Micrometer gauge

Claim 2

A micrometer gauge comprising: a main frame; an elongated spindle mounted on said main frame for axial sliding movement in the lengthwise direction thereof, said spindle having an engageable projection extending radially outwardly therefrom; spindle rotation preventing means comprising a non-rotatable slot extending in the lengthwise direction of said spindle, said projection extending through said slot so that rotation of said spindle is prevented; a thimble rotatably mounted on said main frame, said thimble having a spiral groove of large pitch on the inner peripheral surface thereof, the radially outermost end of said projection being received in said spiral groove for sliding movement therealong, whereby rotation of said thimble causes lengthwise movement of said spindle with respect to said main frame; and an indicator coupled to said spindle and responsive to lengthwise movement of said spindle for indicating a dimension of a workpiece.

Claim 3

A micrometer gauge comprising: a main frame; an elongated spindle mounted on said main frame for axial sliding movement in the lengthwise direction thereof; spindle rotation preventing means comprising an engageable member which extends radially relative to said spindle and a slot which extends in the lengthwise direction of said spindle, said member extending into said slot, one of said member and said slot being formed on said spindle and the other thereof being non-rotatably on said main frame, whereby rotation of said spindle is prevented; a sleeve rotatably mounted on said main frame, said sleeve having a spiral groove of large pitch on the inner peripheral surface thereof, said spindle having a radially outwardly extending projection thereon, the radially outermost end of said projection being received in said spiral groove for sliding movement therealong so that rotation of said sleeve causes sliding movement of said projection within said spiral groove and lengthwise movement of said spindle with respect to said main frame; means for rotating said sleeve by applying force thereto, and for releasing said sleeve from such rotation when the force required to rotate said sleeve exceeds a selected value, which selected value corresponds to a maximum force which can be exerted by an end of said spindle against a workpiece; and an indicator coupled to said spindle and responsive to lengthwise movement of said spindle for indicating a dimension of a workpiece.

Claim 4

A micrometer gauge comprising: a main frame; an elongated spindle mounted on said main frame for axial sliding movement in the lengthwise direction thereof; spindle rotation preventing means comprising an engageable member which extends radially relative to said spindle and a slot which extends in the lengthwise direction of said spindle, said member extending into said slot, one of said member and said slot being formed on said spindle and the other thereof being non-rotatably on said main frame, whereby rotation of said spindle is prevented; a sleeve rotatably mounted on said main frame, said sleeve having a spiral groove of large pitch on the inner peripheral surface thereof, said spindle having a radially outwardly extending projection thereon, the radially outermost end of said projection being received in said spiral groove for sliding movement therealong so that rotation of said sleeve causes sliding movement of said projection within said spiral groove and lengthwise movement of said spindle with respect to said main frame; means for rotating said sleeve by applying force thereto, and for releasing said sleeve from such rotation when the force required to rotate said sleeve exceeds a selected value, which selected value corresponds to a maximum force which can be exerted by an end of said spindle against a workpiece; and an indicator coupled to said spindle and responsive to lengthwise movement of said spindle for indicating a dimension of a workpiece.

Claim 5

A micrometer gauge as claimed in claim 2, wherein said means for rotating and releasing said sleeve comprises a thimble rotatably mounted on said main frame and encircling said sleeve and a coil spring which is spirally wound around said sleeve and is confined between said sleeve and said thimble, said coil spring having a free end and an end which is affixed to said sleeve, said coil spring being in resilient, pressing contact with the inner periphery of said thimble and the outer periphery of said sleeve, whereby rotation of said thimble causes rotation of said sleeve in the same direction.

Claim 6

A micrometer gauge as claimed in claim 3, wherein said coil spring is wound around said sleeve in such a direction that, when said selected force exerted by said spindle will be exceeded, said coil spring will slide along the inner periphery of said thimble, and said sleeve will remain stationary relative to said thimble.

Claim 7

A micrometer gauge comprising: a main frame; an elongated spindle mounted on said main frame for axial sliding movement in the lengthwise direction thereof, said spindle having an axially elongated recess in one end thereof; a thimble rotatably mounted on said main frame; a shaft connected for integral rotation with said thimble, said shaft extending into said recess of said spindle, said shaft having a spiral groove of large pitch on the outer periphery thereof; an engageable projection mounted on said spindle and having a portion received in said spiral groove for sliding movement therealong, means for preventing rotation of said spindle with respect to said main frame, whereby rotation of said thimble causes said projection to slide within said spiral groove and thereby causes lengthwise movement of said spindle with respect to said main frame; and an indicator coupled to said spindle and responsive to lengthwise movement of said spindle for indicating a dimension of a workpiece.

Claim 8

A micrometer gauge comprising: a main frame; an elongated spindle mounted on said main frame for axial sliding movement in the lengthwise direction thereof, said spindle having an axially elongated recess in one end thereof; a thimble rotatably mounted on said main frame; a shaft connected for integral rotation with said thimble, said shaft extending into said recess of said spindle, said shaft having a spiral groove of large pitch on the outer periphery thereof; an engageable projection mounted on said spindle and having a portion received in said spiral groove for sliding movement therealong, means for preventing rotation of said spindle with respect to said main frame, whereby rotation of said thimble causes said projection to slide within said spiral groove and thereby causes lengthwise movement of said spindle with respect to said main frame; and an indicator coupled to said spindle and responsive to lengthwise movement of said spindle for indicating a dimension of a workpiece.

