Abstract A method for measuring a resistance and a capacitance of an electronic component utilizes electron beam measuring technology to impress a current I A by means of a pulsed electron beam on the component. A potential curve U(t) which arises during the pulse on the electronic component as a result of the impressed current is utilized together with the known current to determine the resistance R and the capacitance C by means of an appropriate selection of two measuring points U(t 1 ) and U(t 2 ) on the potential curve. BACKGROUND OF THE INVENTION The invention relates to a method for measuring resistances and capacitances of eletronic components. Up to now, the measurement of resistances and capacitances of electronic components was carried out with a mechanical probe. The smallest measurable capacitance according to this method amounted to 1 pF. The loading effects associated with such probes affects accurate measurement.
A method for measuring a resistance and a capacitance of an electronic component, comprising: impressing a current I A by means of a single pulsed electron beam on the component with the resistance R and the capacitance C wherein I A =I R +I C ; measuring a potential curve U(t) which arises during the pulse on the electronic component as a result of the impressed current I A ; and determining the resistance R and the capacitance C given the known current I A by means of an appropriate selection of two measuring points U (t 1 ) and U (t 2 ).
Claim 2
Independent Claim
104 words
A method for measuring a resistance and a capacitance of an electronic component, comprising: impressing a current I A by means of a single pulsed electron beam on the component with the resistance R and the capacitance C wherein I A =I R +I C ; measuring a potential curve U(t) which arises during the pulse on the electronic component as a result of the impressed current I A ; and determining the resistance R and the capacitance C given the known current I A by means of an appropriate selection of two measuring points U (t 1 ) and U (t 2 ).
Claim 3
Independent Claim
68 words
A method according to claim1 wherein for the purpose of determining the potential curve U (t), a primary electron beam is directed at the component which causes a secondary electron emission as a result of potentials on the component, and with the assistance of a secondary electron spectrometer, the potential change at the component is first measured and from which the potential curve U (t) is then determined.
Claim 4
Dependent Claim
55 words
A method for measuring resistances and capacitances of electronic components according to claim 1 wherein saturation voltages U S =U(t→∞) ≈U(t·RC)=U(t 1 ) and U S ·0.63=U(t=RC) =U(t 2 ) are employed as the two measuring points U(t 1 ), U(t 2 ) required for determination of the resistance R and of the capacitance C.
Claim 5
Dependent Claim
72 words
A method according to claim 1 wherein the component is a part of a circuit and during measurement on the circuit, a frequency of the electron pulses is synchronized with a frequency of the signal present at the component under measurement, so that the resistance R and the capacitance C are dynamically determined at the component whereby conclusions can then be drawn concerning a load connected to said component in the circuit.