US4480223A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Unitary probe assembly
Assignee: Individual
•
Filing: 1981-11-25
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Granted: 1984-10-30
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Expires: 2001-11-25
Abstract
Abstract The specification describes a unitary probe assembly adapted to inspect semiconductor chips each provided with a plurality of electrode terminals at both inner surface area and outer peripheral edge thereof. Probes are disposed in a plurality of layers and terminate at the free ends thereof in a common plane. The main body portions of the probes are covered by a layer of an insulating material. Owing to the layer of the insulating material, the layers of the probes can be stacked closely without need to worry about their electrical contact, thereby making it possible to reduce the assembly in thickness and rendering its handling and application easier. Since all the probes are disposed at once and secured in place with a suitable resin such as epoxy resin, the fabrication of the probe assembly is easy and efficient.
Inventors
- 👤 Seiichiro Aigo
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 23:20
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07342
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
160 words
A unitary probe assembly adapted to inspect semiconductor chips each provided with a plurality of electrode terminals at both an inner surface area and an outer peripheral edge thereof, comprising: a board defining an aperture therethrough; a block seated in said aperture and defining at least one opening therethrough; a plurality of probes each formed of electrically conductive fine wires and arranged aslant around said opening; each probe having a contact tip portion at one end and a terminal end portion at an opposite end; said probes being disposed in a plurality of layers through said block, extending at the contact tip portions thereof into said opening and terminating in a common plane; each probe having a main body portions between said contact tip and terminal end portions, covered by a layer of an insulating material; and a layer of an electrically conductive material convering said layer of insulating material for shielding each said main body portion of each probe.
Claim 2
Dependent Claim
160 words
A unitary probe assembly adapted to inspect semiconductor chips each provided with a plurality of electrode terminals at both an inner surface area and an outer peripheral edge thereof, comprising: a board defining an aperture therethrough; a block seated in said aperture and defining at least one opening therethrough; a plurality of probes each formed of electrically conductive fine wires and arranged aslant around said opening; each probe having a contact tip portion at one end and a terminal end portion at an opposite end; said probes being disposed in a plurality of layers through said block, extending at the contact tip portions thereof into said opening and terminating in a common plane; each probe having a main body portions between said contact tip and terminal end portions, covered by a layer of an insulating material; and a layer of an electrically conductive material convering said layer of insulating material for shielding each said main body portion of each probe.
Claim 3
Dependent Claim
17 words
The unitary probe assembly as claimed in claim 1, wherein said insulating material is a dielectric material.
Claim 4
Dependent Claim
17 words
The unitary probe assembly as claimed in claim 1, wherein said block defines only one opening therethrough.
Claim 5
Dependent Claim
18 words
The unitary probe assembly as claimed in claim 1, wherein said block defines a plurality of openings therethrough.
Claim 6
Dependent Claim
28 words
The unitary probe assembly as claimed in claim 1, wherein the terminal end of each of said probe is connected to a tester through a printed circuit trace.
Claim 7
Dependent Claim
28 words
The unitary probe assembly as claimed in claim 1, wherein the terminal end of each of said probe is connected to a tester through a shielded coaxial cable.
Claim 8
Dependent Claim
53 words
The unitary probe assembly as claimed in claim 1, wherein probes whose contact tip portions are located outside at said common plane with respect to a center of said at least one opening, are formed of finer wires compared with probes whose contact tip portions are located inside with respect to said center.
Claim 9
Dependent Claim
90 words
A unitary probe assembly as claimed in claim 1 wherein, said contact tip portion of each probe is L-shaped, one leg of said L-shaped contact tip portion connected to said main body portion and another leg of said contact tip portion extending to said common plane, a length of each leg extending to said common plane being shorter for probes located closer to a periphery of said at least one opening in said block then for probes located near a center of said at least one opening in said block.
References Cited (Backward Citations)
US4382228A
Cited
US4116523A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1987-10-30 | 1988-04-30 | 1988-10-30 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1991-10-30 | 1992-04-30 | 1992-10-30 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1995-10-30 | 1996-04-30 | 1996-10-30 | $7700.00 | Window Closed / Lapsed |