Claim 9

A micrometer gauge as claimed in claim 5, further comprising a sleeve rotatably mounted on said main frame, said sleeve being fixedly secured to said shaft, and a coil spring spirally wound around said sleeve which spring is confined between said sleeve and said thimble, said coil spring having a free end thereof and an end which is affixed to said sleeve, said spring being in resilient, pressing contact with the inner periphery of said thimble and the outer periphery of said sleeve, whereby rotation of said thimble causes rotation of said sleeve and said shaft in the same direction.

Claim 10

A micrometer gauge as claimed in claim 6, wherein said coil spring is wound around said sleeve such that, when a maximum force exerted by said spindle in the axial direction thereof against a workpiece will be exceeded, said spring will slide along the inner periphery of said thimble, and said sleeve will remain stationary relative to said thimble.

Claim 11

A micrometer gauge, comprising: a main gauge frame having a measuring anvil; an elongated spindle mounted on said frame for axial sliding movement in the lengthwise direction of said spindle, the front end of said spindle being positioned so as to be axially movable toward and away from said measuring anvil; spindle rotation preventing means including guide pin means which extends radially relative to the axis of said spindle and an aperture into which an end portion of said guide pin means is fitted, said aperture being elongated in the lengthwise direction of said spindle such that said guide pin means can slide therealong, one of said guide pin means and said aperture being integral with said frame and the other thereof being positioned relative to said spindle such that rotation of said spindle relative to said frame is prevented thereby; an elongated pin which extends radially relative to the axis of the said spindle, said elongated pin being secured for integral movement with said spindle; a thimble rotatably mounted on said frame rearwardly of the end of said spindle that is remote from said measuring anvil, means defining a spiral groove of large pitch into which an end of said elongated pin is slidably fitted, said spiral groove being rotatable by said thimble whereby rotation of said thimble causes said elongated pin to slide within said spiral groove, such that said spindle moves in the axial direction thereof; and an indicator mounted on said frame and coupled to said spindle for measuring axial displacement thereof, such that a dimension of a workpiece can be measured by interposing said workpiece between said anvil and said forward end of said spindle, and then rotating said thimble to move said spindle axially towards said anvil to secure said workpiece therebetween.

Claim 12

A micrometer gauge, comprising: a main gauge frame having a measuring anvil; an elongated spindle mounted on said frame for axial sliding movement in the lengthwise direction of said spindle, the front end of said spindle being positioned so as to be axially movable toward and away from said measuring anvil; spindle rotation preventing means including guide pin means which extends radially relative to the axis of said spindle and an aperture into which an end portion of said guide pin means is fitted, said aperture being elongated in the lengthwise direction of said spindle such that said guide pin means can slide therealong, one of said guide pin means and said aperture being integral with said frame and the other thereof being positioned relative to said spindle such that rotation of said spindle relative to said frame is prevented thereby; an elongated pin which extends radially relative to the axis of the said spindle, said elongated pin being secured for integral movement with said spindle; a thimble rotatably mounted on said frame rearwardly of the end of said spindle that is remote from said measuring anvil, means defining a spiral groove of large pitch into which an end of said elongated pin is slidably fitted, said spiral groove being rotatable by said thimble whereby rotation of said thimble causes said elongated pin to slide within said spiral groove, such that said spindle moves in the axial direction thereof; and an indicator mounted on said frame and coupled to said spindle for measuring axial displacement thereof, such that a dimension of a workpiece can be measured by interposing said workpiece between said anvil and said forward end of said spindle, and then rotating said thimble to move said spindle axially towards said anvil to secure said workpiece therebetween.

Claim 13

A micrometer gauge as claimed in claim 1, claim 2, claim 5 or claim 8, wherein said spiral groove has a lead angle in the range of from 5° to 18°.

Claim 14

A micrometer gauge as claimed in claim 1, claim 2, claim 5 or claim 8, wherein said indicator comprises a dial gauge, a pinion which actuates said dial gauge, and a rack provided on said spindle which meshes with said pinion.

Claim 15

A micrometer gauge as claimed in claim 8, wherein said guide pin means comprises the other end of said elongated pin.

Claim 16

A micrometer gauge as claimed in claim 8, wherein said guide pin means comprises a guide pin which extends radially inwardly from said frame, and said aperture comprises an elongated guide groove formed on the outer periphery of said spindle in the lengthwise direction thereof forwardly of said thimble and said elongated pin.

Claim 17

A micrometer gauge as claimed in claim 8, further comprising a sleeve rotatably mounted on said frame within said thimble, said sleeve having said enlarged spiral groove formed on the inner periphery thereof, whereby rotation of said sleeve results in movement of said spindle in the axial direction thereof, and means for rotating said sleeve by applying force thereto generated by rotation of said thimble and for releasing said sleeve from rotation when the force required to rotate said sleeve exceeds a selected value, which selected value corresponds to a maximum force which can be exerted by the forward end of said spindle against said workpiece.

Claim 18

A micrometer gauge as claimed in claim 13, wherein said means for rotating and releasing said sleeve comprises a coil spring which is spirally wound around said sleeve and is confined between said sleeve and said thimble, said coil spring having a free end and an end which is affixed to said sleeve, said spring being in resilient, pressing contact with the inner periphery of said thimble and the outer periphery of said sleeve, whereby rotation of said thimble causes rotation of said sleeve in the same direction, except that when said selected force exerted by said spindle will be exceeded, said coil will slide along the inner periphery of said thimble, and said sleeve will remain stationary relative to said thimble.

Claim 19

A micrometer gauge as claimed in claim 8, wherein said spiral groove is substantially square in cross-section, defines a substantially cylindrical helix, and extends for not more than substantially two full turns thereof.