Claims Analysis
Total Claims: 24
Claim 1
Independent Claim
62 words
A method for producing an amorphous layer of p-type semiconductor alloy having a wide band gap comprising the steps of: a. depositing a layer of silicon; b. incorporating a p-type dopant in said silicon; c. incorporating at least one density of states reducing element in said layer of silicon; and d. introducing nitrogen as a band gap increasing element into said layer.
Claim 2
Independent Claim
62 words
A method for producing an amorphous layer of p-type semiconductor alloy having a wide band gap comprising the steps of: a. depositing a layer of silicon; b. incorporating a p-type dopant in said silicon; c. incorporating at least one density of states reducing element in said layer of silicon; and d. introducing nitrogen as a band gap increasing element into said layer.
Claim 3
Dependent Claim
12 words
A method as defined in claim 1 wherein said dopant is boron.
Claim 4
Dependent Claim
16 words
A method as defined in claim 1 wherein the density of states reducing element is hydrogen.
Claim 5
Dependent Claim
16 words
A method as defined in claim 1 wherein the density of states reducing element is fluorine.
Claim 6
Dependent Claim
34 words
A method as defined in claim 1 wherein said layer is formed by glow discharge deposition from a mixture of reaction gases including SiH 4 , B 2 H 6 and NH 3 .
Claim 7
Dependent Claim
34 words
A method as defined in claim 1 wherein said layer is formed by glow discharge deposition from a mixture of reaction gases including SiH 4 , B 2 H 6 and N 2 .
Claim 8
Dependent Claim
19 words
A method as defined in claim 1 including evaporating said increasing element prior to introducing it into said layer.
Claim 9
Dependent Claim
21 words
A method as defined in claim 7 including plasma activating said increasing element as it is being introduced into said layer.
Claim 10
Dependent Claim
15 words
A method as defined in claim 1 further comprising two density of states reducing elements.
Claim 11
Dependent Claim
18 words
A method as defined in claim 9 wherein said density of states reducing elements are fluorine and hydrogen.
Claim 12
Independent Claim
78 words
A method of making an improved photoresponsive amorphous alloy, said method comprising the steps of: a. depositing on substrate a material including at least silicon; b. incorporating in said material at least one density of states reducing elements and at least one dopant; and c. introducing at least one band gap increasing element into said material without substantially increasing the states in the band gap to produce an alloy having a band gap with an increased utilization width.
Claim 13
Independent Claim
78 words
A method of making an improved photoresponsive amorphous alloy, said method comprising the steps of: a. depositing on substrate a material including at least silicon; b. incorporating in said material at least one density of states reducing elements and at least one dopant; and c. introducing at least one band gap increasing element into said material without substantially increasing the states in the band gap to produce an alloy having a band gap with an increased utilization width.
Claim 14
Dependent Claim
26 words
The method as defined in claim 11 wherein said alloy is glow discharge deposited from at least a mixture of SiH 4 and NH 3 .
Claim 15
Dependent Claim
26 words
The method as defined in claim 11 wherein said alloy is glow discharge deposited from at least a mixture of SiH 4 and N 2 .
Claim 16
Dependent Claim
34 words
The method as defined in claim 11 wherein said alloy is deposited with an active photoresponsive region therein and said band gap increasing element is introduced at least in a portion of said region.
Claim 17
Dependent Claim
103 words
The method as defined in claim 11 wherein said method forms one step in a multi-step process for forming successively deposited alloy layers of opposite (p and n) conductivity type, the n-type layer being formed by introducing during the deposition of the layer an n-dopant element which is deposited with the deposited layer to produce an n-type layer and the p-type layer being formed by introducing during deposition of the layer a p-dopant element which is deposited with the deposited layer to produce a p-type layer and wherein said band gap increasing element is introduced within said p-type layer during the deposition thereof.
Claim 18
Dependent Claim
58 words
The method as defined in claim 15 wherein there is deposited between said p and n doped layers an intrinsic amorphous alloy layer without a p or n dopant element present therein, at least a portion of said intrinsic layer containing said band gap increasing element adjacent to said p doped layer containing said band gap increasing element.
Claim 19
Dependent Claim
22 words
The method as defined in claim 11 further including introducing a second density of states reducing element, said second element being hydrogen.
Claim 20
Dependent Claim
29 words
The method as defined in claim 17 wherein both said density of states reducing elements are incorporated into said depositing alloy substantially simultaneously with said band gap increasing element.
Claim 21
Dependent Claim
19 words
The method as defined in claim 11 wherein said reducing element is incorporated into said alloy after deposition thereof.
Claim 22
Dependent Claim
19 words
The method as defined in claim 11 wherein said increasing element is introduced into said alloy in varying amounts.
Claim 23
Dependent Claim
21 words
The method as defined in claim 11 including plasma activating said increasing element as it is being introduced into said alloy.
Claim 24
Dependent Claim
32 words
The method as defined in claim 11 wherein said method includes depositing at least a portion of said alloy with a p dopant element therein to form a p conductivity type alloy.