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US4456929A Expired / Lapsed US ⏱️ 0.0 years remaining

Solid state image pick-up apparatus

Assignee: Hitachi Ltd
•
Filing: 1982-06-04
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Granted: 1984-06-26
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Expires: 2002-06-04
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Abstract

Abstract In a solid state image pick-up device of the type comprising a first semiconductor layer including a photoelectric conversion element array, and vertical and horizontal switching elements adapted to select the photoelectric conversion elements, a second semiconductor layer including a horizontal shift register for selecting the horizontal switching elements, a third semiconductor layer including a vertical shift register for selecting the vertical switching elements, the first, second and third semiconductor layers are insulated from each other, and gate voltage V SMOS .L impressed upon a gate electrode of a not selected horizontal switching element is made to satisfy a relation V SMOS .L ≧V WPD +F FB where V WPD represents a potential of the first semiconductor layer, and V FB a flat band voltage beneath gate electrodes of the horizontal switching elements.

Inventors

  • 👤 Masakazu Aoki
  • 👤 Haruhisa Ando
  • 👤 Shinya Ohba
  • 👤 Iwao Takemoto

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 23:04
CPC Classifications
H; H04; H04N; H04N25/00; H04N25/60; H04N25/67; H04N25/671; H04N25/677; H04N25/70; H04N25/76; H04N25/78

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 126 words
Solid state image pick-up apparatus comprising: a first semiconductor layer including a photoelectric conversion element array, and vertical and horizontal switching elements adapted to select said photoelectric conversion elements; a second semiconductor layer including a horizontal shift register for selecting said horizontal switching elements; a third semiconductor layer including a vertical shift register for selecting said vertical switching elements; said first, second and third semiconductor layers being electricaly insulated from each other; and means for causing gate voltage V SMOS .L impressed upon a gate electrode of a not selected horizontal switching element to satisfy a relation V.sub.SMOS.L ≧V.sub.WPD +V.sub.FB where V WPD represents a potential of said first semiconductor layer, and V FB a flat band voltage beneath gate electrodes of said horizontal switching elements.
Claim 2
Dependent Claim 126 words
Solid state image pick-up apparatus comprising: a first semiconductor layer including a photoelectric conversion element array, and vertical and horizontal switching elements adapted to select said photoelectric conversion elements; a second semiconductor layer including a horizontal shift register for selecting said horizontal switching elements; a third semiconductor layer including a vertical shift register for selecting said vertical switching elements; said first, second and third semiconductor layers being electricaly insulated from each other; and means for causing gate voltage V SMOS .L impressed upon a gate electrode of a not selected horizontal switching element to satisfy a relation V.sub.SMOS.L ≧V.sub.WPD +V.sub.FB where V WPD represents a potential of said first semiconductor layer, and V FB a flat band voltage beneath gate electrodes of said horizontal switching elements.
Claim 3
Dependent Claim 39 words
The apparatus according to claim 1 wherein said gate voltage V SMOS .L satisfies the following relation V.sub.SMOS.L <V.sub.V +V.sub.SMOS.T where V SMOS .T represents a threshold voltage of the horizontal switching elements, and V V a video voltage.
Claim 4
Dependent Claim 23 words
The apparatus according to claim 1 or 2 wherein each of said horizontal switching elements comprises an insulated gate type field effect transistor.
Claim 5
Dependent Claim 34 words
The apparatus according to claim 3 wherein a bias voltage is impressed upon said first semiconductor layer so as to accumulate electric charge beneath a gate electrode of a not selected vertical switching element.
Claim 6
Dependent Claim 24 words
The apparatus according to claim 1 wherein said first, second and third semiconductor layers respectively comprise well diffusion region formed on a semiconductor substrate.
Claim 7
Dependent Claim 78 words
The apparatus according to claim 1 which further comprises a circuit for producing pulses utilized to drive said horizontal shift register, said circuit comprises a P and N channel MOS field effect transistors which are connected as a complement type inverter, means for applying a timing pulse to gate electrodes of said MOS field effect transistors, and a diode connected to a source electrode of one of said MOS field effect transistors to obtain a low level voltage.

References Cited (Backward Citations)

US4360833A Cited
US4407010A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1987-06-26 1987-12-26 1988-06-26 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1991-06-26 1991-12-26 1992-06-26 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1995-06-26 1995-12-26 1996-06-26 $7700.00 Window Closed / Lapsed

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