US4450405A
Expired / Lapsed
US
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Alloy testing apparatus using eddy current conductivity probe
Assignee: Boeing Co
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Filing: 1980-07-14
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Granted: 1984-05-22
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Expires: 2000-07-14
Abstract
Abstract An analog signal produced in response to eddy current probing of a test part is digitized by an analog-to-digital processor and then entered into a microprocessor-based computer. The digitized conductivity test signal is then acted on by a series of processors including a zero suppress processor which determines if the probe is in contact with a part to be tested and has settled in that position so that an accurate conductivity measurement can be made; a data acquisition processor which receives the conductivity test signal and converts it by means of an interpolation routine into a conductivity signal referenced to a predetermined standard, such as % IACS; a limit processor which compares the converted conductivity test signal with conductivity limits retrieved from the computer memory and based on different alloys and tempers, and which causes the results of such comparison to be displayed on "good/bad" alarms; a peak detection processor which determines that a peak conductivity has been registered after the probe has been disposed in positive contact with the test part; a parts counting processor which responds to the detection of a peak conductivity and in response thereto increments a parts-tested counter; a speech synthesizer processor which is enabled by the peak detection processor and verbally announces, by speech synthesis, the measured peak conductivity; and a recalibration interrupt processor in which the main loop of the programmed microcomputer is interrupted after a predetermined operating interval to disable the test apparatus until it has been recalibrated using a standard of known conductivity.
Inventors
- 👤 Bruce S. Howard
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 18:04
CPC Classifications
G; G01; G01N; G01N27/00; G01N27/02; G01N27/023; G01N27/72
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
302 words
An apparatus for testing alloy parts, comprising the combination of: eddy current conductivity sensing means including probe means and circuit means, said circuit means including an output for producing an analog conductivity signal as a function of the conductivity of a test part when said probe means is disposed proximate to the test part; analog-to-digital conversion means for receiving and converting said analog conductivity signal into a digitized conductivity signal; digital processing means including memory means for storing the digitized conductivity signal produced by said eddy current conductivity sensing means and said conversion means when said probe means is positioned proximate to the test part and produces a maximum conductivity value for such part, said digital processing means further including conductivity standards memory means for storing standardized conductivity values that are referenced to a predetermined standard and that are correlated to said digitized conductivity signal; means for retrieving a correlative value of said standardized conductivity values stored in said standards memory means in response to said digitized conductivity signal stored in said memory means when said probe means is proximate a test part, wherein said means for retrieving said correlative values includes interpolation processor means for interpolating between different stored standardized conductivity values, said interpolation processor means producing a processed conductivity signal lying between adjacent, standardized conductivity values stored in said conductivity standards memory means; limit processor means for producing a limit digital signal of a predetermined limit of conductivity referenced to said standardized conductivity values; comparison processing means for comparing said processed conductivity signal produced by said interpolation processor means with said limit digital signal representing said limit of conductivity established by said limit processor means; and test indication means for indicating when said processed conductivity signal has a predetermined relationship to said limit digital signal representing said limit of conductivity.
Claim 2
Independent Claim
302 words
An apparatus for testing alloy parts, comprising the combination of: eddy current conductivity sensing means including probe means and circuit means, said circuit means including an output for producing an analog conductivity signal as a function of the conductivity of a test part when said probe means is disposed proximate to the test part; analog-to-digital conversion means for receiving and converting said analog conductivity signal into a digitized conductivity signal; digital processing means including memory means for storing the digitized conductivity signal produced by said eddy current conductivity sensing means and said conversion means when said probe means is positioned proximate to the test part and produces a maximum conductivity value for such part, said digital processing means further including conductivity standards memory means for storing standardized conductivity values that are referenced to a predetermined standard and that are correlated to said digitized conductivity signal; means for retrieving a correlative value of said standardized conductivity values stored in said standards memory means in response to said digitized conductivity signal stored in said memory means when said probe means is proximate a test part, wherein said means for retrieving said correlative values includes interpolation processor means for interpolating between different stored standardized conductivity values, said interpolation processor means producing a processed conductivity signal lying between adjacent, standardized conductivity values stored in said conductivity standards memory means; limit processor means for producing a limit digital signal of a predetermined limit of conductivity referenced to said standardized conductivity values; comparison processing means for comparing said processed conductivity signal produced by said interpolation processor means with said limit digital signal representing said limit of conductivity established by said limit processor means; and test indication means for indicating when said processed conductivity signal has a predetermined relationship to said limit digital signal representing said limit of conductivity.
Claim 3
Dependent Claim
72 words
The apparatus of claim 1 further comprising an alloy selector switch means and decoder means associated therewith and temper selector switch means and associated decoder means, said limit processor means having limit storage means for storing limit digital signals and having addressing means for addressing a predetermined set of digital limit signals stored in said limit processor means in response to said alloy and temper selector switch means and associated decoder means.
