (3) therein. An electrical connection to this side of the wafer (4) is made thru the hole (3). The wafer (4) forms the working electrolyte of a cell comprising an electrolyte contained in the container (1). An auxiliary electrode (14) is removably placed in the electrolyte. The method and the device implementing it can be used to determine the crystallographic and electrical characteristics of a sample of silicon.
Inventors
- 👤 Jean-Yves Barraud
- 👤 G/e/ rard Tourillon
- 👤 Francois Arnould
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 04:20
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/282; G01R31/2831
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
254 words
A method of determining the physical characteristics of a semiconductor material by use of an insulative container, comprising the following consecutive steps: removably applying a wafer of said material to the base of said insulative container having a hole in the base so as to cover said hole, placing an electrolyte in said container so that a first side of said wafer constituting a working electrode is in contact with said electrolyte, disposing an auxiliary electrode in said electrolyte opposite said working electrode, connecting a direct current electrical power source between a second side of said wafer and said auxiliary electrode, and determining the characteristics of said wafer by examining said first side, the improvement wherein said container base is flat, having an internal wall, a plurality of side by side evacuating grooves formed within said flat base internal wall and covering the full surface area of said wafer second side, and said method further comprising the steps of: evacuating said grooves formed in said wall via passageways formed in the base of said container open to said grooves and connected to a vacuum pump system external to said container, closing off said hole in said container in an electrolyte-tight manner, connecting said second side of said wafer to said power source by connecting that part thereof opposite said hole through said hole to said power source, connecting said working and auxiliary electrodes to said power source for a predetermined time interval, and determining said characteristics at the end of said predetermined time interval.
Claim 2
Independent Claim
254 words
A method of determining the physical characteristics of a semiconductor material by use of an insulative container, comprising the following consecutive steps: removably applying a wafer of said material to the base of said insulative container having a hole in the base so as to cover said hole, placing an electrolyte in said container so that a first side of said wafer constituting a working electrode is in contact with said electrolyte, disposing an auxiliary electrode in said electrolyte opposite said working electrode, connecting a direct current electrical power source between a second side of said wafer and said auxiliary electrode, and determining the characteristics of said wafer by examining said first side, the improvement wherein said container base is flat, having an internal wall, a plurality of side by side evacuating grooves formed within said flat base internal wall and covering the full surface area of said wafer second side, and said method further comprising the steps of: evacuating said grooves formed in said wall via passageways formed in the base of said container open to said grooves and connected to a vacuum pump system external to said container, closing off said hole in said container in an electrolyte-tight manner, connecting said second side of said wafer to said power source by connecting that part thereof opposite said hole through said hole to said power source, connecting said working and auxiliary electrodes to said power source for a predetermined time interval, and determining said characteristics at the end of said predetermined time interval.
Claim 3
Dependent Claim
23 words
A method according to claim 1, wherein said semiconductor material is silicon and said electrolyte is a mixture of hydrofluoric acid and alcohol.
Claim 4
Dependent Claim
83 words
A method according to claim 2, wherein said working electrode is maintained by said power source at a negative potential of approximately 0.5 volt relative to said auxiliary electrode, said predetermined time interval is of the order of 60 minutes, and said method further comprises the step of determining local electrical characteristics of the wafer by examining dark areas visible on said first side at the end of said predetermined time interval and corresponding to areas of weak electrical response to luminous excitation.
Claim 5
Dependent Claim
81 words
A method according to claim 2, wherein said working electrode is maintained by said power source at a positive potential of approximately 10 volts relative to said auxiliary electrode, said predetermined time interval is of the order of 25 minutes, and said method further comprises the step of determining local crystallographic characteristics of the wafer by examining colored areas visible on said first side at the end of said predetermined time interval, said color being representative of a specific crystallographic plane.
Claim 6
Dependent Claim
27 words
A method according to claim 2, wherein said electrolyte comprises a mixture of equal parts by volume of alcohol and an aqueous solution containing 5% hydrofluoric acid.
