US4455351A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Preparation of photodiodes
Assignee: Nokia Bell Labs
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Filing: 1983-06-13
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Granted: 1984-06-19
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Expires: 2003-06-13
Abstract
Abstract A process is described for fabricating various optical devices including photodiodes in which a protective dielectric layer is put down on the surface of the device prior to heating to temperatures over about 250-300 degrees C. Such devices have excellent performance characteristics including low dark current and low noise figures.
Inventors
- 👤 Irfan Camlibel
- 👤 Shobha Singh
- 👤 LeGrand G. Van Uitert
- 👤 John R. Zuber
- 👤 George J. Zydzik
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 07:33
CPC Classifications
H; H10; H10P; H10P95/00; H10P14/00; H10P14/60; H10P14/69; H10P14/694; H10P14/6943; H10P14/69433; H10F; H10F71/00; H10F71/127; H10F71/1272; H10F71/129; H10F77/00; H10F77/30; H10F77/306; Y; Y02; Y02E; Y02E10/00; Y02E10/50; Y02E10/544; Y10; Y10S; Y10S438/00; Y10S438/902
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
99 words
A process for fabricating a semiconductor photodetector from a structure comprising InP substrate with the surface of the InP substrate at least partially covered with active material, said active material consisting generally of an n-type compound semiconductor, said compound semiconductor selected from the group consisting of InGaAs and InGaAsP comprising the step of depositing a protective layer of SiN on at least part of the surface of active material by plasma chemical vapor deposition characterized in that the temperature of the structure remains below 300 degrees C. until the thickness of the SiN layer is greater than 100 Angstroms.
Claim 2
Dependent Claim
99 words
A process for fabricating a semiconductor photodetector from a structure comprising InP substrate with the surface of the InP substrate at least partially covered with active material, said active material consisting generally of an n-type compound semiconductor, said compound semiconductor selected from the group consisting of InGaAs and InGaAsP comprising the step of depositing a protective layer of SiN on at least part of the surface of active material by plasma chemical vapor deposition characterized in that the temperature of the structure remains below 300 degrees C. until the thickness of the SiN layer is greater than 100 Angstroms.
Claim 3
Dependent Claim
27 words
The process of claim 1 in which the structure is kept below approximately 250 degrees C. until the protective layer is at least 200 Angstrom units thick.
Claim 4
Dependent Claim
37 words
The process of claim 2 in which the structure is kept below 250 degrees C. until the protective layer is at least 300 Angstroms thick and below 400 degrees C. for additional thickness up to 5 microns.
Claim 5
Dependent Claim
29 words
The process of claim 1 in which the structure comprises a buffer layer of n-type InP grown by an epitaxial growth procedure between InP substrate and the active material.
Claim 6
Dependent Claim
24 words
The process of claim 1 in which the active material has composition within ±10 mole percent of In 0 .53 Ga 0 .47 As.
Claim 7
Dependent Claim
82 words
The process of claim 1 in which subsequent to depositing the SiN a portion of the active material is made p-type by a diffusion procedure comprising the steps of: a. removing a portion of the SiN layer to expose a portion of the surface of the active material; b. diffusing zinc into the exposed surface of the active material by contacting said exposed surface with a vapor comprising far less than two hours at a temperature between 500 and 600 degrees C.
Claim 8
Dependent Claim
13 words
The process of claim 6 in which arsenic is included in the vapor.
Claim 9
Dependent Claim
32 words
The process of claim 7 in which the diffusion takes place in an ampule with volume of approximately 6 cm 2 containing approximately 6 mg of arsenic and 3 mg of zinc.
Claim 10
Dependent Claim
15 words
The process of claim 6 in which the diffusion temperature is approximately 550 degrees C.
Claim 11
Dependent Claim
11 words
The product made in accordance with the process of claim 1.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1987-06-19 | 1987-12-19 | 1988-06-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1991-06-19 | 1991-12-19 | 1992-06-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1995-06-19 | 1995-12-19 | 1996-06-19 | $7700.00 | Window Closed / Lapsed |