US4480188A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and device to determine interplanar distances in electron diffraction images
Assignee: USINAS SIDERURGICAS DE MINAS GERAIS S/A -USIMINAS
•
Filing: 1982-07-26
•
Granted: 1984-10-30
•
Expires: 2002-07-26
Abstract
Abstract The invention relates to a method and device that make it possible to determine interplanar distances in electron diffraction images in electron microscopes. This is done through its beam stopper, which originally was used only to interrupt the central beam for better display of the diffraction image. The invention makes possible the elimination of errors normally committed in determining said distances, many of them related to the deformation of the film and to unsuitably exposed photographs.
Inventors
- 👤 Andr/e/ L. Tenuta de Azevedo
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 02:04
CPC Classifications
G; G01; G01B; G01B7/00; G01B7/02; H; H01; H01J; H01J37/00; H01J37/26; H01J37/295
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
124 words
Means for determining interplanar distances in electron diffraction images to be used in a transmission electron microscope, comprising a beam stopper including a rod, said rod having a tip, means on said rod for moving it linearly and rotationally, said rod including an extension, an electronic translation meter connected to said rod extension, an electronic rotation angle meter also connected to said rod extension, a microprocessor connected to each of said meters to continuously process signals therefrom whereby it is possible to determine the interplanar distance and angular relations of electron diffraction by positioning the shadow of said beam stopper rod tip on each of the points of interest of the diffraction and the values provided by the meters being used with correction equations.
Claim 2
Dependent Claim
124 words
Means for determining interplanar distances in electron diffraction images to be used in a transmission electron microscope, comprising a beam stopper including a rod, said rod having a tip, means on said rod for moving it linearly and rotationally, said rod including an extension, an electronic translation meter connected to said rod extension, an electronic rotation angle meter also connected to said rod extension, a microprocessor connected to each of said meters to continuously process signals therefrom whereby it is possible to determine the interplanar distance and angular relations of electron diffraction by positioning the shadow of said beam stopper rod tip on each of the points of interest of the diffraction and the values provided by the meters being used with correction equations.
References Cited (Backward Citations)
US2619598A
Cited
US4316087A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1987-10-30 | 1988-04-30 | 1988-10-30 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1991-10-30 | 1992-04-30 | 1992-10-30 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1995-10-30 | 1996-04-30 | 1996-10-30 | $7700.00 | Window Closed / Lapsed |