Patent US2426193A successfully refreshed from Google Patents.
US4417149A
Expired / Lapsed
US
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Apparatus for detecting and measuring defects
Assignee: Fujifilm Holdings Corp
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Filing: 1981-09-18
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Granted: 1983-11-22
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Expires: 2001-09-18
Abstract
Abstract An apparatus for detecting and measuring the area of defects in a sheet or rolled material comprises a defect detection section which rapidly scans the whole area of the material to locate the positions of defects and a defect size measuring section which is moved directly to each of the located positions to measure the area of the defect.
Inventors
- 👤 Hideaki Takeuchi
- 👤 Tsunehiko Takahashi
- 👤 Masaru Noguchi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 03:10
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/84; G01N21/88; G01N21/89
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
110 words
An apparatus for detecting and measuring defects comprising a defect detection means for detecting the position of minute defects in the material under inspection, means for scanning the material with a light beam, means for generating position information regarding the minute defects detected by the detection means, a defect size measuring means for measuring the area of the minute defects detected by the defect detection means, memory means for storing the position information regarding the minute defects detected by the defect detection means, and operating means, for using the position information stored by the memory means, to move the defect size measuring means to the position for measuring the defects.
Claim 2
Independent Claim
110 words
An apparatus for detecting and measuring defects comprising a defect detection means for detecting the position of minute defects in the material under inspection, means for scanning the material with a light beam, means for generating position information regarding the minute defects detected by the detection means, a defect size measuring means for measuring the area of the minute defects detected by the defect detection means, memory means for storing the position information regarding the minute defects detected by the defect detection means, and operating means, for using the position information stored by the memory means, to move the defect size measuring means to the position for measuring the defects.
Claim 3
Dependent Claim
14 words
The apparatus according to claim 1, wherein the light beam is a laser beam.
Claim 4
Dependent Claim
22 words
The apparatus according to claim 1 or 2, wherein the means for measuring the area of the minute defects includes a microscope.
Claim 5
Dependent Claim
27 words
The apparatus according to claim 3, wherein the microscope is connected to an industrial TV unit and a video processor for determining the area of the defects.
Claim 6
Dependent Claim
33 words
The apparatus according to claim 1 or 2, wherein the means for measuring the area of the minute defects includes a laser beam scanner with a beam of a diameter not exceeding 10μ.
Claim 7
Independent Claim
17 words
The apparatus according to claims 1 or 2, wherein the operating means includes a central processing unit.
Claim 8
Independent Claim
47 words
The apparatus according to claims 1 or 2, wherein a wave height discriminator is further provided between the defect detection means and the memory means, whereby the position information stored by the memory means is limited to that relating to defects of greater than a predetermined size.
Claim 9
Independent Claim
75 words
The apparatus according to claims 1 or 2, wherein a wave height discriminator is further provided between the defect detection means and the memory means, whereby the position information stored by the memory means is limited to that relating to defects of greater than a predetermined size and the stored information is classified according to the strength of the position information outputted by the defect detection means to provide a rough measurement of defect size.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-11-21 | 1987-05-23 | 1987-11-22 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-11-21 | 1991-05-23 | 1991-11-22 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-11-21 | 1995-05-23 | 1995-11-22 | $7700.00 | Window Closed / Lapsed |