Claim 4
Dependent Claim
88 words
The apparatus of claim 2 wherein said alloy selector switch means and said temper selector switch means cofunction to effect a selection of a combination of selected alloy and temper parameters, and wherein said decoder means associated with said alloy selector switch and said temper selector switch include means for decoding said combination of selected alloy and selected temper parameters for addressing a unique set of high and low digital signal limits stored in said limit processor means against which said processed conductivity signal is to be compared.
Claim 5
Dependent Claim
175 words
The apparatus of claim 1 further comprising speech synthesizer means having a data input means, a strobe input means and an audio output means, said data input means of said speech synthesizer means being connected to receive said processed conductivity signal produced by said interpolation processor means, and data strobing means connected to said strobe input means of said speech synthesizer means; peak detection processor means for monitoring said processed conductivity signal produced by said interpolation processor means for determining the occurrence of a peak value as said processed conductivity signal varies with time in response to movement of said probe means relative to a test part; and speech synthesizer enabling processor means operatively associated with said speech synthesizer means and said peak detection processor means for enabling said speech synthesizer means to convert the processed conductivity signal into an audible announcement of the numerical value of conductivity represented by said processed conductivity digital signal in response to said peak detection processor means determining the occurrence of a peak value of said processed conductivity signal.
Claim 6
Independent Claim
233 words
An apparatus for testing alloy parts by eddy current probing for conductivity, comprising the combination of: eddy current conductivity measurement means including a probe means for producing an analog signal representing the conductivity of the test part when said probe means is moved into proximity therewith; analog-to-digital conversion means for receiving said analog signal representing the conductivity of the test part and for converting such analog signal to a digitized conductivity signal; probe-on-part processor means including threshold means for establishing a predetermined threshold level between a first range of levels of said digitized conductivity signal that exists when said probe means is remote from a test part and a second range of levels of said digitized conductivity signal that exists when said probe means is brought into proximity with a test part, said probe-on-part processor means detecting proximity of said probe means to the test part by sensing a charge in level of said digitized conductivity signal in which such signal crosses said predetermined threshold into said second range of levels; peak detection processor means, controlled by said probe-on-part processor means, for receiving said digitized conductivity signal and detecting a decreasing level thereof when said probe-on-part processor means has detected proximity of said probe means to the test part; and data output means responsive to said peak detection processor means for outputting a peak value of conductivity represented by said digitized conductivity signal.
Claim 7
Independent Claim
233 words
An apparatus for testing alloy parts by eddy current probing for conductivity, comprising the combination of: eddy current conductivity measurement means including a probe means for producing an analog signal representing the conductivity of the test part when said probe means is moved into proximity therewith; analog-to-digital conversion means for receiving said analog signal representing the conductivity of the test part and for converting such analog signal to a digitized conductivity signal; probe-on-part processor means including threshold means for establishing a predetermined threshold level between a first range of levels of said digitized conductivity signal that exists when said probe means is remote from a test part and a second range of levels of said digitized conductivity signal that exists when said probe means is brought into proximity with a test part, said probe-on-part processor means detecting proximity of said probe means to the test part by sensing a charge in level of said digitized conductivity signal in which such signal crosses said predetermined threshold into said second range of levels; peak detection processor means, controlled by said probe-on-part processor means, for receiving said digitized conductivity signal and detecting a decreasing level thereof when said probe-on-part processor means has detected proximity of said probe means to the test part; and data output means responsive to said peak detection processor means for outputting a peak value of conductivity represented by said digitized conductivity signal.
Claim 8
Dependent Claim
52 words
The apparatus of claim 5 further comprising a delay processor means associated with said probe-on-part processor means and said peak detection processor means for delaying operation of said peak detection processor means by a predetermined interval after said digitized conductivity signal crosses said predetermined threshold level into said second range of levels.
Claim 9
Dependent Claim
92 words
The apparatus of claim 5 further comprising a tested parts counter means and a parts counter processor means for advancing a count registered by said counter means, said parts processor means being operatively associated with said probe-on-part processor means and said peak detection processor means for causing said counter processor means to advance a count on said counter means in response to said digitized conductivity signal crossing said predetermined threshold level when followed by a detection of a decrease in level of said digitized conductivity signal by said peak detection processor means.
Claim 10
Dependent Claim
64 words
The apparatus of claim 7 wherein said data output means comprises a speech synthesizer means having a data input means and a strobing input means, said data input means being coupled to said analog-to-digital conversion means for receiving said digitized conductivity signal, and means for generating a strobe signal for applying a strobing signal to said strobing input means of said speech synthesizer means.
