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US4464571A Expired / Lapsed US ⏱️ 0.0 years remaining

Opposing field spectrometer for electron beam mensuration technology

Assignee: Advantest Corp
•
Filing: 1982-08-19
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Granted: 1984-08-07
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Expires: 2002-08-19
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Abstract

Abstract An improved electrostatic opposing field spectrometer of the type which may be utilized for undertaking measurements with an electron beam probe has an extraction electrode and an opposing field electrode and two spherical networks for generating a spherically symmetrical opposing field, the lower spherical network being at substantially the same potential as the extraction electrode and the upper spherical network being at a potential in the range of approximately 15 through -15 volts. The spherical network permit transmission of a large solid angle distribution of the secondary electrons emitted at the test point on the surface of a specimen. The centers of both spherical networks may be coincident at an imaginary source point.

Inventors

  • 👤 Erich Plies

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 08:30
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/04; H01J37/05; G; G01; G01R; G01R31/00; G01R31/28; G01R31/302; G01R31/305

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 84 words
In an electrostatic opposing field spectrometer for undertaking measurements by means of an electron beam probe at various points on a test specimen and having an extraction electrode, the improvement comprising: an opposing field electrode for generating a spherically symmetric opposing field including a lower spherically symmetric network disposed above said specimen and being at a first potential, and an upper spherically symmetrical network disposed above said test specimen at a second potential and; said extraction electrode being disposed parallel to said test specimen.
Claim 2
Dependent Claim 84 words
In an electrostatic opposing field spectrometer for undertaking measurements by means of an electron beam probe at various points on a test specimen and having an extraction electrode, the improvement comprising: an opposing field electrode for generating a spherically symmetric opposing field including a lower spherically symmetric network disposed above said specimen and being at a first potential, and an upper spherically symmetrical network disposed above said test specimen at a second potential and; said extraction electrode being disposed parallel to said test specimen.
Claim 3
Dependent Claim 34 words
The improvement of claim 1 wherein said upper and lower spherically symmetrical networks have respective centers which are coincident with a plane containing an imaginary source point for the secondary electrons in said spectrometer.
Claim 4
Dependent Claim 11 words
The improvement of claim 1 wherein said extraction electrode is planar.
Claim 5
Dependent Claim 14 words
The improvement of claim 3 wherein said extraction electrode is a planar extraction diaphragm.
Claim 6
Dependent Claim 14 words
The improvement of claim 3 wherein said extraction electrode is a planar extraction network.
Claim 7
Dependent Claim 21 words
The improvement of claim 1 wherein said lower spherically symmetric electrode and said extraction electrode are at substantially the same potential.

References Cited (Backward Citations)

US3582649A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1987-08-07 1988-02-06 1988-08-07 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1991-08-07 1992-02-06 1992-08-07 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1995-08-07 1996-02-06 1996-08-07 $7700.00 Window Closed / Lapsed

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