Electro-optic inspection system for transparent or semitransparent containers

Claim 2

An electro-optic inspection system for detecting defects on or in a transparent or semitransparent container, which comprises: a means for generating a polarized optical beam which illuminates hazardous and contaminant materials in said container; and a polarized optical beam detector system for detecting light scattered from said hazardous and contaminant materials, wherein said polarized optical beam detector system comprises a polaroid element to reject light from said container, said polaroid element having a polarization whose direction is different from that of the polarization of light reflected from said container itself, a Fresnel lens optical system to increase collection field angle of a photo-multiplier detector, a diffuser for scattering an image light, and a band-pass filter for reducing an ambient light level reaching said photo-multiplier detector, said polaroid element, said Fresnel lens optical system, said diffuser and said band-pass filter being disposed in such a manner that the light passes them in the stated order.

Claim 3

An electro-optic inspection system for detecting defects on or in a transparent or semitransparent container, which comprises: a means for generating a scanned, polarized optical beam to illuminate hazardous and contaminant materials in said container; and multiple optical detectors with a logical combination of detector signals for eliminating false flaw signals due to the structure of said container and producing one accept/reject status signal, wherein each of said optical detectors comprises a polaroid element having a polarization whose direction is different from that of the polarization of light reflected from the container itself thereby to reject light from said container, a Fresnel lens optical system to increase collection field angle of a photo-multiplier detector, a diffuser for scattering an image light, and a band-pass filter for reducing an ambient light level reaching said photo-multiplier detector, said polaroid element, said Fresnel lens optical system, said diffuser and said band-pass filter being disposed in such a manner that the light passes them in the stated order.

Claim 4

An electro-optic inspection system for detecting defects on or in a transparent or semitransparent container, which comprises: a means for generating a scanned, polarized optical beam to illuminate hazardous and contaminant materials in said container; and multiple optical detectors with a logical combination of detector signals for eliminating false flaw signals due to the structure of said container and producing one accept/reject status signal, wherein each of said optical detectors comprises a polaroid element having a polarization whose direction is different from that of the polarization of light reflected from the container itself thereby to reject light from said container, a Fresnel lens optical system to increase collection field angle of a photo-multiplier detector, a diffuser for scattering an image light, and a band-pass filter for reducing an ambient light level reaching said photo-multiplier detector, said polaroid element, said Fresnel lens optical system, said diffuser and said band-pass filter being disposed in such a manner that the light passes them in the stated order.

Claim 5

An electro-optic inspection system according to claim 2, wherein said scanned optical beam is either blocked or scattered by hazardous or contaminant materials and there is provided with a logic network which combines outputs of said multiple optical detectors to produce one accept/reject status signal.

Claim 6

An electro-optic inspection system according to claim 2, wherein said multiple optical detectors use depolarizing properties of said hazardous and contaminant materials to indicate their presence within said container.

Claim 7

An electro-optic inspection system according to claim 2, wherein said detectors are positioned around the container.

Claim 8

An electro-optic inspection system according to claim 2 wherein the logical combination produces a defect finding signals when the signals from more than one detector exceed the threshold level.

Claim 9

An electro-optic inspection system according to claim 6, wherein the logical combination also produces a defect signal when the signal from at least one detector exceeds the threshold level during the period when the optical beam is scanning the container area where no structural noise exists.