US4482423A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Protection of semiconductor substrates during epitaxial growth processes
Assignee: Nokia Bell Labs
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Filing: 1982-06-25
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Granted: 1984-11-13
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Expires: 2002-06-25
Abstract
Abstract Thermal degradation of compound single crystal substrates (e.g., InP) containing a relatively volatile element (e.g., P) prior to LPE growth has been virtually eliminated by an improved protection technique. A partial pressure of the volatile element is provided by a solution (e.g., Sn-In-P) localized inside a chamber which is external to the LPE boat and which surrounds substrate prior to growth, thereby preventing thermal damage to the substrate surface. Applicability of the technique to other epitaxial growth processes (e.g., VPE and MBE) is also discussed.
Inventors
- 👤 Paul R. Besomi
- 👤 Ronald J. Nelson
- 👤 Randall B. Wilson
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 21:02
CPC Classifications
C; C30; C30B; C30B19/00; C30B19/06; C30B19/063; C30B19/12; C30B25/00; C30B25/02; C30B25/18
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
212 words
A liquid phase epitaxy method of fabricating a semiconductor device by growing an epitaxial layer on a compound semiconductor single crystal substrate containing a relatively volatile element, comprising the steps of: providing a solution holder having a well therein containing a first solution from which said layer is to be grown, providing a slider having a recess therein for carrying said substrate to a position under said well, providing a chamber which (1) is located external to said solution holder, (2) is adapted to permit said slider to translate therethrough, (3) is capable of surrounding said substrate, (4) has a bottom portion underneath said slider and a top portion above said slider, placing a second solution, which contains said volatile element, into said bottom portion of said chamber, moving said slider to position said substrate in said chamber heating said substrate and said solutions to a temperature suitable for growth of said layer and which causes said volatile element to evaporate from said second solution, so that the partial pressure of said volatile element in said chamber reduces thermal decomposition of said substrate, and removing said substrate from said chamber and bringing it into contact with said first solution for a time period effective to grow said layer to the desired thickness.
Claim 2
Dependent Claim
212 words
A liquid phase epitaxy method of fabricating a semiconductor device by growing an epitaxial layer on a compound semiconductor single crystal substrate containing a relatively volatile element, comprising the steps of: providing a solution holder having a well therein containing a first solution from which said layer is to be grown, providing a slider having a recess therein for carrying said substrate to a position under said well, providing a chamber which (1) is located external to said solution holder, (2) is adapted to permit said slider to translate therethrough, (3) is capable of surrounding said substrate, (4) has a bottom portion underneath said slider and a top portion above said slider, placing a second solution, which contains said volatile element, into said bottom portion of said chamber, moving said slider to position said substrate in said chamber heating said substrate and said solutions to a temperature suitable for growth of said layer and which causes said volatile element to evaporate from said second solution, so that the partial pressure of said volatile element in said chamber reduces thermal decomposition of said substrate, and removing said substrate from said chamber and bringing it into contact with said first solution for a time period effective to grow said layer to the desired thickness.
Claim 3
Dependent Claim
24 words
The method of claim 1 wherein said second solution comprises the constituents of said substrate and becomes a saturated solution during said heating step.
Claim 4
Dependent Claim
14 words
The method of claim 2 wherein said substrate comprises a Group III-V compound semiconductor.
Claim 5
Dependent Claim
18 words
The method of claim 3 wherein said substrate comprises InP and said saturated solution comprises In and P.
Claim 6
Dependent Claim
20 words
The method of claim 4 wherein said substrate comprises n-type InP and said saturated solution comprises Sn, In and P.
Claim 7
Dependent Claim
23 words
The method of claim 5 wherein said substrate is doped n-type with a donor selected from the group consisting of S and Sn.
Claim 8
Dependent Claim
19 words
The method of claim 4 wherein said substrate comprises p-type InP and said saturated solution comprises In and P.
Claim 9
Dependent Claim
23 words
The method of claim 7 wherein said substrate is doped p-type with an acceptor selected from the group consisting of Zn and Cd.
Claim 10
Dependent Claim
12 words
The method of claim 4 wherein said substrate comprises semi-insulting Fe-doped InP.
Claim 11
Independent Claim
34 words
The method of claims 4, 5, 6, 7, 8 or 9 wherein said positioning step occurs at least during the time when said substrate is heated to a temperature above approximately 400 degrees C.
References Cited (Backward Citations)
US4227962A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1987-11-13 | 1988-05-14 | 1988-11-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1991-11-13 | 1992-05-14 | 1992-11-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1995-11-13 | 1996-05-14 | 1996-11-13 | $7700.00 | Window Closed / Lapsed |