Protection circuit for integrated circuit devices

Claim 2

A protection circuit for protecting integrated circuit devices against voltage transients, comprising: a terminal; a sole source of reference potential: conductive means for connecting the terminal to the integrated circuit to be protected; first circuit connected between the conductive means and the sole source of reference potential for protecting the integrated circuit against negative voltage transients; second circuit means connected between the conductive means and the sole source of reference potential for protecting the integrated circuit against positive voltage transients; and both the terminal and conductive means formed on and both the first and second circuit means formed within a single isolated region in a semiconductor body.

Claim 3

The protection circuit of claim 1, wherein the first circuit means comprises: a first NPN transistor having an emitter, a base and a collector; a first PNP transistor having an emitter, a base and a collector; means connecting the base of the NPN transistor to the collector of the PNP transistor; means connecting the base of the PNP transistor to the collector of the NPN transistor; means connecting the emitter of the NPN transistor to the conductive means; and means connecting the emitter of the PNP transistor to the source of reference potential.

Claim 4

The protection circuit of claim 2, wherein the second circuit means comprises: a second PNP transistor having an emitter, a base and a collector; a second NPN transistor having an emitter, a base and a collector; means connecting the base of the second NPN transistor to the collector of the second PNP transistor and to the source of reference potential; means connecting the collector of the second NPN transistor to the base of the first and second PNP transistors; means connecting the emitter of the second PNP transistor to the conductive means; and means connecting the emitter of the second NPN transistor to the source of reference potential.

Claim 5

The protection circuit of claim 3, further comprising: a sense resistor connected in series with the conductive means between the terminal and the protected integrated circuit; the emitter of the first NPN transistor and the emitter of the second PNP transistor connected to the end of the sense resistor connected to the terminal; and the bases of the first and second PNP transistors and the collectors of the first and second NPN transistors connected to the other end of the sense resistor.

Claim 6

A semiconductor structure for protecting an integrated circuit from negative and positive going transients, comprising: a substrate of semiconductor material of a first conductivity type; a region of second conductivity type in the substrate at the surface thereof, a first pair of opposite conductivity type transistors, formed in the second conductivity type region, for negative transient protection; a second pair of opposite conductivity type transistors, also formed in the second conductivity type region, for positive transient protection; a terminal formed on the surface of the substrate; conductive means connecting the terminal to the integrated circuit; a source of reference potential; and the first and second pairs of transistors connected between the conductive means and the source of reference potential.

Claim 7

A semiconductor structure for protecting an integrated circuit from negative and positive going transients, comprising: a substrate of semiconductor material of a first conductivity type; a region of second conductivity type in the substrate at the surface thereof, a first pair of opposite conductivity type transistors, formed in the second conductivity type region, for negative transient protection; a second pair of opposite conductivity type transistors, also formed in the second conductivity type region, for positive transient protection; a terminal formed on the surface of the substrate; conductive means connecting the terminal to the integrated circuit; a source of reference potential; and the first and second pairs of transistors connected between the conductive means and the source of reference potential.

Claim 8

The semiconductor structure of claim 5, wherein the first pair of transistors comprises: a first NPN transistor and a first PNP transistor each having an emitter. a base and a collector; the base of the first NPN transistor connected to the collector of the first PNP transistor; the base of the first PNP transistor connected to the collector of the first NPN transistor; the emitter of the first NPN transistor connected to the conductive means; and the emitter of the first PNP transistor connected to the source of reference potential.

Claim 9

The semiconductor structure of claim 6, wherein the second pair of transistors comprises: a second NPN transistor and a seoond PNP transistor, each having an emitter, a base and a collector; the base of the second NPN transistor connected to the collector of the second PNP transistor and to the source of reference potential; the collector of the second NPN transistor connected to the base of the first and the base of the second PNP transistors; the emitter of the second PNP transistor connected to the conductive means. and the emitter of the second NPN transistor connected to the source of reference potential.

Claim 10

The protection circuit of claim 7, further comprising: a sense resistor connected in series with the conductive means between the terminal and the protected integrated circuit; the emitter of the first NPN transistor and the emitter of the second PNP transistor connected to the end of the sense resistor connected to the terminal; and the bases of the first and second PNP transistors and the collectors of the first and second NPN transistors connected to the other end of the sense resistor.