US4465969A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Voltage and electric field measuring device using light
Assignee: Sumitomo Electric Industries Ltd
•
Filing: 1980-10-16
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Granted: 1984-08-14
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Expires: 2000-10-16
Abstract
Abstract A voltage and electric field measuring device using light as an operating parameter. An electro-optic crystal, a quarter-wave plate, and a polarization analyzer are arranged in that order in the direction of advancement of applied light. A voltage may be applied to the electro-optic crystal through electrodes arranged thereon. The electro-optic crystal belongs to a cubic system, such as bismuth silicon oxide or bismuth germanium oxide.
Inventors
- 👤 Koji Tada
- 👤 Hirokuni Nanba
- 👤 Yoshiki Kuhara
- 👤 Masayoshi Tatsumi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 20:08
CPC Classifications
G; G01; G01R; G01R29/00; G01R29/12; G01R15/00; G01R15/14; G01R15/24; G01R15/241; G01R15/242; G02; G02F; G02F1/00; G02F1/01; G02F1/03
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
95 words
An electric field measuring device using light, comprising: a source of light; an optical system comprising a polarizer, an electro-optic crystal, a wave plate, and an analyzer arranged in the series with one another in the path of said light, an electric field to be measured being imposed upon said electro-optic crystal, and said electro-optic crystal being made of a bismuth silicon oxide material having a cubic crystal structure; and detector means receiving light outputted by said optical system for producing an electrical signal having a magnitude determined by a magnitude of said electric field.
Claim 2
Dependent Claim
95 words
An electric field measuring device using light, comprising: a source of light; an optical system comprising a polarizer, an electro-optic crystal, a wave plate, and an analyzer arranged in the series with one another in the path of said light, an electric field to be measured being imposed upon said electro-optic crystal, and said electro-optic crystal being made of a bismuth silicon oxide material having a cubic crystal structure; and detector means receiving light outputted by said optical system for producing an electrical signal having a magnitude determined by a magnitude of said electric field.
Claim 3
Dependent Claim
16 words
The electric field measuring device of claim 1 wherein said wave plate comprises a quarter-wave plate.
Claim 4
Dependent Claim
17 words
The electric field measuring device of claim 1, wherein said material is Bi 12 SiO 20 .
Claim 5
Dependent Claim
14 words
The electric field measuring device of claim 1, wherein said material is bismuth orthosilicate.
Claim 6
Dependent Claim
39 words
The electric field measuring device of claim 1, further comprising electrode means coupled to said electro-optic crystal for imposing an electric field to be measured upon said electro-optical crystal in response to a voltage applied to said electrode means.
References Cited (Backward Citations)
US3531179A
Cited
US3466541A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1987-08-14 | 1988-02-13 | 1988-08-14 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1991-08-14 | 1992-02-13 | 1992-08-14 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1995-08-14 | 1996-02-13 | 1996-08-14 | $7700.00 | Window Closed / Lapsed |