US4436419A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Optical strain gauge
Assignee: RTX Corp
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Filing: 1982-02-16
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Granted: 1984-03-13
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Expires: 2002-02-16
Abstract
Abstract A noncontact optical strain gauge may be used for high temperature objects and objects having a small radius of curvature in the area of interest. The gauge works by means of interferometry applied to the speckle patterns of radiation reflected from two points on the object surface.
Inventors
- 👤 Karl A. Stetson
- 👤 Irene R. Harrison
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 17:33
CPC Classifications
G; G01; G01B; G01B11/00; G01B11/16; G01B11/161; G01B11/162; G01L; G01L1/00; G01L1/24
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
152 words
An optical system for measuring strain in a test object comprising: means for generating first and second optical beams having first and second frequencies; means for directing said first and second beams on said test object; at least two means for focusing radiation of said first and second frequencies diffusely reflected from said test object onto a focus plane; a predetermined moire interference pattern recording positioned in said focus plane to intercept said focused radiation, said moire pattern representing an exposure when the amount of said strain is zero; at least two detectors responsive to radiation focused by said at least two means for focusing for generating electrical signals in response to radiation of said first and second frequencies impinging thereon, said electrical signals having first and second phases; means for measuring the phase difference between said first and second phases of said electrical signals to form a representation of said strain.
Claim 2
Dependent Claim
152 words
An optical system for measuring strain in a test object comprising: means for generating first and second optical beams having first and second frequencies; means for directing said first and second beams on said test object; at least two means for focusing radiation of said first and second frequencies diffusely reflected from said test object onto a focus plane; a predetermined moire interference pattern recording positioned in said focus plane to intercept said focused radiation, said moire pattern representing an exposure when the amount of said strain is zero; at least two detectors responsive to radiation focused by said at least two means for focusing for generating electrical signals in response to radiation of said first and second frequencies impinging thereon, said electrical signals having first and second phases; means for measuring the phase difference between said first and second phases of said electrical signals to form a representation of said strain.
References Cited (Backward Citations)
US3914056A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1987-03-13 | 1987-09-12 | 1988-03-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1991-03-13 | 1991-09-12 | 1992-03-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1995-03-13 | 1995-09-12 | 1996-03-13 | $7700.00 | Window Closed / Lapsed |