Claim 7
Independent Claim
185 words
A device for determining the physical characteristics of a semiconductor material, comprising a container, means for placing an electrolyte in and removing said electrolyte from said container, a substantially plane internal wall in said container adapted to permit a wafer of said semiconductor material to be disposed within said container against said wall so that a first side thereof is in contact with the electrolyte when said container contains electrolyte, evacuating grooves in said wall, a base in said container, a hole in said base, passageways in said base whereby said grooves communicate with the exterior of said container, a vacuum pump system connected to said passageways and adapted to evacuate said grooves so as to apply removably a second side of said wafer against said wall, an auxiliary electrode, removable means for placing said auxiliary electrode in said container, a direct current electrical power source, means for electrically connecting one terminal of said source to said auxiliary electrode, and means for connecting the other terminal of said source via said hole to that portion of said first side of said wafer opposite said hole.
Claim 8
Independent Claim
185 words
A device for determining the physical characteristics of a semiconductor material, comprising a container, means for placing an electrolyte in and removing said electrolyte from said container, a substantially plane internal wall in said container adapted to permit a wafer of said semiconductor material to be disposed within said container against said wall so that a first side thereof is in contact with the electrolyte when said container contains electrolyte, evacuating grooves in said wall, a base in said container, a hole in said base, passageways in said base whereby said grooves communicate with the exterior of said container, a vacuum pump system connected to said passageways and adapted to evacuate said grooves so as to apply removably a second side of said wafer against said wall, an auxiliary electrode, removable means for placing said auxiliary electrode in said container, a direct current electrical power source, means for electrically connecting one terminal of said source to said auxiliary electrode, and means for connecting the other terminal of said source via said hole to that portion of said first side of said wafer opposite said hole.
Claim 9
Dependent Claim
77 words
A device according to claim 6, wherein a removable conductive layer is disposed on said second side of said wafer and the connection between said other terminal of said power source and that portion opposite said hole of said second side of said wafer comprises an electrically conductive spring housed in said hole and applied by compression to said conductive layer when said pump system is operated, and means for connecting said spring to said power source.
Claim 10
Dependent Claim
95 words
A device according to claim 6, wherein said means for placing electrolyte in and removing electrolyte from said container comprise a pumping circuit connected to a reservoir of said electrolyte thru a first valve and to a passage passing thru a lateral wall of said container, said circuit comprising a pump adapted to transfer said electrolyte in the direction from said reservoir to said container and vice versa, there being a branch connection for removal of said electrolyte between said pump and said first valve and a second valve in series with said branch connection.
Claim 11
Dependent Claim
16 words
A device according to claim 8, wherein said container and said reservoir are made of polytetrafluorethylene.
Claim 12
Dependent Claim
37 words
A device according to claim 6, further comprising a metal support and means for removably fixing said base of said container to said support which is formed with internal passageways adapted to contain a circulating cooling liquid.
Claim 13
Dependent Claim
26 words
A device according to claim 6, further comprising a reference electrode disposed in said container for the purpose of determining the potential on said working electrode.
Claim 14
Dependent Claim
41 words
A device according to claim 6, further comprising a source of optical radiation from which a beam may be directed onto a part of said first side of said wafer and means for moving the beam over the entire surface thereof.
Claim 15
Dependent Claim
19 words
A device according to claim 6, further comprising means for placing in and removing from said container another electrolyte.
Claim 16
Dependent Claim
27 words
A device according to claim 6, further comprising means for placing in and removing from said container a product for cleaning said wafer and a washing product.
Claim 17
Dependent Claim
31 words
A device according to claim 6, further comprising means for recording the current flowing between said working electrode and said auxiliary electrode when connected to said terminals of said power source.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1987-12-11 | 1988-06-11 | 1988-12-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1991-12-11 | 1992-06-11 | 1992-12-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1995-12-11 | 1996-06-11 | 1996-12-11 | $7700.00 | Window Closed / Lapsed |