Claim 11
Dependent Claim
41 words
The apparatus of claim 8 further comprising delay processor means for delaying the generation of said strobing signal by a predetermined delay interval following the detection of a peak value of said digitized conductivity signal by said peak detection processor means.
Claim 12
Dependent Claim
41 words
The apparatus of claim 5 further comprising suppress processor means for causing said data output means to output a zero value of conductivity until said probe on part processor means determines that the digitized conductivity signal has crossed said threshold level.
Claim 13
Dependent Claim
92 words
The apparatus of claim 5, further comprising memory means for storing digitized values of conductivity referenced to a predetermined standard and exhibiting a nonlinear relationship with said digitized conductivity signal produced by said analog-to-digital conversion means, and interpolation processor means for converting said digitized conductivity signal to a converted conductivity signal by retrieving and interpolating between stored values of conductivity referenced to said predetermined standard that bracket a digitized conductivity signal produced by said analog-to-digital conversion means, said interpolation processor means producing a converted digitized conductivity signal referenced to said predetermined standard.
Claim 14
Independent Claim
316 words
An apparatus for testing alloy parts by eddy current probing for conductivity, comprising the combination of: eddy current conductivity measurement means including a probe means for producing an analog signal representing the conductivity of the test part when said probe means is moved into proximity therewith; analog-to-digital conversion means for receiving said analog signal representing the conductivity of the test part and for converting such analog signal to a digitized conductivity signal; probe-on-part processor means including threshold means for establishing a predetermined threshold level between a first range of levels of said digitized conductivity signal that exists when said probe means is remote from a test part and a second range of levels of said digitized conductivity signal that exists when said probe means is brought into proximity with a test part, said probe-on-part processor means detecting proximity of said probe means to the test part by sensing a change in level of said digitized conductivity signal in which such signal crosses said predetermined threshold into said second range of levels; peak detection processor means, controlled by said probe-on-part processor means, for detecting a decreasing level of said digitized conductivity signal when said probe-on-part processor means has detected proximity of said probe means to the test part; data output means responsive to said peak detection processor means for outputting a peak value of conductivity represented by said digitized conductivity signal; and tested parts counter means and a parts counter processor means for advancing a count registered by said counter means, said parts counter processor means being operatively associated with said probe-on-part processor means and said peak detection processor means for causing said counter processor means to advance a count on said counter means in response to said probe-on-part processor means detecting said proximity of said probe means to the test part and said peak detection processor means detecting said decreasing level of said digitized conductivity signal.
Claim 15
Independent Claim
316 words
An apparatus for testing alloy parts by eddy current probing for conductivity, comprising the combination of: eddy current conductivity measurement means including a probe means for producing an analog signal representing the conductivity of the test part when said probe means is moved into proximity therewith; analog-to-digital conversion means for receiving said analog signal representing the conductivity of the test part and for converting such analog signal to a digitized conductivity signal; probe-on-part processor means including threshold means for establishing a predetermined threshold level between a first range of levels of said digitized conductivity signal that exists when said probe means is remote from a test part and a second range of levels of said digitized conductivity signal that exists when said probe means is brought into proximity with a test part, said probe-on-part processor means detecting proximity of said probe means to the test part by sensing a change in level of said digitized conductivity signal in which such signal crosses said predetermined threshold into said second range of levels; peak detection processor means, controlled by said probe-on-part processor means, for detecting a decreasing level of said digitized conductivity signal when said probe-on-part processor means has detected proximity of said probe means to the test part; data output means responsive to said peak detection processor means for outputting a peak value of conductivity represented by said digitized conductivity signal; and tested parts counter means and a parts counter processor means for advancing a count registered by said counter means, said parts counter processor means being operatively associated with said probe-on-part processor means and said peak detection processor means for causing said counter processor means to advance a count on said counter means in response to said probe-on-part processor means detecting said proximity of said probe means to the test part and said peak detection processor means detecting said decreasing level of said digitized conductivity signal.
Claim 16
Dependent Claim
64 words
The apparatus of claim 12 wherein said output data means comprises a speech synthesizer means having a data input means and a strobing input means, said data input means being coupled to said analog-to-digital conversion means for receiving said digitized conductivity signal, and means for generating a strobe signal for applying a strobing signal to said strobing input means of said speech synthesizer means.
Claim 17
Dependent Claim
41 words
The apparatus of claim 13 further comprising delay processor means for delaying the generation of said strobing signal by a predetermined delay interval following the detection of a peak value of said digitized conductivity signal by said peak detection processor means.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1987-05-22 | 1987-11-21 | 1988-05-22 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1991-05-22 | 1991-11-21 | 1992-05-22 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1995-05-22 | 1995-11-21 | 1996-05-22 | $7700.00 | Window Closed / Lapsed |